Harmonic Analysis and Representation Commons^™

Fourier Analyses Of Optical Profilometry As An Inferential Measurement For Impact Coverage., Langdon Feltner, Paul Mort

15th International Conference on Shot Peening

A critical consideration in peening process design is achieving sufficient impact coverage. Conventional methods for assessing coverage rely on manual inspection, which is time-consuming and poorly suited for automated control. In this work, we investigate the use of frequency-domain analysis to quantify surface modification in peened samples using optical profilometry (OP) data. Three-dimensional surface maps of Almen strips were acquired using a high-resolution OP system and analyzed via fast Fourier transform (FFT) to compute spatial power spectral densities (PSDs). PSD maps and radially averaged profiles reveal consistent amplification of harmonic components similar to the nominal particle size, with increasing intensity …