Open Access. Powered by Scholars. Published by Universities.®

Electrical and Computer Engineering Commons

Open Access. Powered by Scholars. Published by Universities.®

Electronic Devices and Semiconductor Manufacturing

Institution
Keyword
Publication Year
Publication
Publication Type
File Type

Articles 841 - 870 of 875

Full-Text Articles in Electrical and Computer Engineering

Temporal Development Of Electric Field Structures In Photoconductive Gaas Switches, K. H. Schoenbach, J. S. Kenney, F.E. Peterkin, R. J. Allen Jan 1993

Temporal Development Of Electric Field Structures In Photoconductive Gaas Switches, K. H. Schoenbach, J. S. Kenney, F.E. Peterkin, R. J. Allen

Bioelectrics Publications

The temporal development of the electric field distribution in semi‐insulating GaAs photoconductive switches operated in the linear and lock‐on mode has been studied. The field structure was obtained by recording a change in the absorption pattern of the switch due to the Franz–Keldysh effect at a wavelength near the band edge of GaAs. In the linear mode, a high field layer develops at the cathode contact after laser activation. With increasing applied voltage, domainlike structures become visible in the anode region and the switch transits into the lock‐on state, a permanent filamentary electrical discharge. Calibration measurements show the field intensity …


The Effect Of Contacts On The Performance Of Electron-Beam Controlled Gaas And Diamond Switches, Michael Kevin Kennedy Oct 1992

The Effect Of Contacts On The Performance Of Electron-Beam Controlled Gaas And Diamond Switches, Michael Kevin Kennedy

Electrical & Computer Engineering Theses & Dissertations

The performance of GaAs and diamond as electron-beam controlled closing and opening switches has been studied. An emphasis has been placed on the effect of contacts on the current-voltage characteristics. The two materials studied were GaAs and diamond. Using the same semi-insulating GaAs wafer as a source of material, a bulk device and a p-i-n device have been fabricated and compared. The asymmetry of the pin diode allows operation at higher voltage because of the ability to suppress the lock-on effect. Whereas GaAs was ionized through cathodoluminescence; diamond, in the form of thin films, has been directly ionized by the …


A Novel Technique For Deep Level Characterization Of High-Resistivity Semiconductor Materials, Sridhar Panigrahi Jul 1992

A Novel Technique For Deep Level Characterization Of High-Resistivity Semiconductor Materials, Sridhar Panigrahi

Electrical & Computer Engineering Theses & Dissertations

An improved photo induced current transient spectroscopy (PICTS) technique is developed for studying deep level parameters in high-resistivity semiconductor materials. A new digital data acquisition approach and improvement in the cryogenics of the system have enabled us, for the first time in our laboratory, to detect CuA level in a copper doped silicon compensated gallium arsenide (GaAs:Si:Cu) sample. The digital approach improves both the signal to noise ratio (S/N) and the efficiency of the system. Also, multiple PICTS spectra in a single thermal cycle can be obtained. In the present work, various doped and undoped gallium arsenide ( GaAs) and …


Robotic Tactile Sensors Fabricated From A Monolithic Silicon Integrated Circuit And A Piezoelectric Polyvinylidene Fluoride Thin Film, Craig S. Dyson Dec 1991

Robotic Tactile Sensors Fabricated From A Monolithic Silicon Integrated Circuit And A Piezoelectric Polyvinylidene Fluoride Thin Film, Craig S. Dyson

Theses and Dissertations

The purpose of this research effort was to design, fabricate, and test a tactile sensor system consisting of an external high impedance switch circuit, an external multiplexing circuit, and a tactile sensor IC. In order to accomplish this objective, a hardware design and selection process was implemented along with a logical test methodology. An external multiplexer circuit samples all of the array elements in 50 ms. The current prototype sensor has linearity spanning loads of 0.8 g to 135 g, a load resolution of 20 g, and a maximum bandwidth of 25 Hz. Using an elementary shape recognition algorithm the …


Evaluation Of An Interdigitated Gate Electrode Field-Effect Transistor (Igefet) For In Situ Resin Cure Monitoring, Thomas E. Graham Dec 1991

Evaluation Of An Interdigitated Gate Electrode Field-Effect Transistor (Igefet) For In Situ Resin Cure Monitoring, Thomas E. Graham

Theses and Dissertations

The purpose of this study was to design an Interdigitated Gate Electrode Field-Effect Transistor (IGEFET) and evaluate its performance as an in situ resin cure monitor. A commercially available resin was selected for the research, and rheological studies were performed to identify the resin's gelation point during isothermal cures at two selected temperatures. Additional rheological studies were performed to identify the resin's glass transition temperature. The interdigitated gate electrode of the IGEFET was coated with samples of the resin, and electrical measurements were performed while the resin cured. The chemical changes which occur in the resin as a result of …


Application Of Silicon Micromachining To Thermal Dissipation Issues In Wafer Scale Integrated Circuits, Edward Cosnyka Dec 1991

Application Of Silicon Micromachining To Thermal Dissipation Issues In Wafer Scale Integrated Circuits, Edward Cosnyka

Theses and Dissertations

The purpose of this research effort was to investigate the feasibility of applying the silicon micromachining technique to thermal management as applied to integrated circuits and wafer scale integration techniques. Three silicon micromachined structures and an untextured reference wafer were compared as heat-dissipating surfaces. These four surfaces were realized using 3-inch diameter, single crystal silicon wafers. The following structures were micromachined in silicon wafers using wet chemical, anisotropic etching and photolithographic techniques: (1) randomly spaced and sized pyramids in (100)-oriented silicon, (2) deep vertical-wall grooves in (110)-oriented silicon, and (3) micro-fluid channels in (100)-oriented silicon. The heat- dissipating silicon wafers …


Study Of Cathodoluminescence In Semiconductors, Mandakini V. Kale Oct 1991

Study Of Cathodoluminescence In Semiconductors, Mandakini V. Kale

Electrical & Computer Engineering Theses & Dissertations

Cathodoluminescence in Zn doped GaAs and ZnSe, the materials of interest for electron-beam controlled semiconductor switches, has been investigated. A new diagnostic technique, using telescopic setup of lenses, was developed to study the spatially resolved cathodoluminescence. The setup eliminated the light, other than rays from the sample, parallel to the optical axis, resulting in an enhanced spatial resolution. At high e-beam energies, light was detected, from the Zn layer region in the GaAs. It is proposed to be due to the radiative recombination of electron-hole pairs, created by the e-beam. For the polycrystalline ZnSe no light emission was detected. This …


Cathodoluminescence Of Gaas, Tyler Smith Jul 1991

Cathodoluminescence Of Gaas, Tyler Smith

Electrical & Computer Engineering Theses & Dissertations

Cathodoluminescence of band-gap radiation across the bulk of a proposed semiconductor switch has been studied. Such a device relies on the efficient use of cathodoluminescence to modulate the conductivity of the switch. Diagnostics were configured to measure the intensity of band-gap radiation across the bulk of several switch samples. The measured results were compared to calculations based on a four energy level band-gap model which included two deep levels EL2 and HL10.


Hybrid Wafer Scale Microcircuit Integration -- [ 5008213 ], Edward S. Kolesar Jr. Apr 1991

Hybrid Wafer Scale Microcircuit Integration -- [ 5008213 ], Edward S. Kolesar Jr.

AFIT Patents

A wafer scale integration arrangement wherein integrated circuit die of varying size, fabrication processes, and function are commonly mounted in the same host wafer using a filled epoxy material of special characteristics. The mounting epoxy material also serves as a substrate for the die interconnecting conductors in regions adjacent the mounted die. The described assembly also includes a newly available photosensitive polyimide material as a planarization and passivation covering for the die and hose wafer and as a mounting surface for an interconnecting metal conductor array. Multiple levels of interconnection metal. Fabrication processes for the die to host wafer attachment …


Q Improvement Of A 5.2 Ghz Te011 Cavity By Incorporating Y1Ba2Cu3O7-X, R. Joseph Leclear Apr 1991

Q Improvement Of A 5.2 Ghz Te011 Cavity By Incorporating Y1Ba2Cu3O7-X, R. Joseph Leclear

Electrical & Computer Engineering Theses & Dissertations

Research is undertaken to apply high temperature superconducting material to improve the quality factor (Q) of a 5.2 GHz cylindrical resonant cavity. In particular, the approach is to electrophoretically deposit polycrystalline Y1Ba2Cu3O7-x (YBCO) on the conducting surface of the cavity cylinder. Spalling of the YBCO ceramic coating due to expansion and contraction of the cavity during sintering and testing is overcome by segmenting the cylinder. Results show that the Q of the cavity is increased over that of a copper cavity at temperatures below 60 K. At 20 K, improvement exceeds a factor …


Monte Carlo Simulation Of Millimeter-Wave Gunn Effect Oscillators, Ramani Vaidyanathan Apr 1991

Monte Carlo Simulation Of Millimeter-Wave Gunn Effect Oscillators, Ramani Vaidyanathan

Electrical & Computer Engineering Theses & Dissertations

Monte Carlo simulations have been carried out to investigate the performance of microwave Gunn oscillators. Three separate aspects of the simulation problem have been comprehensively addressed in this work. First, the presence of an external circuit has been self-consistently incorporated into the calculations. The inclusion of the external circuit facilitates a study of the circuit controlled regime, and correctly models effects arising from the time dependent boundary conditions. Secondly, microscopic details of the electronic relaxation mechanisms which ultimately control the frequency response limits, have been taken into account through an iterative Monte Carlo-Poisson scheme. This procedure overcomes a potential shortcoming …


Hybrid Wafer Scale Microcircuit Integration -- [ 4989063 ], Edward S. Kolesar Jr. Jan 1991

Hybrid Wafer Scale Microcircuit Integration -- [ 4989063 ], Edward S. Kolesar Jr.

AFIT Patents

A wafer scale integration arrangement wherein integrated circuit die of varying size, fabrication processes, and function are commonly mounted in the same host wafer using a filled epoxy material of special characteristics. The mounting epoxy material also serves as a substrate for the die interconnecting conductors in regions adjacent the mounted die. The described assembly also includes a newly available photosensitive polyimide material as a planarization and passivation covering for the die and host wafer and as a mounting surface for an interconnecting metal conductor array. Multiple levels of interconnection metal. Fabrication processes for the die to host wafer attachment …


Properties Of Ruthenium Oxide Coatings, Roger M. Hawk, Kamesh V. Gadepally, David N. Patangia Jan 1991

Properties Of Ruthenium Oxide Coatings, Roger M. Hawk, Kamesh V. Gadepally, David N. Patangia

Journal of the Arkansas Academy of Science

Ruthenium oxide coatings have been deposited on titanium substrates using a flood coating process. These films were heat treated for varying times and temperatures. The resulting films subsequently were characterized by performing resistivity and SEM analyses. Resistivity of the ruthenium oxide coating was found to be extremely dependent upon the firing temperature. Effect of the process conditions and formulations of the coatings on the morphology with respect to their electrical characteristics is presented. Capacitors were fabricated using plates coated with ruthenium oxide coatings. Capacitance versus heat treatment temperatures are discussed and at one firing temperature (480'C), the capacitance was 50 …


Novel Chemical Preparative Route For Semiconducting Mose2 Thin Films, K. C. Mandal, O. Savadogo Jan 1991

Novel Chemical Preparative Route For Semiconducting Mose2 Thin Films, K. C. Mandal, O. Savadogo

Faculty Publications

No abstract provided.


Optical And High Electric Field Effects In Bulk Gallium Arsenide Switches, Randy Roush Oct 1990

Optical And High Electric Field Effects In Bulk Gallium Arsenide Switches, Randy Roush

Electrical & Computer Engineering Theses & Dissertations

During the past few years, bulk, photoconductive switching has become recognized as a viable topic for future research on moderate and high power switches. The two-pulse, or BOSS, concept relies on an excitation laser pulse, and a separate de-excitation pulse in conjunction with silicon doped, copper compensated, GaAs to create a variable temporal electrical pulse width. The research contained in this document provides information concerning the feasibility of the BOSS concept, as the switch is scaled to larger sizes, and higher voltage and current. The major concern will be the high voltage and current effects. The absorption length for 1064 …


Deep Level Characterization Studies In Gaas, Gordhan R. Barevadia Oct 1990

Deep Level Characterization Studies In Gaas, Gordhan R. Barevadia

Electrical & Computer Engineering Theses & Dissertations

The goal of this research was to investigate deep levels in different types of GaAs, a material for high power optically controlled bulk semiconductor switches. For low resistivity semiconductors, such as silicon doped GaAs material (p =0.054 Ω cm), deep level transient spectroscopy (DLTS) was used to characterize deep levels. Three deep levels (EL6, EL3, and EL2) have been detected in this material. For high resistivity semiconductors (p > 104 Ω cm), difficulty of electrical carrier injection and of making a junction does not permit the use of DLTS technique. Therefore, an experimental set-up of the photo-induced current transient spectroscopy …


Analysis And Development Of A Switched Capacitor Power Supply, John Richard Hackworth Apr 1990

Analysis And Development Of A Switched Capacitor Power Supply, John Richard Hackworth

Electrical & Computer Engineering Theses & Dissertations

The combination of a switched capacitor network and switching power supply techniques can result in a transformer less regulated DC power supply that is small, relatively simple, and efficient. In addition, the output of such a system could be operated over a wide range of common mode voltages. Multiple switched capacitor supplies could be stacked to achieve voltage multiplication.

Although the output of a system of this type is a continuous function, the internal operation must be analyzed in finite time elements. This numerical analysis will be shown in both a mathematical approach and a computer model.


Hydrogenation Effects On Trap Related Conduction In Diamond, Linwood Cleveland Watkins Iii Apr 1990

Hydrogenation Effects On Trap Related Conduction In Diamond, Linwood Cleveland Watkins Iii

Electrical & Computer Engineering Theses & Dissertations

In this research work, the results of an experimental investigation on the electrical conduction mechanism in type Ιa and Ilb diamonds are presented. These results are compared with those of previous theoretical studies. The basic physical properties of diamond are discussed. Details of ohmic contact formation on diamond are presented.

The current-voltage characteristics revealed the presence of traps located below the Fermi level. The unfilled trap density was determined. The deep traps were further studied using spectroscopic photoconductivity measurements and the trap energy levels were determined.

The effects of hydrogenation on trap related conduction were studied subsequently. Hydrogenation was carried …


Influence Of Copper Doping On The Performance Of Optically Controlled Gaas Switches, St. T. Ko, V. K. Lakdawala, K. H. Schoenbach, M. S. Mazzola Jan 1990

Influence Of Copper Doping On The Performance Of Optically Controlled Gaas Switches, St. T. Ko, V. K. Lakdawala, K. H. Schoenbach, M. S. Mazzola

Electrical & Computer Engineering Faculty Publications

The influence of the copper concentration in silicon-doped gallium arsenide on the photoionization and photoquenching of charge carriers was studied both experimentally and theoretically. The studies indicate that the compensation ratio (NCu/NSi) is an important parameter for the GaAs:Si:Cu switch systems with regard to the turn-on and turn-off performance. The optimum copper concentration for the use of GaAs:Si:Cu as an optically controlled closing and opening switch is determined.


The Electrical Characteristics Of Semi-Insulating Gallium Arsenide A Material For High Power Switches, David Clifton Stoudt Oct 1989

The Electrical Characteristics Of Semi-Insulating Gallium Arsenide A Material For High Power Switches, David Clifton Stoudt

Electrical & Computer Engineering Theses & Dissertations

An experimental study of the electrical characteristics of semi-insulating gallium arsenide has been performed. The goal of this research was to aid in the development of an electron-beam controlled high-power semiconductor switch. The electrical characteristics were found to be heavily dependent on the deep level configuration of the material being investigated. Two methods of deep level characterization are discussed and their results are compared to the information given by the material manufacturer. Studies were conducted to determine both the steady-state and transient dark current characteristics of the switch. Along with being a function of the applied voltage and the deep …


Study Of Direct Semiconductor Materials For An Optically Controlled Switch, Sung Taek Ko Apr 1989

Study Of Direct Semiconductor Materials For An Optically Controlled Switch, Sung Taek Ko

Electrical & Computer Engineering Theses & Dissertations

A model for a bulk GaAs photoconductive switch has been developed and solved to determine the performance of the device in closing and opening switch applications. The GaAs material has been characterized by deep level transient spectroscopy (DLTS). Two electron traps (EL2 and EL5) and one hole trap (CuB} have been detected and were included in the model. Simulation studies are performed on several GaAs switch systems composed of different combinations and density of deep levels to investigate the influence of deep traps in a photoconductive switch system. The electron occupancy of each deep trap is traced in …


Integrated Circuits Interconnect Metallization For The Submicron Age, Kamesh V. Gadepally, Roger M. Hawk Jan 1989

Integrated Circuits Interconnect Metallization For The Submicron Age, Kamesh V. Gadepally, Roger M. Hawk

Journal of the Arkansas Academy of Science

The interconnect metallization being used by the semiconductor industry has been aluminum or aluminum silicon. Aluminum silicon is being replaced by aluminum copper and aluminum copper silicon, due to its superior resistance to electromigration and hillock growth. This paper discusses the implementation of aluminum copper/silicon alloys in semiconductor processing, along with a review of the problems and advantages of the same.


Gaas Photoconductive Closing Switches With High Dark Resistance And Microsecond Conductivity Decay, M. S. Mazzola, K. H. Schoenbach, V. K. Lakdawala, R. Germer, G. M. Loubriel, F. J. Zutavern Jan 1989

Gaas Photoconductive Closing Switches With High Dark Resistance And Microsecond Conductivity Decay, M. S. Mazzola, K. H. Schoenbach, V. K. Lakdawala, R. Germer, G. M. Loubriel, F. J. Zutavern

Electrical & Computer Engineering Faculty Publications

Silicon-doped n-type gallium arsenide crystals, compensated with diffused copper, were studied with respect to their application as photoconductive, high-power closing switches. The attractive features of GaAs:Cu switches are their high dark resistivity, their efficient activation with Nd:YAG laser radiation, and their microsecond conductivity decay time constant. In the authors' experiment, electric fields are high as 19 kV/cm were switched, and current densities of up to 10 kA/cm2 were conducted through a closely compensated crystal. At field strengths greater than approximately 10 kV/cm, a voltage `lock-on' effect was observed.


Nanosecond Optical Quenching Of Photoconductivity In A Bulk Gaas Switch, M. S. Mazzola, K. H. Schoenbach, V. K. Lakdawala, S. T. Ko Jan 1989

Nanosecond Optical Quenching Of Photoconductivity In A Bulk Gaas Switch, M. S. Mazzola, K. H. Schoenbach, V. K. Lakdawala, S. T. Ko

Electrical & Computer Engineering Faculty Publications

Persistent photoconductivity in copper-compensated, silicon-doped semi-insulating gallium arsenide with a time constant as large as 30 µs has been excited by sub-band-gap laser radiation of photon energy greater than 1 eV. This photoconductivity has been quenched on a nanosecond time scale by laser radiation of photon energy less than 1 eV. The proven ability to turn the switch conductance on and off on command, and to scale the switch to high power could make this semiconductor material the basis of an optically controlled pulsed-power closing and opening switch.


Design Of The Electronics And Optics Needed To Support Charge-Coupled Devices : A Project Report ..., Kah Yep Zee Jan 1989

Design Of The Electronics And Optics Needed To Support Charge-Coupled Devices : A Project Report ..., Kah Yep Zee

University of the Pacific Theses and Dissertations

Over the last five years, charge-coupled devices (CCD) have been improved dramatically in terms of sensitivity, manufacturability and particularly, cost. This has enabled them to be used economically in many more industrial and commercial electronic imaging processes. They are found in products ranging from video cameras to satellite-based camera systems. This has sparked my interests in these devices, and with a great deal of encouragement from Dr. Turpin, I decided to base my Master's thesis/project on a CCD. The project was mainly based on the design of the electronics and optics needed to support a CCD. The particular circuit design …


A Bulk Optically Controlled Semiconductor Switch, Rudolf K.F. Germer, Karl H. Schoenbach, Stephen G.E. Pronko Jan 1988

A Bulk Optically Controlled Semiconductor Switch, Rudolf K.F. Germer, Karl H. Schoenbach, Stephen G.E. Pronko

Bioelectrics Publications

Turn‐on and turn‐off of bulk semiconductor switches, based on excitation and quenching of photoconductivity, respectively, have been demonstrated with copper‐doped II‐VI semiconductor crystals. The increase of the conductivity (turn‐on) was realized with a xenon flash‐lamp pulse of 15‐μs duration. A reduction of the conductivity (turn‐off) was obtained by irradiating the samples with IR light using an 8‐ns Nd:YAG laser pulse (YAG denotes yttrium aluminum garnet). For turn‐on in CdS:Cu the conductivity follows the xenon flash excitation. The turn‐off time constant was 250 ns. ZnS and ZnSe crystals showed a slower response. A memory effect for the IR light was observed.


An Optically Controlled Closing And Opening Semiconductor Switch, K. H. Schoenbach, V. K. Lakdawala, R. Germer, S. T. Ko Jan 1988

An Optically Controlled Closing And Opening Semiconductor Switch, K. H. Schoenbach, V. K. Lakdawala, R. Germer, S. T. Ko

Electrical & Computer Engineering Faculty Publications

A concept for a bulk semiconductor switch is presented, where the conductivity is increased and reduced, respectively, through illumination with light of different wavelengths. The increase in conductivity is accomplished by electron ionization from deep centers and generation of bound holes. The reduction of conductivity is obtained by hole ionization from the excited centers and subsequent recombination of free electrons and holes. The transient behavior of electron and hole density in a high power semiconductor (GaAs:Cu) switch is computed by means of a rate equation model. Changes in conductivity by five orders of magnitude can be obtained.


An Investigation Of The Uses Of Scanning Electron Microscopy In The Analysis Of The Substructure Morphology Of Semiconducting Devices, Michael E. Courbat Jul 1987

An Investigation Of The Uses Of Scanning Electron Microscopy In The Analysis Of The Substructure Morphology Of Semiconducting Devices, Michael E. Courbat

Graduate Research Papers

The purpose of this study is to determine the technical requirements of SEM failure analysis in regard to its' inclusion in the Energy and Power curriculum of the Department of Industrial Technology, University of Northern Iowa.


Evidence For Amphoteric Behavior Of Ru On Cdte Surfaces, D. N. Bose, S. Basu, K. C. Mandal, D. Mazumdar Feb 1986

Evidence For Amphoteric Behavior Of Ru On Cdte Surfaces, D. N. Bose, S. Basu, K. C. Mandal, D. Mazumdar

Faculty Publications

No abstract provided.


Electrical And Structural Properties Of P-N Junctions In Cw Laser Annealed Silicon, M. Maier, D. Bimberg, G. Fernholz, H. Baumgart, F. Phillipp Jan 1982

Electrical And Structural Properties Of P-N Junctions In Cw Laser Annealed Silicon, M. Maier, D. Bimberg, G. Fernholz, H. Baumgart, F. Phillipp

Electrical & Computer Engineering Faculty Publications

Depth profiles of the electrical quality of ion implanted and cw laser annealed p-n junctions in silicon are obtained for the first time by secondary ion mass spectroscopy. A comparison with the crystallographic properties of the surface and the junction as observed by Nomarski optical microscopy as well as cross-sectional and plan view transmission electron microscopy is made. Samples containing slip dislocations show better insulation and a lower reverse bias current across the p-n junction as compared to samples with a perfect surface in agreement with current-voltage characteristics. Small dislocation loops located at the junction are found to degrade the …