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Electronic Devices and Semiconductor Manufacturing Commons™
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Articles 1 - 5 of 5
Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Deriving Of Single Intensive Picosecond Optical Pulses From A High-Power Gain-Switched Laser Diode By Spectral Filtering, S. N. Vainshtein, Grigory Simin, J. T. Kostamovaara
Deriving Of Single Intensive Picosecond Optical Pulses From A High-Power Gain-Switched Laser Diode By Spectral Filtering, S. N. Vainshtein, Grigory Simin, J. T. Kostamovaara
Faculty Publications
Single 25 ps/16 W optical pulses were achieved by spectral filtering from a multiheterostructure gain-switched laser diode with its quasisteady-state modes suppressed by a factor of 103 as compared with the peak power. A significant transient spectrum broadening makes this possible provided that a very high dI/dt rate of the pumping current pulse is used. A simple numerical model is suggested which describes adequately both the spectral and transient features of the observed phenomenon. It follows from the model that single picosecond optical pulses can be obtained from any type of high power semiconductor laser.
Development And Packaging Of Microsystems Using Foundry Services, Jeffrey T. Butler
Development And Packaging Of Microsystems Using Foundry Services, Jeffrey T. Butler
Theses and Dissertations
Micro-electro-mechanical systems (MEMS) are a new and rapidly growing field of research. Several advances to the MEMS state of the art were achieved through design and characterization of novel devices. Empirical and theoretical model of polysilicon thermal actuators were developed to understand their behavior. The most extensive investigation of the Multi-User MEMS Processes (MUMPs) polysilicon resistivity was also performed. The first published value for the thermal coefficient of resistivity (TCR) of the MUMPs Poly 1 layer was determined as 1.25 x 10(exp -3)/K. The sheet resistance of the MUMPs polysilicon layers was found to be dependent on linewidth due to …
A Study Of Transconductance Degradation In Hemt Using A Self-Consistent Boltzmann-Poisson-Schrodinger Solver, Rahim Khoie
A Study Of Transconductance Degradation In Hemt Using A Self-Consistent Boltzmann-Poisson-Schrodinger Solver, Rahim Khoie
Electrical & Computer Engineering Faculty Research
A self-consistent Boltzmann-Poisson-Schrödinger Solver is used to study the transconductance degradation in high electron mobility transistor (HEMT), which has extensively been reported by both experimental [1]-[8] and computational [9]-[ 13] researchers. As the gate voltage of a HEMT device is increased, its transconductance increases until it reaches a peak value, beyond which, the transconductance is degraded rather sharply with further increase in applied gate bias. We previously reported a two-subband self-consistent Boltzmann-Poisson- Schrödinger Solver for HEMT. [14] We further incorporated an additional self-consistency by calculating field-dependent, energy-dependent intersubband and intrasubband scattering rates due to ionized impurities and polar optical phonons.[15] …
Atomic Hydrogen Cleaning Of Inp(100) For Preparation Of A Negative Electron Affinity Photocathode, K. A. Elamrawi, M. A. Hafez, H. E. Elsayed-Ali
Atomic Hydrogen Cleaning Of Inp(100) For Preparation Of A Negative Electron Affinity Photocathode, K. A. Elamrawi, M. A. Hafez, H. E. Elsayed-Ali
Electrical & Computer Engineering Faculty Publications
Atomic hydrogen cleaning is used to clean InP(100) negative electron affinity photocathodes. Reflection high-energy electron diffraction patterns of reconstructed, phosphorus-stabilized, InP(100) surfaces are obtained after cleaning at ∼400 °C. These surfaces produce high quantum efficiency photocathodes (∼8.5%), in response to 632.8 nm light. Without atomic hydrogen cleaning, activation of InP to negative electron affinity requires heating to ∼530 °C. At this high temperature, phosphorus evaporates preferentially and a rough surface is obtained. These surfaces produce low quantum efficiency photocathodes (∼0.1%). The use of reflection high-energy electron diffraction to measure the thickness of the deposited cesium layer during activation by correlating …
Research Highlights, Grigory Simin