Open Access. Powered by Scholars. Published by Universities.®
- Institution
-
- Technological University Dublin (257)
- University of Dayton (158)
- University of New Orleans (145)
- Old Dominion University (64)
- Florida International University (57)
-
- University of Nebraska - Lincoln (55)
- University of South Carolina (36)
- Air Force Institute of Technology (31)
- City University of New York (CUNY) (18)
- University of Massachusetts Amherst (16)
- University of Nevada, Las Vegas (16)
- Portland State University (15)
- Purdue University (14)
- University of Kentucky (13)
- Liberty University (10)
- Edith Cowan University (5)
- James Madison University (5)
- The University of Maine (5)
- University of Connecticut (5)
- Chapman University (4)
- California Polytechnic State University, San Luis Obispo (3)
- The British University in Egypt (3)
- University of Rhode Island (3)
- Dartmouth College (2)
- Louisiana State University (2)
- Manipal Academy of Higher Education (2)
- Mississippi State University (2)
- Olivet Nazarene University (2)
- Parkland College (2)
- Southern Methodist University (2)
- Keyword
-
- Heterojunctions (11)
- Engineering, Electrical Engineering (10)
- Power Quality (10)
- Thin films (10)
- Wind Energy (10)
-
- Antenna (8)
- Chemical elements (8)
- Electric fields (8)
- Electrical properties and parameters (8)
- Field effect transistors (8)
- WLAN (8)
- Wind Turbines (8)
- DFIG (7)
- Doping (7)
- Semiconductors (7)
- Voltage Unbalance (7)
- Antennas (6)
- Electric measurements (6)
- Electrical engineering (6)
- Engineering (6)
- Epitaxy (6)
- Graphene (6)
- IEEE 802.11 (6)
- Machine Learning (6)
- Optimization (6)
- Video streaming (6)
- WLANs (6)
- Battery (5)
- DC microgrid (5)
- Deep learning (5)
- Publication Year
- Publication
-
- Electrical and Computer Engineering Faculty Publications (159)
- Electrical Engineering Faculty Publications (146)
- Articles (113)
- Conference papers (92)
- Faculty Publications (59)
-
- FIU Electronic Theses and Dissertations (57)
- Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research (31)
- Bioelectrics Publications (25)
- Doctoral (19)
- Electrical & Computer Engineering Faculty Publications (17)
- Conference Papers (15)
- Electrical & Computer Engineering Faculty Research (13)
- Publications and Research (13)
- AFIT Patents (11)
- Library Philosophy and Practice (e-journal) (10)
- Masters Theses 1911 - February 2014 (10)
- Senior Honors Theses (10)
- Masters (8)
- Mechanical & Aerospace Engineering Faculty Publications (7)
- Electrical and Computer Engineering Faculty Publications and Presentations (6)
- Department of Integrated Science and Technology - Faculty Scholarship (5)
- Electrical and Computer Engineering PhD Day (5)
- Open Educational Resources (5)
- Publications (5)
- Birck and NCN Publications (4)
- Computer and Electronics Engineering: Dissertations, Theses, and Student Research (4)
- Honors College (4)
- Honors Scholar Theses (4)
- Physics and Astronomy Faculty Publications (4)
- Research outputs 2014 to 2021 (4)
- File Type
Articles 961 - 986 of 986
Full-Text Articles in Engineering
Transformation Of Fresnel’S Interface Reflection And Transmission Coefficients Between Normal And Oblique Incidence, R. M.A. Azzam
Transformation Of Fresnel’S Interface Reflection And Transmission Coefficients Between Normal And Oblique Incidence, R. M.A. Azzam
Electrical Engineering Faculty Publications
If w denotes an interface Fresnel reflection or transmission coefficient for s- or p-polarized light at an oblique angle of incidence ø, and z denotes the same coefficient at normal incidence, we find that w is an analytic function of z, w = ƒ(z), that depends on ø but not on the specific optical properties of the two media on both sides of the interface. All four functions that correspond to the four distinct Fresnel coefficients and their inverses are determined. We single out for detailed examination, as an example, the relationship between the reflection of s -polarized light at …
The University, Electrical Engineering And Space Travel, Doran Baker
The University, Electrical Engineering And Space Travel, Doran Baker
Faculty Honor Lectures
In this paper, my purpose is three-fold: First, to tell some of the story of the development of the Engineering College at Utah State University; second, to present selected concepts and applications in the evolution of electrical engineering; third, to relate these concepts and developments to our space venture and to the twenty-first century_ My perspective is that of a school teacher, engineer, scientist and historian; superimposed upon this is my imbedment in the system as an administrator of teachers and researchers. I intend to strike a balance between generality and depth, between technology and philosophy, and between perception and …
Reflection Of An Electromagnetic Plane Wave With 0 Or Π Phase Shift At The Surface Of An Absorbing Medium, R. M.A. Azzam
Reflection Of An Electromagnetic Plane Wave With 0 Or Π Phase Shift At The Surface Of An Absorbing Medium, R. M.A. Azzam
Electrical Engineering Faculty Publications
An electromagnetic plane wave incident obliquely from a transparent medium onto the surface of an absorbing medium can be reflected with 0 or π phase shift if (i) the wave is p (TM) polarized, and (ii) the complex relative dielectric function ε is such that 0 ≤|ε| 2/2Re(ε) ≤ 1. Furthermore, the locus of ε such that the reflection coefficient for the p polarization is real at the same angle of incidence, is a circle, and that of ε½ (the complex relative refractive index) is Bernoulli’s lemniscate.
Principal Angle, Principal Azimuth, And Principal-Angle Ellipsometry Of Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul
Principal Angle, Principal Azimuth, And Principal-Angle Ellipsometry Of Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul
Electrical Engineering Faculty Publications
When the film thickness is considered as a parameter, a system composed of a transparent film on an absorbing substrate (in a transparent ambient) is characterized by a range of principal angle ø¯min ≤ ø¯ ≤ ø¯max over which the associated principal azimuth ψ¯ varies between 0° and 90° (i.e., 0° ≤ ψ¯ ≤ 90°) and the reflection phase difference Δ assumes either one of the two values: +π/2 or −π/2. We determine the principal angle ø¯(d) and principal azimuth ψ¯(d) as functions of film thickness d for the vacuum-SiO2-Si system at …
Propagation Of Partially Polarized Light Through Anisotropic Media With Or Without Depolarization: A Differential 4 × 4 Matrix Calculus, R. M.A. Azzam
Propagation Of Partially Polarized Light Through Anisotropic Media With Or Without Depolarization: A Differential 4 × 4 Matrix Calculus, R. M.A. Azzam
Electrical Engineering Faculty Publications
We extend the scope of the Mueller calculus to parallel that established by Jones for his calculus. We find that the Stokes vector S of a light beam that propagates through a linear depolarizing anisotropic medium obeys the first-order linear differential equation dS/dz = mS, where z is the distance traveled along the direction of propagation and m is a 4 × 4 real matrix that summarizes the optical properties of the medium which influence the Stokes vector. We determine the differential matrix m for eight basic types of optical behavior, find its form for the most general anisotropic nondepolarizing …
Consequences Of Light Reflection At The Interface Between Two Transparent Media Such That The Angle Of Refraction Is 45°, R. M.A. Azzam
Consequences Of Light Reflection At The Interface Between Two Transparent Media Such That The Angle Of Refraction Is 45°, R. M.A. Azzam
Electrical Engineering Faculty Publications
The reflection of light at the interface between two transparent, homogeneous and optically isotropic media such that the angle of refraction is 45° has the following interesting consequences: (i) the interface relfectivity for the parallel (p) polarization is the square of that for the perpendicular (s) polarization; (ii) the angular deviation of the propagation direction upon refraction is equal to the polarization (or ellipsometric) angle ψ and (iii) the complex reflection coefficient for the ppolarization is stationary, in both magnitude and phase, with respect to small charges of the (refractive and/or absorptive) optical properties of …
Generalized Ellipsometry Based On Azimuth Measurements Alone, R. M.A. Azzam
Generalized Ellipsometry Based On Azimuth Measurements Alone, R. M.A. Azzam
Electrical Engineering Faculty Publications
We investigate the azimuth response function, θo = f(θi), of a linear nondepolarizing optical system S, whereθi and θo, are the azimuths (orientations) of the generally elliptic vibrations of totally polarized light at the input and output of S. We find that the azimuth response function depends on five of the six parameters that specify the normalized circular Jones matrix of the optical system. Thus the entire polarization response of an optical system can be nearly completely reconstructed from its azimuth response alone. Five input-output azimuth measurements (θik, θok), k …
Simulation Of Mechanical Rotation By Optical Rotation: Application To The Design Of A New Fourier Photopolarimeter, R. M.A. Azzam
Simulation Of Mechanical Rotation By Optical Rotation: Application To The Design Of A New Fourier Photopolarimeter, R. M.A. Azzam
Electrical Engineering Faculty Publications
The mechanical rotation of an optical element around the axis of a beam of polarized light can be easily simulated by using the phenomenon of optical rotation. Because optical rotation can be magnetically or electrically induced, virtually any kind of mechanical rotation can be mimicked. This interesting principle is applied to the design of a new Fourier photopolarimeter that uses an oscillating-azimuth retarder (OAR). The OAR consists of a quarter-wave plate surrounded by two ac-excited Faraday cells that produce equal and opposite sinusoidal optical rotations. Analysis of the operation of this polarimeter of no moving parts proves its ability to …
Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam
Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
A novel and very simple ellipsometer for the characterization of film-substrate systems that employs one rotating optical element (a polarizer) is proposed. The ellipsometer is based on detecting the angles of incidence at which a film-substrate system has equal amplitude attenuations for light polarized parallel (p) and perpendicular (s) to the plane of incidence. At a certain wavelength, the film thickness of the filmsubstrate system has to lie within permissible-thickness bands (PTB) for the technique to apply.
Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam
Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometer Nulling: Convergence And Speed, Rasheed M.A. Azzam, D. L. Confer, N. M. Bashara
Ellipsometer Nulling: Convergence And Speed, Rasheed M.A. Azzam, D. L. Confer, N. M. Bashara
Electrical Engineering Faculty Publications
The process of nulling in ellipsometry is studied by a graphical presentation using the trajectories of two significant polarization states in the complex plane, XPC and XSA. These states are determined by (1) the polarizer and compensator (XPC) and (2) the specimen and the analyzer (XSA) in the polarizer-compensator-specimen-analyzer ellipsometer arrangement. As the azimuth angles of the ellipsometer elements are varied, XPC and XSA move closer to one another in a stepwise fashion until they coincide when a null is reached. Thus, at null, the polarization states are matched, and XPC = XSA. For …
Frequency-Mixing Detection (Fmd) Of Polarization-Modulated Light, R. M.A. Azzam
Frequency-Mixing Detection (Fmd) Of Polarization-Modulated Light, R. M.A. Azzam
Electrical Engineering Faculty Publications
When a light beam whose polarization and intensity are weakly modulated at a frequency ωm passes through a periodic analyzer of frequency ωa(<ωm) and the transmitted flux is linearly detected, the resulting total signal St consists of two components: (i) a periodic baseband signal Sbb with harmonics of frequencies nωa (n = 0,1,2,…) and (ii) an amplitude-modulated-carrier signal δSmc with center (carrier) frequency ωm and sideband frequencies at ωm ± nωa(n = 1,2,…). In this paper we show that the average polarization of the beam is determined …ω
Modulated Generalized Ellipsometry, R. M.A. Azzam
Modulated Generalized Ellipsometry, R. M.A. Azzam
Electrical Engineering Faculty Publications
We extend ellipsometry to the direct measurement of small perturbations of the Jones matrix of any linear nondepolarizing optical sample (system) subjected to a modulating stimulus such as temperature, stress, or electric or magnetic field. The methodology of this technique, to be called Modulated Generalized Ellipsometry (MGE), is presented. First an ellipsometer with arbitrary polarizing and analyzing optics is assumed, and subsequently the discussion is specialized to a conventional ellipsometer having either the polarizer-sample-analyzer (PSA) or the polarizer-compensator-sample-analyzer (PCSA) arrangement. MGE provides the tool for the systematic study of thermo-optical, piezo-optical, electro-optical, magneto-optical, and other allied effects for both isotropic …
Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The results of a preceding paper [J. Opt. Soc. Am. 65, 1464,(1975)] are viewed from a different angleas providing the basis for the design of film-substrate single-reflection linear partial polarizers (LPP),which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO2-Si LPP’s at λ = 6328 Å are shown graphically.
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-substrate systems, provided that the film thickness lies within one of a set of permissible-thickness bands (PTB). For a transparent film on a transparent or absorbing substrate, the PTB structure consists of a small number of finite-bandwidth bands followed by a continuum band that extends from a film thickness of about half the wavelength of light to infinity. We show that this band structure is a direct consequence of the periodicity of the ellipsometric function ρ (the ratio Rp/Rs, of the complex amplitude-reflection coefficients for …
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO2—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approximations are general in that an arbitrary initial film thickness is assumed. They are simple, because a complex sensitivity function is introduced whose real and imaginary projections determine the psi (Ψ) and delta (Δ) sensitivity factors. Among the conclusions of this paper are the following. (1) External reflection ellipsometry …
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Department of Integrated Science and Technology - Faculty Scholarship
A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …
Trajectories Describing The Evolution Of Polarized Light In Homogeneous Anisotropic Media And Liquid Crystals, Rasheed M.A. Azzam, N. M. Bashara, B. E. Merrill
Trajectories Describing The Evolution Of Polarized Light In Homogeneous Anisotropic Media And Liquid Crystals, Rasheed M.A. Azzam, N. M. Bashara, B. E. Merrill
Electrical Engineering Faculty Publications
Trajectories are given that describe the evolution of the ellipse of polarization in the complex plane for light propagating in a homogeneous anisotropic medium and along the helical axis of a cholesteric liquid crystal. For the general homogeneous anisotropic medium that exhibits combined birefringence and dichroism the trajectory is a spiral that converges to the low-absorption eigenpolarization. For pure birefringence the trajectory becomes a complete circle that encloses one eigenpolarization, whereas for pure dichroism the trajectory becomes an arc of a circle that ends at the low-absorption eigenstate. The case of a cholesteric (or twisted nematic) liquid crystal leads to …
Loci Of Invariant-Azimuth And Invariant-Ellipticity Polarization States Of An Optical System, Rasheed M.A. Azzam, N. M. Bashara
Loci Of Invariant-Azimuth And Invariant-Ellipticity Polarization States Of An Optical System, Rasheed M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The loci of polarization states for which either the ellipticity alone or the azimuth alone remains invariant upon passing through an optical system are introduced. The cartesian equations of these two loci are derived in the complex plane in which the polarization states are represented. The equations are quartic and are conveniently expressed in terms of the elements of the Jones. matrix of the optical system. As an exple the loci are determined for a system composed of a π/4 rotator followed by a quarter-wave retarder.
Analogy Between Linear Optical Systems And Linear Two-Port Electrical Networks, Rasheed M.A. Azzam, N. M. Bashara
Analogy Between Linear Optical Systems And Linear Two-Port Electrical Networks, Rasheed M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
Attention is called to the analogy between linear optical systems and linear two-port electrical networks. For both, the transformation of a pair of oscillating quantities between input and output is of interest. The mapping of polarization by an optical system and of impedance (admittance) by a two-port network is described by a bilinear transformation. Therefore for each transfer property of a system of one type, there is a similar property for the system of the other type. Two-port electrical networks are synthesized whose impedance-(or admittance-) mapping properties are the same as the polarization-mapping properties of a given optical system. The …
Efficiency Of The Electric Lighting Plant Of The Rhode Island College Of Agriculture And Mechanic Arts, John Joseph Fry
Efficiency Of The Electric Lighting Plant Of The Rhode Island College Of Agriculture And Mechanic Arts, John Joseph Fry
Student and Lippitt Prize essays
A study of the functionality of the electric system at Rhode Island College (University of Rhode Island).
Evolution Of The Dynamo, Ralph Nelson Soule
Evolution Of The Dynamo, Ralph Nelson Soule
Student and Lippitt Prize essays
This essay supplies an extensive history of electricity beginning in 600 BC to 1900, chronicling the evolution of the dynamo and its uses.
How Electricity May Be Used To Operate Machinery, John Franklin Knowles
How Electricity May Be Used To Operate Machinery, John Franklin Knowles
Student and Lippitt Prize essays
Explores the uses of electricity in a machine shop in shifting from belt and shaft systems to the use of electric plants.