Open Access. Powered by Scholars. Published by Universities.®

Optics Commons

Open Access. Powered by Scholars. Published by Universities.®

Discipline
Institution
Keyword
Publication Year
Publication
Publication Type
File Type

Articles 2551 - 2580 of 2587

Full-Text Articles in Optics

Problems Of Channel Correlation And Statistical Bias In Photon-Correlation Spectroscopy, Richard C. Haskell, Gary L. Pisciotta Apr 1985

Problems Of Channel Correlation And Statistical Bias In Photon-Correlation Spectroscopy, Richard C. Haskell, Gary L. Pisciotta

All HMC Faculty Publications and Research

Correlation between channels of the normalized photocount-rate correlation function g(2)(τ) becomes significant at high count rates and leads to a number of data-analysis problems. We derive an expression for channel correlation that is valid for a detector area of arbitrary extent and compare the theoretical predictions with measured values. A data-analysis procedure is demonstrated that employs the theoretical expression for channel correlation and provides a rigorous test of an assumed fitting function. The procedure facilitates the use of the cumulant method in determining the polydispersity of scatterers. An expression for the statistical bias of g(2) …


Explicit Equations For The Polarizing Angles Of A High-Reflectance Substrate Coated By A Transparent Thin Film, R. M.A. Azzam Mar 1985

Explicit Equations For The Polarizing Angles Of A High-Reflectance Substrate Coated By A Transparent Thin Film, R. M.A. Azzam

Electrical Engineering Faculty Publications

Simple explicit equations are derived that determine the angles of incidence at which the parallel and perpendicular polarization components of light are extinguished on reflection from a transparent film coating a high-reflectance (metallic) substrate. The polarizing angles obtained from our approximate expressions are in excellent agreement with those determined by iterative numerical solution of the exact nonlinear equations that govern such angles. For the approximation to be valid, the intensity reflectance of the film-substrate interface, evaluated at the critical angle of the film-ambient interface, must exceed 0.5.


Antireflecting And Polarizing Transparent Bilayer Coatings On Absorbing Substrates At Oblique Incidence, R. M.A. Azzam, Karim Javily Feb 1985

Antireflecting And Polarizing Transparent Bilayer Coatings On Absorbing Substrates At Oblique Incidence, R. M.A. Azzam, Karim Javily

Electrical Engineering Faculty Publications

The condition of zero reflection of p- and s-polarized light by a transparent bilayer on an absorbing substrate is derived in the form |gν(ø,Ni)| ≤ 1, where gν is a function of the angle of incidence ø, the refractive indices Ni(i = 0,1,2,3) of the system, and the polarization state ν (= p or s). As an application, the air-Si3N4-SiO2-Si system is considered at two laser wavelengths λ = 6328 and 3250 Å. The thicknesses of the two films of the bilayer and the …


Single-Layer Antireflection Coatings On Absorbing Substrates For The Parallel And Perpendicular Polarizations At Oblique Incidence, R. M.A. Azzam Feb 1985

Single-Layer Antireflection Coatings On Absorbing Substrates For The Parallel And Perpendicular Polarizations At Oblique Incidence, R. M.A. Azzam

Electrical Engineering Faculty Publications

Explicit equations are derived that determine the refractive index of a single layer that suppresses the reflection of p- or s-polarized light from the planar interface between a transparent and an absorbing medium at any given angle of incidence. The required layer thickness and the system reflectance for the orthogonal unextinguished polarization also follow explicitly. This generalizes earlier work that was limited to normal incidence or to oblique incidence at dielectric—dielectric interfaces. Specific examples are given of p- and s-antireflection layers on Si and Al substrates at λ = 6328 Å at various angles of incidence.


Extinction Of The P And S Polarizations Of A Wave On Reflection At The Same Angle From A Transparent Film On An Absorbing Substrate: Applications To Parallel-Mirror Crossed Polarizers And A Novel Integrated Polarimeter, R. M.A. Azzam Feb 1985

Extinction Of The P And S Polarizations Of A Wave On Reflection At The Same Angle From A Transparent Film On An Absorbing Substrate: Applications To Parallel-Mirror Crossed Polarizers And A Novel Integrated Polarimeter, R. M.A. Azzam

Electrical Engineering Faculty Publications

The p- and s-polarized components of light can be suppressed on reflection at the same angle of incidence from an absorbing substrate coated by a transparent thin film if the wave is refracted in the film at 45° and the constraint Re[(ε2 - α)/(l -α)]1/2 = α + | ε2 - α| is satisfied, where 2α and ε2 are the ratios of dielectric constants of the film and substrate, respectively, to that of the ambient. For high-reflectance metal substrates (|ε2| » 1), α≈ 1, the ratio of film to ambient refractive index …


Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn Oct 1984

Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn

Electrical Engineering Faculty Publications

The seven participating laboratories received films of two different thicknesses of Sc2O3 and Rh. All samples of each material were prepared in a single deposition run. Brief descriptions are given of the various methods used for determination of the optical constants of these coating materials. The measurement data are presented, and the results are compared. The mean of the variances of the Sc2O3refractive-index determinations in the 0.40–0.75-nm spectral region was 0.03. The corresponding variances for the refractive index and absorption coefficient of Rh were 0.35 and 0.26, respectively.


Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam Aug 1984

Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam

Electrical Engineering Faculty Publications

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS-Ag film-substrate system at the CO2-laser wavelength λ = 10.6 µm. The equal net reflectances for the p and s polarizations are computed …


Inverting The Ratio Of The Complex Parallel And Perpendicular Reflection Coefficients Of An Absorbing Substrate Using A Transparent Thin-Film Coating, R. M.A. Azzam Jul 1984

Inverting The Ratio Of The Complex Parallel And Perpendicular Reflection Coefficients Of An Absorbing Substrate Using A Transparent Thin-Film Coating, R. M.A. Azzam

Electrical Engineering Faculty Publications

An absorbing substrate can be coated with a transparent thin film of refractive index N1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p_and s polarizations of the film-covered substrate ρ = Rp/Rs is the inverse of that of the film-free substrate ρ¯ = R¯p/R¯s at an angle of incidence ø. A method to determine the relationship among ø, N1, and d that inverts ρ (i.e., makes ρ = 1/ρ¯) for a given substrate at a given wavelength is described and is …


Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam May 1984

Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


A Quantitative Study Of The Copper Content In Granite Rocks, Samir F. Al-Mandwee Apr 1984

A Quantitative Study Of The Copper Content In Granite Rocks, Samir F. Al-Mandwee

Masters Theses

A spectrographic analysis was conducted on ten granite samples of different geological origin from the Pioneer Mountains in Central Idaho. A qualitative analysis was performed first and then a quantitative analysis to determine the presence and relative amounts of copper in the various samples. This spectrographic analysis employed a direct current arc source of 340 volts and 4 amperes to excite the samples which were dissolved in acid and dried on the ends of high purity carbon electrodes. The emitted light passed through a step sector and a medium quartz spectrograph to a photographic plate. The optical density of the …


An Investigation Of Refractive Index Of Solutions Of Ammonia And Water At Various Concentrations And Temperatures, Effendy Arif Apr 1984

An Investigation Of Refractive Index Of Solutions Of Ammonia And Water At Various Concentrations And Temperatures, Effendy Arif

Mechanical & Aerospace Engineering Theses & Dissertations

Refractive index of ammonia-water solutions is investigated experimentally (for (lamda) = 632.8 nm) and semi-empirically (for (lamda) = 589.3 and 632.8 nm) in ammonia-weight concentration of up to 30%, over a temperature range of 20 to 60(DEGREES)C. The experiment employs a specially designed and built refractometer that measures the displacement of a laser beam due to refraction in the test solution. The refractive index is then deduced from the beam displacement. Based on the experimental data, the refractive index is correlated empirically with the concentration and temperature. A semi-empirical investigation is developed based on the Lorentz-Lorenz equation and the additive …


Pseudo-Brewster And Second-Brewster Angles Of An Absorbing Substrate Coated By A Transparent Thin Film, R. M.A. Azzam, T F. Thonn Dec 1983

Pseudo-Brewster And Second-Brewster Angles Of An Absorbing Substrate Coated By A Transparent Thin Film, R. M.A. Azzam, T F. Thonn

Electrical Engineering Faculty Publications

The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for thes polarization, and the second-Brewster angle of minimum ratio of the p and s reflectances are all determined as functions of the thickness of a transparent film coating an absorbing substrate by numerical solution of the exact equations that govern such angles of the form Re(Z′/Z) = 0, where Z = Rp, Rs, or ρ represent the complex amplitude-reflection coefficients for the p and s polarizations and their ratio (ρ =Rp/Rs), …


Self‐Refraction Of Nonlinear Capillary‐Gravity Waves, Partha P. Banerjee, Adrianus Korpel, Karl E. Lonngren Sep 1983

Self‐Refraction Of Nonlinear Capillary‐Gravity Waves, Partha P. Banerjee, Adrianus Korpel, Karl E. Lonngren

Electrical and Computer Engineering Faculty Publications

Self‐refraction effects have been observed during the propagation of deep‐water capillary‐gravity waves. The observations are shown to be in qualitative agreement with the theory of self‐focusing and defocusing in a cubically nonlinear medium in the presence of diffraction.


Complex Reflection Coefficients For The Parallel And Perpendicular Polarizations Of A Film-Substrate System, R. M.A. Azzam, M. Emdadur Rahman Khan Jan 1983

Complex Reflection Coefficients For The Parallel And Perpendicular Polarizations Of A Film-Substrate System, R. M.A. Azzam, M. Emdadur Rahman Khan

Electrical Engineering Faculty Publications

The complex reflection coefficients Rv(ø,ζ) of a film-substrate system for the parallel (v = p) and perpendicular (v = s) polarizations are examined in detail as functions of the angle of incidence ø(0 ≤ ø ≤ 90°) and the reduced normalized film thickness ζ(0 ≤ ζ < 1). For definiteness, the reflection of light of wavelength λ = 0.6328 µm by the air–SiO2–Si system is assumed. Families of circles that represent the constant-angle-of-incidence contours, their envelopes, and the associated constant-thickness contours ofRp and Rs are all presented in the complex plane. Furthermore, the amplitude-reflectance and phase-shift functions, |Rv|(ø,ζ) and argRv(ø,ζ) …


Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel Nov 1982

Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel

Electrical and Computer Engineering Faculty Publications

Subharmonic generation has been observed during the propagation of deep‐water capillary waves. The observations are shown to be in agreement with the theory of degenerate resonant noncollinear three‐wave interaction in a nonlinear, dispersive medium.


Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan Sep 1982

Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan

Electrical Engineering Faculty Publications

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that any input polarization of light is preserved after two reflections at the same angle of incidence from a parallel-mirror beam displacer or an axicon. This is achieved by equalizing the net complex p and s reflection coefficients (also called the radial and azimuthal eigenvalues of an axicon) after two reflections. The net polarization-independent reflectance (insertion loss) of the device is computed and found to exceed the net minimum parallel reflectance of the uncoated device for incidence above …


Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam Sep 1982

Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam Feb 1982

Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.


A Laser Interferometric Study Of Electric Field Effects On Methane-Oxygen Flame Plasmas, Mark D. Prairie Jan 1982

A Laser Interferometric Study Of Electric Field Effects On Methane-Oxygen Flame Plasmas, Mark D. Prairie

Masters Theses

A laser interferometer is developed to study the refractive index field, aerodynamic structure, and three dimensional temperature profile of a methane-oxygen flame system under the influence of D.C. electric fields. A combined graphical-numerical method is used to transform the observed interference patterns into radial temperature distributions. The results indicate that the electric field exerts a marked influence on the flame stability, geometry, and charged particle flow. Experimental evidence shows that these effects are most apparent under fuel rich conditions. It is suggested an electric field may change the concentration gradients of reacting species, leading to an altered course of fuel …


Explicit Determination Of Thickness Of A Transparent Film On A Transparent Substrate From Angles Of Incidence Of Equal P And S Reflectivities, R. M.A. Azzam Oct 1981

Explicit Determination Of Thickness Of A Transparent Film On A Transparent Substrate From Angles Of Incidence Of Equal P And S Reflectivities, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


The Creation Of Holograms Utilizing Fiber Optics, Abdul Rahim Omar Aug 1981

The Creation Of Holograms Utilizing Fiber Optics, Abdul Rahim Omar

Masters Theses

Holography involves the interference of two light beams, namely a reference beam and an object beam. Instead of the conventional method using beam splitters and mirrors to direct the light path, fiber optic bundles are used and high quality holograms have been produced. When fiber optic bundles are used, a spatial filter is not needed to produce a "clean" beam of light for the reference beam. Fiber optic bundles also provide greater flexibility of illumination for the object beam and/or fir the reference beam. Also, it is easier to illuminate the object from many directions. Finally, the distance from the …


A Critical Study Of Nonlinear Echo Phenomena, Monish Ranjan Chatterjee May 1981

A Critical Study Of Nonlinear Echo Phenomena, Monish Ranjan Chatterjee

Electrical and Computer Engineering Faculty Publications

The present thesis attempts to give a concise and critical account of the evolution of the echo phenomena over the last thirty years. Starting with spin and photon echoes, which were among the earliest to be observed and studied, the thesis explores the experimental findings and the models proposed in connection with the more contemporary echo experiments, viz. those involving electroacoustic or polarization echoes in single and polycrystalline piezoelectric materials and in powders. Although the investigations regarding the various mechanisms of short and long term echo formation are by no means complete, a coherent picture is beginning to emerge as …


Relations Between Amplitude Reflectances And Phase Shifts Of The P And S Polarizations When Electromagnetic Radiation Strikes Interfaces Between Transparent Media, R. M.A. Azzam Jun 1979

Relations Between Amplitude Reflectances And Phase Shifts Of The P And S Polarizations When Electromagnetic Radiation Strikes Interfaces Between Transparent Media, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam Jun 1977

Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


An Investigation Of Photographic Phase Holograms, Dale Lance Markham Aug 1974

An Investigation Of Photographic Phase Holograms, Dale Lance Markham

Masters Theses

No abstract provided.


The Design And Construction Of An Electron Lens For Use In A Low Energy Electron Diffraction System, Rodney S. Krieger Dec 1972

The Design And Construction Of An Electron Lens For Use In A Low Energy Electron Diffraction System, Rodney S. Krieger

Masters Theses

No abstract provided.


Crystal Structure Determination Of Β-Lactoglobulin From Electron Micrographs, Richard Roeter Jul 1971

Crystal Structure Determination Of Β-Lactoglobulin From Electron Micrographs, Richard Roeter

Dissertations and Theses

Often electron micrographs exhibit a repeating structure. Sometimes this repeating structure satisfies the definition of a crystal in that it has a three dimensional repeating structure. If the unit cell structure of this repeating structure can be determined it can be used to help categorize different sections of a particular sample. In some cases, the use of optical diffraction analysis of electron micrographs with repeating structure is a method of determining the unit cell structure.

Samples of β-Lactoglobulin were prepared for viewing in the electron microscope using both the crystalline material and carbon replicas of the crystal surface. Because the …


Construction Of A Small Vacuum Ultraviolet Spectrograph, Dale A. Eding Apr 1971

Construction Of A Small Vacuum Ultraviolet Spectrograph, Dale A. Eding

Masters Theses

No abstract provided.


Electron Optical Study Of A Secondary Electron Multiplier, Chang Min Shen Jul 1970

Electron Optical Study Of A Secondary Electron Multiplier, Chang Min Shen

Dissertations and Theses

Electron orbital theory was applied to the design of the geometrical structure of an electron multiplier for an image intensifier. A special structure satisfying production requirements was studied. Electron optical calculations consisted of determining the potential distribution and tracing the electron trajectories. Liebmann's procedure was used to solve Laplace's equation with constant potentials on the multiplier electrodes as boundary conditions. The trajectories were determined by solving the equation of motion in an electrostatic field using a Runge-Kutta procedure. The initial conditions for the trajectories were the initial energies, initial positions, and the initial directions of the secondary electrons. The plotted …


Optical Phenomena In Diatoms, Richard B. Hoover, Miriam J. Hoover Jan 1970

Optical Phenomena In Diatoms, Richard B. Hoover, Miriam J. Hoover

Journal of the Arkansas Academy of Science

Diatoms are unicellular algae which fabricate siliceous shells that are frequently marked with intricate ornamentations and patterns. The nature and characteristics of the siliceous shells provide a basis for diatom taxonomy and give rise to a number of interesting and colorful optical phenomena. This paper presents the results of investigations of diffraction phenomena, complementary color behavior, Rayleigh scattering and optical activity in diatoms.