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Full-Text Articles in Other Computer Sciences

An Investigation Of Resolution And Addressability Requirements For Digital Display Systems Used In Word-Processing And Computer-Aided-Drafting Applications, Stephen T. Knox Oct 1986

An Investigation Of Resolution And Addressability Requirements For Digital Display Systems Used In Word-Processing And Computer-Aided-Drafting Applications, Stephen T. Knox

Dissertations and Theses

Two hardware factors contributing to the overall image quality of digital CRTs are display resolution and addressability. The relationship between these two factors and human performance was modeled by a metric of display quality, the Resolution Addressability Ratio (RAR), and investigated within the contexts of Word-Processing (WP) and Computer-Aided-Drafting (CAD) tasks. The findings indicate a perceptual limit to MTF bandwidth improvements, and significant differences in display quality requirements between the two applications. The regression of image quality as a function of RAR metric values resulted in an r² = 0.94 for the WP task and an r² = 0.79 for …


Centre For Computer Aided Management: An Overview, V B Kaujalagi Jul 1986

Centre For Computer Aided Management: An Overview, V B Kaujalagi

IIMB Management Review

No abstract provided.


An Exact Analysis For Efficient Computation Of Random-Pattern Testability In Combinational Circuits, Sharad C. Seth, Bhargab B. Bhattacharya, Vishwani Agrawal Jan 1986

An Exact Analysis For Efficient Computation Of Random-Pattern Testability In Combinational Circuits, Sharad C. Seth, Bhargab B. Bhattacharya, Vishwani Agrawal

School of Computing: Conference and Workshop Papers

Experimental evidence shows that low testability in a typical circuit is much more likely due to poor observability than poor controllability. Thus, from theoretical and practical standpoints, it is important to develop an accurate model for observability computation. One such model, in terms of supergates, is proposed in the first part of this paper thus complimenting our earlier work. It is now possible to obtain exact random-pattern testability for each line in a circuit.

The second part of the paper analyzes the supegate structure of a circuit from a graph theoretic viewpoint. Finding a supergate is related to determining the …