Open Access. Powered by Scholars. Published by Universities.®

Engineering Commons

Open Access. Powered by Scholars. Published by Universities.®

Articles 1 - 8 of 8

Full-Text Articles in Engineering

Infrared Quarter-Wave Reflection Retarders Designed With High-Spatial-Frequency Dielectric Surface-Relief Gratings On A Gold Substrate At Oblique Incidence, Jian Liu, Rasheed M.A. Azzam Oct 1996

Infrared Quarter-Wave Reflection Retarders Designed With High-Spatial-Frequency Dielectric Surface-Relief Gratings On A Gold Substrate At Oblique Incidence, Jian Liu, Rasheed M.A. Azzam

Electrical Engineering Faculty Publications

One- and two-dimensional high-spatial-frequency dielectric surface-relief gratings on a Au substrate are used to design a high-reflectance quarter-wave retarder at 70° angle of incidence and 10.6-μm light wavelength. The equivalent homogeneous anisotropic layer model is used. It is shown that equal and high reflectances (>98.5%) for the p and the spolarizations and quarter-wave retardation can be achieved with two-dimensional ZnS surface-relief gratings. Sensitivities to changes of incidence angle, light wavelength, grating filling factor, and grating layer thickness are considered.


Determination Of The Refractive Index And Thickness Of Transparent Pellicles By Use Of The Polarization-Independent Absentee-Layer Condition, Y. Cui, R. M.A. Azzam Sep 1996

Determination Of The Refractive Index And Thickness Of Transparent Pellicles By Use Of The Polarization-Independent Absentee-Layer Condition, Y. Cui, R. M.A. Azzam

Electrical Engineering Faculty Publications

The refractive index and the thickness of a transparent pellicle are determined when the pellicle is placed between two vertical crossed polarizers and rotated in the horizontal plane. The transmission axes of the polarizers are neither parallel nor perpendicular to the plane of incidence. The light transmitted through the crossed polarizers reaches a minimum when the pellicle satisfies the absentee-layer condition. The refractive index and the film thickness are obtained from the pellicle orientation angles under such a condition.


Intelligent Dynamic Space Management Systems, Margaret-Rose Madeleine Dabdoub Jul 1996

Intelligent Dynamic Space Management Systems, Margaret-Rose Madeleine Dabdoub

FIU Electronic Theses and Dissertations

The objective of this work is to design, simulate and synthesize a dynamic space controller system. The concept of space allocation and management can be applied to more than physical space. It may also be taken in the contexts of memory, network or bus management. The management and allocation of any space depends mostly on the twin factors of demand and availability. Time, the size and amount of space available, as well as the number of requests for the spaces, must also be considered. The proposed design has the capability to monitor multiple spaces for vacancies, length of time occupied …


Extended Permutation Filters And Their Application To Edge Enhancement, Russell C. Hardie, Kenneth E. Barner Jun 1996

Extended Permutation Filters And Their Application To Edge Enhancement, Russell C. Hardie, Kenneth E. Barner

Electrical and Computer Engineering Faculty Publications

Extended permutation (EP) filters are defined and analyzed. In particular, we focus on extended permutation rank selection (EPRS) filters. These filters are constrained to output an order statistic from an extended observation vector. This extended vector includes N observation samples and K statistics that are functions of the observation samples. The rank permutations from selected samples in this extended observation vector are used as the basis for selecting an order statistic output. We show that by including the sample mean in the extended observation vector, the filters exhibit excellent edge enhancement properties. We also show that several previously defined classes …


Low-Frequency Noise In 4h-Silicon Carbide Junction Field Effect Transistors, J. W. Palmour, M. E. Levinshtein, S. L. Rumyantsev, Grigory Simin May 1996

Low-Frequency Noise In 4h-Silicon Carbide Junction Field Effect Transistors, J. W. Palmour, M. E. Levinshtein, S. L. Rumyantsev, Grigory Simin

Faculty Publications

Low frequency noise in 4H‐silicon carbide junction field effect transistors (JFETs) has been investigated. JFETs with a buried p + n junction gate were manufactured by CREE Research Inc. Very low noise level has been observed in the JFETs. At 300 K the value of Hooge constant α is as small as α∼10−5 and the α value can be decreased by an appropriate annealing to α∼2×10−6. It has been shown that even these extremely low noise values are determined not by the volume noise sources but by the noise at the SiC–SiO2 interface.


Genetic Algorithms Vs. Simulated Annealing: A Comparison Of Approaches For Solving The Circuit Partitioning Problem, Theodore W. Manikas, James T. Cain May 1996

Genetic Algorithms Vs. Simulated Annealing: A Comparison Of Approaches For Solving The Circuit Partitioning Problem, Theodore W. Manikas, James T. Cain

Computer Science and Engineering Research

An important stage in circuit design is placement, where components are assigned to physical locations on a chip. A popular contemporary approach for placement is the use of simulated annealing. While this approach has been shown to produce good placement solutions, recent work in genetic algorithms has produced promising results. The purpose of this study is to determine which approach will result in better placement solutions.

A simplified model of the placement problem, circuit partitioning, was tested on three circuits with both a genetic algorithm and a simulated annealing algorithm. When compared with simulated annealing, the genetic algorithm was found …


Applications Of The Normal-Incidence Rotating-Sample Ellipsometer To High- And Low-Spatial-Frequency Gratings, Y. Cui, R. M.A. Azzam May 1996

Applications Of The Normal-Incidence Rotating-Sample Ellipsometer To High- And Low-Spatial-Frequency Gratings, Y. Cui, R. M.A. Azzam

Electrical Engineering Faculty Publications

The normal-incidence rotating-sample ellipsometer is an instrument that can be used to characterize grating surfaces from the measured ratio ρof complex reflection coefficients ry/rx of light polarized perpendicular and parallel to the grating groove direction. Experimental results at different wavelengths for different gratings with spatial frequencies from 150 to 5880 grooves/mm are presented. The groove depth of the 5880-grooves/mm gold-coated grating can be estimated from the measured ρ and rigorous grating theory.


Translation Of 'Profiles In Faith', Monish Ranjan Chatterjee Jan 1996

Translation Of 'Profiles In Faith', Monish Ranjan Chatterjee

Electrical and Computer Engineering Faculty Publications

Sarat Chandra Chatterjee (1876-1938) may be considered one of the three most significant figures of the literary component of the Bengal Renaissance, the other two being Bankim Chandra Chatterjee (1838-1894) and Rabindranath Tagore (1861-1941). As much as Bankim Chandra is identified with the new age in the Bengali novel, and the development of serious vernacular journalism, and Rabindranath with modern/classical movements in Bengali poetry and music, along with novel ideas in methods of education and teaching, Sarat Chandra, as a novelist and storyteller, perfected the art of narration and critical analyses of a variety of contemporaneous social and political issues, …