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Articles 31 - 40 of 40
Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Technology Trends And Predictions: Is A Flying Car In Our Future?, Carol A. Watson
Technology Trends And Predictions: Is A Flying Car In Our Future?, Carol A. Watson
Continuing Legal Education Presentations
Discusses the future of legal research and technologies that are currently available for law offices. Highlights current technology trends and predictions and the latest innovations in courtroom technology. Concludes with a list of general technology predictions that will hopefully provide food for thought and generate excitement about the coming prospects of technology.
Kreative Outlets, Travis Crist, Steve Clark, Jason Peressini
Kreative Outlets, Travis Crist, Steve Clark, Jason Peressini
Computer Engineering
With the widespread use of smart phones and the advancement of WiFi technologies, people now have the Internet at their fingertips at all times. Home automation and control has the possibility of becoming the next big technology that can utilize the abundant availability of the Internet. This paper documents the findings and results of a project aimed at developing the infrastructure needed for a home automation system that is accessible anywhere. We implemented a system that utilized a web enabled ethernet connection and RF wireless technology to control AC outlets and provide the user with feedback information about the status …
Full Custom Vlsi Design Of On-Line Stability Checkers, Chris Y. Lee
Full Custom Vlsi Design Of On-Line Stability Checkers, Chris Y. Lee
Master's Theses
A stability checker is a clocked storage element, much like a flip-flop, which detects unstable and late signals in the pipeline of a digital system. The On-line stability checker operates concurrently with its associated circuit-under-test (CUT). This thesis describes the full custom very-large-scale integration (VLSI) design and testing process of On-Line Stability Checkers. The goals of this thesis are to construct and test Stability Checker designs, and to create a design template for future class projects in the EE 431 Computer-Aided Design (CAD) of VLSI Devices course at Cal Poly.
A method for concurrent fault testing called On-line Stability Checking …
Programmable Household Led Light Fixture, Jordan Locano
Programmable Household Led Light Fixture, Jordan Locano
Electrical Engineering
This report details the development and construction of a LED light fixture to be used for household lighting. This document details background information, design ideas, project specifications, production, assembly, testing, and conclusions involved with this project. The goals of this project is to design and build a cost-effective replacement for traditional room lighting that can perform better and last longer than traditional methods.
Project 308: Augmented Reality Mario Kart, Joseph Abad, David Allender, Joryl Calizo, Ryan Gaspar, Gavin Lee
Project 308: Augmented Reality Mario Kart, Joseph Abad, David Allender, Joryl Calizo, Ryan Gaspar, Gavin Lee
Computer Engineering
Mario Kart is a popular go-kart racing game developed by Nintendo. The premise of the game is simple: drive a go-kart along a racetrack and reach the finish line before the other players. What makes this game unique, however, is the inclusion of weapons, traps, and other projectiles that a player can use to gain an advantage in the race. We have taken on the challenge of not only recreating this amazing game, but using the art of Augmented Reality to fully immerse the player in the full experience. Rather than play the game on a television screen with a …
High Power Microwave (Hpm) And Ionizing Radiation Effects On Cmos Devices, Nicholas A. Estep
High Power Microwave (Hpm) And Ionizing Radiation Effects On Cmos Devices, Nicholas A. Estep
Theses and Dissertations
Integrated circuits (ICs) are inherently complicated and made worse by increasing transistor quantity and density. This trend potentially enhances concomitant effects of high energy radiation and local or impressed electromagnetic interference (EMI). The reduced margin for signal error may counter any gain in radiation hardness from smaller device dimensions. Isolated EMI and ionizing radiation studies on circuits have been conducted extensively over the past 30 years. However, little focus has been placed on the combined effects. To investigate the effect of combined EMI and ionizing radiation, two complementary metal oxide semiconductor (CMOS) inverter technologies (CD4069 and SN74AUC1G04) were analyzed for …
Gallium Desorption Behavior At Algaas/Gaas Heterointerfaces During High-Temperature Molecular Beam Epitaxy, K. Mahalingam, D. L. Dorsey, K. R. Evans, Rama Venkat
Gallium Desorption Behavior At Algaas/Gaas Heterointerfaces During High-Temperature Molecular Beam Epitaxy, K. Mahalingam, D. L. Dorsey, K. R. Evans, Rama Venkat
Electrical & Computer Engineering Faculty Research
A Monte Carlo simulation study is performed to investigate the Ga desorption behavior during AlGaAs-on-GaAs heterointerface formation by molecular beam epitaxy. The transients in the Ga desorption rate upon opening the Al shutter are shown to be associated with the concurrent reduction in the V/III flux ratio. Monte Carlo simulations employing a constant V/III flux ratio yield a “steplike” variation in the Ga desorption rate with the resulting interfaces closer in abruptness to the ideal AlGaAs-on-GaAs interface. Further details on the stoichiometry of the interface and its relationship with predicted Ga desorption profiles is presented.
Analysis And Optimization Of A Banyan Based Atm Switch By Simulations, Syed Sohel Hussain
Analysis And Optimization Of A Banyan Based Atm Switch By Simulations, Syed Sohel Hussain
Dissertations and Theses
Asynchronous Transfer Mode (ATM) is proposed technology to create a broadband (high speed) packet switching network capable of transporting wide variety of services including voice, video and data in an integrated manner. The main concern in designing the switching fabrics used in this technology are speed, throughput, delay and variance of delay. We analyze the performance by simulations of ATM switch based on Banyan network in the uniform traffic condition.
We compare the analytical results obtained from three-state model Yan and Jenq to the simulation results. Based on observation of simulation results, we propose non-blocking first stage (NBFS) to increase …
Hybrid Wafer Scale Microcircuit Integration -- [ 5008213 ], Edward S. Kolesar Jr.
Hybrid Wafer Scale Microcircuit Integration -- [ 5008213 ], Edward S. Kolesar Jr.
AFIT Patents
A wafer scale integration arrangement wherein integrated circuit die of varying size, fabrication processes, and function are commonly mounted in the same host wafer using a filled epoxy material of special characteristics. The mounting epoxy material also serves as a substrate for the die interconnecting conductors in regions adjacent the mounted die. The described assembly also includes a newly available photosensitive polyimide material as a planarization and passivation covering for the die and hose wafer and as a mounting surface for an interconnecting metal conductor array. Multiple levels of interconnection metal. Fabrication processes for the die to host wafer attachment …
Hybrid Wafer Scale Microcircuit Integration -- [ 4989063 ], Edward S. Kolesar Jr.
Hybrid Wafer Scale Microcircuit Integration -- [ 4989063 ], Edward S. Kolesar Jr.
AFIT Patents
A wafer scale integration arrangement wherein integrated circuit die of varying size, fabrication processes, and function are commonly mounted in the same host wafer using a filled epoxy material of special characteristics. The mounting epoxy material also serves as a substrate for the die interconnecting conductors in regions adjacent the mounted die. The described assembly also includes a newly available photosensitive polyimide material as a planarization and passivation covering for the die and host wafer and as a mounting surface for an interconnecting metal conductor array. Multiple levels of interconnection metal. Fabrication processes for the die to host wafer attachment …