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Articles 1141 - 1155 of 1155

Full-Text Articles in Optics

Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam Aug 1984

Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam

Electrical Engineering Faculty Publications

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS-Ag film-substrate system at the CO2-laser wavelength λ = 10.6 µm. The equal net reflectances for the p and s polarizations are computed …


Inverting The Ratio Of The Complex Parallel And Perpendicular Reflection Coefficients Of An Absorbing Substrate Using A Transparent Thin-Film Coating, R. M.A. Azzam Jul 1984

Inverting The Ratio Of The Complex Parallel And Perpendicular Reflection Coefficients Of An Absorbing Substrate Using A Transparent Thin-Film Coating, R. M.A. Azzam

Electrical Engineering Faculty Publications

An absorbing substrate can be coated with a transparent thin film of refractive index N1 (within a certain range) and thickness d such that the ratio of complex reflection coefficients for the p_and s polarizations of the film-covered substrate ρ = Rp/Rs is the inverse of that of the film-free substrate ρ¯ = R¯p/R¯s at an angle of incidence ø. A method to determine the relationship among ø, N1, and d that inverts ρ (i.e., makes ρ = 1/ρ¯) for a given substrate at a given wavelength is described and is …


Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam May 1984

Division-Of-Wave-Front Polarizing Beam Splitter And Half-Shade Device Using Dielectric Thin Film On Dielectric Substrate, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Pseudo-Brewster And Second-Brewster Angles Of An Absorbing Substrate Coated By A Transparent Thin Film, R. M.A. Azzam, T F. Thonn Dec 1983

Pseudo-Brewster And Second-Brewster Angles Of An Absorbing Substrate Coated By A Transparent Thin Film, R. M.A. Azzam, T F. Thonn

Electrical Engineering Faculty Publications

The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for thes polarization, and the second-Brewster angle of minimum ratio of the p and s reflectances are all determined as functions of the thickness of a transparent film coating an absorbing substrate by numerical solution of the exact equations that govern such angles of the form Re(Z′/Z) = 0, where Z = Rp, Rs, or ρ represent the complex amplitude-reflection coefficients for the p and s polarizations and their ratio (ρ =Rp/Rs), …


Self‐Refraction Of Nonlinear Capillary‐Gravity Waves, Partha P. Banerjee, Adrianus Korpel, Karl E. Lonngren Sep 1983

Self‐Refraction Of Nonlinear Capillary‐Gravity Waves, Partha P. Banerjee, Adrianus Korpel, Karl E. Lonngren

Electrical and Computer Engineering Faculty Publications

Self‐refraction effects have been observed during the propagation of deep‐water capillary‐gravity waves. The observations are shown to be in qualitative agreement with the theory of self‐focusing and defocusing in a cubically nonlinear medium in the presence of diffraction.


Complex Reflection Coefficients For The Parallel And Perpendicular Polarizations Of A Film-Substrate System, R. M.A. Azzam, M. Emdadur Rahman Khan Jan 1983

Complex Reflection Coefficients For The Parallel And Perpendicular Polarizations Of A Film-Substrate System, R. M.A. Azzam, M. Emdadur Rahman Khan

Electrical Engineering Faculty Publications

The complex reflection coefficients Rv(ø,ζ) of a film-substrate system for the parallel (v = p) and perpendicular (v = s) polarizations are examined in detail as functions of the angle of incidence ø(0 ≤ ø ≤ 90°) and the reduced normalized film thickness ζ(0 ≤ ζ < 1). For definiteness, the reflection of light of wavelength λ = 0.6328 µm by the air–SiO2–Si system is assumed. Families of circles that represent the constant-angle-of-incidence contours, their envelopes, and the associated constant-thickness contours ofRp and Rs are all presented in the complex plane. Furthermore, the amplitude-reflectance and phase-shift functions, |Rv|(ø,ζ) and argRv(ø,ζ) …


Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel Nov 1982

Subharmonic Generation By Resonant Three‐Wave Interaction Of Deep‐Water Capillary Waves, Partha P. Banerjee, Adrianus Korpel

Electrical and Computer Engineering Faculty Publications

Subharmonic generation has been observed during the propagation of deep‐water capillary waves. The observations are shown to be in agreement with the theory of degenerate resonant noncollinear three‐wave interaction in a nonlinear, dispersive medium.


Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan Sep 1982

Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan

Electrical Engineering Faculty Publications

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that any input polarization of light is preserved after two reflections at the same angle of incidence from a parallel-mirror beam displacer or an axicon. This is achieved by equalizing the net complex p and s reflection coefficients (also called the radial and azimuthal eigenvalues of an axicon) after two reflections. The net polarization-independent reflectance (insertion loss) of the device is computed and found to exceed the net minimum parallel reflectance of the uncoated device for incidence above …


Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam Sep 1982

Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam Feb 1982

Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.


Explicit Determination Of Thickness Of A Transparent Film On A Transparent Substrate From Angles Of Incidence Of Equal P And S Reflectivities, R. M.A. Azzam Oct 1981

Explicit Determination Of Thickness Of A Transparent Film On A Transparent Substrate From Angles Of Incidence Of Equal P And S Reflectivities, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


A Critical Study Of Nonlinear Echo Phenomena, Monish Ranjan Chatterjee May 1981

A Critical Study Of Nonlinear Echo Phenomena, Monish Ranjan Chatterjee

Electrical and Computer Engineering Faculty Publications

The present thesis attempts to give a concise and critical account of the evolution of the echo phenomena over the last thirty years. Starting with spin and photon echoes, which were among the earliest to be observed and studied, the thesis explores the experimental findings and the models proposed in connection with the more contemporary echo experiments, viz. those involving electroacoustic or polarization echoes in single and polycrystalline piezoelectric materials and in powders. Although the investigations regarding the various mechanisms of short and long term echo formation are by no means complete, a coherent picture is beginning to emerge as …


Relations Between Amplitude Reflectances And Phase Shifts Of The P And S Polarizations When Electromagnetic Radiation Strikes Interfaces Between Transparent Media, R. M.A. Azzam Jun 1979

Relations Between Amplitude Reflectances And Phase Shifts Of The P And S Polarizations When Electromagnetic Radiation Strikes Interfaces Between Transparent Media, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam Jun 1977

Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Digital Video Display System Using Cathode-Ray Tube, George M. Low, Arthur I. Zygielbaum, Warren L. Martin, Alexander Engel Mar 1972

Digital Video Display System Using Cathode-Ray Tube, George M. Low, Arthur I. Zygielbaum, Warren L. Martin, Alexander Engel

School of Natural Resources: Faculty Publications

A digital video display system (DWDS) is disclosed for display of image, alphanumeric and other data on a cathode-ray tube (CRT) with sequential raster scan and two, four or eight gray shades. The DVDS includes a central processing unit for ac tivating the system, selecting the X (horizontal axis) and Z (in tensity modulation) modes, and designating the starting loca tion of two successive rasters of data from a memory accessed by a data multiplexer subsystem (DMS). At the end of each raster, the DMS interrupts the computer for a new starting lo cation of a raster of data to …