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Articles 481 - 485 of 485
Full-Text Articles in Physics
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO2—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein
Department of Integrated Science and Technology - Faculty Scholarship
A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …
Transistorized Circuits For Telemetry, Dominick Misciascio Jr.
Transistorized Circuits For Telemetry, Dominick Misciascio Jr.
Physics & Astronomy ETDs
This thesis is concerned with the telemetry of small DC signals from photomultiplier tubes. The circuitry must have a high input impedance so as not to load down the photomultiplier tube and a low output impedance which is capable of controlling the current through a small incandescent bulb. This bulb is used to illuminate a photoresistor. The output of the circuit consists of a variation of the resistance of the photoresistor. This variable resistance is conventionally converted into a variable audio frequency which is transmitted to the receiving station on a radio-frequency carrier. The output resistance must be independent of …