Engineering Commons^™

Transformation Of Fresnel’S Interface Reflection And Transmission Coefficients Between Normal And Oblique Incidence, R. M.A. Azzam

Electrical Engineering Faculty Publications

If w denotes an interface Fresnel reflection or transmission coefficient for s- or p-polarized light at an oblique angle of incidence ø, and z denotes the same coefficient at normal incidence, we find that w is an analytic function of z, w = ƒ(z), that depends on ø but not on the specific optical properties of the two media on both sides of the interface. All four functions that correspond to the four distinct Fresnel coefficients and their inverses are determined. We single out for detailed examination, as an example, the relationship between the reflection of s -polarized light at …

The University, Electrical Engineering And Space Travel, Doran Baker

Faculty Honor Lectures

In this paper, my purpose is three-fold: First, to tell some of the story of the development of the Engineering College at Utah State University; second, to present selected concepts and applications in the evolution of electrical engineering; third, to relate these concepts and developments to our space venture and to the twenty-first century_ My perspective is that of a school teacher, engineer, scientist and historian; superimposed upon this is my imbedment in the system as an administrator of teachers and researchers. I intend to strike a balance between generality and depth, between technology and philosophy, and between perception and …

Reflection Of An Electromagnetic Plane Wave With 0 Or Π Phase Shift At The Surface Of An Absorbing Medium, R. M.A. Azzam

Electrical Engineering Faculty Publications

An electromagnetic plane wave incident obliquely from a transparent medium onto the surface of an absorbing medium can be reflected with 0 or π phase shift if (i) the wave is p (TM) polarized, and (ii) the complex relative dielectric function ε is such that 0 ≤|ε| ²/2Re(ε) ≤ 1. Furthermore, the locus of ε such that the reflection coefficient for the p polarization is real at the same angle of incidence, is a circle, and that of ε^½ (the complex relative refractive index) is Bernoulli’s lemniscate.

Principal Angle, Principal Azimuth, And Principal-Angle Ellipsometry Of Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul

Electrical Engineering Faculty Publications

When the film thickness is considered as a parameter, a system composed of a transparent film on an absorbing substrate (in a transparent ambient) is characterized by a range of principal angle ø¯_min ≤ ø¯ ≤ ø¯_max over which the associated principal azimuth ψ¯ varies between 0° and 90° (i.e., 0° ≤ ψ¯ ≤ 90°) and the reflection phase difference Δ assumes either one of the two values: +π/2 or −π/2. We determine the principal angle ø¯(d) and principal azimuth ψ¯(d) as functions of film thickness d for the vacuum-SiO₂-Si system at …

Propagation Of Partially Polarized Light Through Anisotropic Media With Or Without Depolarization: A Differential 4 × 4 Matrix Calculus, R. M.A. Azzam

Electrical Engineering Faculty Publications

We extend the scope of the Mueller calculus to parallel that established by Jones for his calculus. We find that the Stokes vector S of a light beam that propagates through a linear depolarizing anisotropic medium obeys the first-order linear differential equation dS/dz = mS, where z is the distance traveled along the direction of propagation and m is a 4 × 4 real matrix that summarizes the optical properties of the medium which influence the Stokes vector. We determine the differential matrix m for eight basic types of optical behavior, find its form for the most general anisotropic nondepolarizing …

Consequences Of Light Reflection At The Interface Between Two Transparent Media Such That The Angle Of Refraction Is 45°, R. M.A. Azzam

Electrical Engineering Faculty Publications

The reflection of light at the interface between two transparent, homogeneous and optically isotropic media such that the angle of refraction is 45° has the following interesting consequences: (i) the interface relfectivity for the parallel (p) polarization is the square of that for the perpendicular (s) polarization; (ii) the angular deviation of the propagation direction upon refraction is equal to the polarization (or ellipsometric) angle ψ and (iii) the complex reflection coefficient for the ppolarization is stationary, in both magnitude and phase, with respect to small charges of the (refractive and/or absorptive) optical properties of …

The Measurement Of Depolarized Radiation For Monitoring The Mass Concentration Of Particulates, Bruce E. Wilson

Theses

The depolarization of backscattered polarized incident radiation which is expressed as a depolarization ratio was investigated as a means of monitoring the mass concentration of particles in stacks from coal-fired burners. This involved the design of an instrument that would detect small levels of radiation. Two methods were investigated. The first utilized a Gallium Arsenide laser and a silicon detector diode; the second was composed of a xenon flash lamp and a photomultiplier detector tube.

The relationship between the depolarization ratio and the mass concentration of diamond particles in the 0.01 gm/m³ to 0.5 gm/m³ was determined. Diamond …

Simulation Of Mechanical Rotation By Optical Rotation: Application To The Design Of A New Fourier Photopolarimeter, R. M.A. Azzam

Electrical Engineering Faculty Publications

The mechanical rotation of an optical element around the axis of a beam of polarized light can be easily simulated by using the phenomenon of optical rotation. Because optical rotation can be magnetically or electrically induced, virtually any kind of mechanical rotation can be mimicked. This interesting principle is applied to the design of a new Fourier photopolarimeter that uses an oscillating-azimuth retarder (OAR). The OAR consists of a quarter-wave plate surrounded by two ac-excited Faraday cells that produce equal and opposite sinusoidal optical rotations. Analysis of the operation of this polarimeter of no moving parts proves its ability to …

Generalized Ellipsometry Based On Azimuth Measurements Alone, R. M.A. Azzam

Electrical Engineering Faculty Publications

We investigate the azimuth response function, θ_o = f(θ_i), of a linear nondepolarizing optical system S, whereθ_i and θ_o, are the azimuths (orientations) of the generally elliptic vibrations of totally polarized light at the input and output of S. We find that the azimuth response function depends on five of the six parameters that specify the normalized circular Jones matrix of the optical system. Thus the entire polarization response of an optical system can be nearly completely reconstructed from its azimuth response alone. Five input-output azimuth measurements (θ_ik, θ_ok), k …

Reliability And Surface Degradation Aspects Of Synthetic Insulator Materials For Hv Application, Satyapal S. Bhatia

Dissertations

This study is a theoretical and experimental investigation on the state of the art of synthetic insulators for outdoor high voltage transmission systems.

The surface of a polymeric material is known to be degraded by, among other things, environmental stresses such as UV, air pollutants, etc. The reliability of an insulator material is governed by the surface and other characteristics that do not drift much as a function of stresses and time.

The surface characteristics of various synthetic materials, when these materials were exposed to UV radiation in the laboratory were studied. The changes in the surface properties of these …

Reliability Of Mos Devices : Threshold Voltage Instability, Sesha Rajamani Shankar

Dissertations

A very important factor in the reliability of MOS devices is the stability of the threshold voltage. This dissertation examines the effects of positive and negative gate bias stresses at elevated temperatures on the drift in the threshold voltage of MOS field effect transistors.

Over 400 p-channel enhancement mode devices were life tested under different temperature and gate bias conditions for periods of up to 15,000 hours, and the drift in their threshold voltages studied and analyzed. It was found that under both negative and positive bias-temperature tests, the threshold voltage drifted towards more negative values, though in the negative …

Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

A novel and very simple ellipsometer for the characterization of film-substrate systems that employs one rotating optical element (a polarizer) is proposed. The ellipsometer is based on detecting the angles of incidence at which a film-substrate system has equal amplitude attenuations for light polarized parallel (p) and perpendicular (s) to the plane of incidence. At a certain wavelength, the film thickness of the filmsubstrate system has to lie within permissible-thickness bands (PTB) for the technique to apply.

Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.

Acoustical Holography By Holographic Interferometry, Amin Mohamed Hanafy

Dissertations

The ability to "see" with sound has long been an intriguing concept. It is apparent that ultrasonic energy can give an image of an object not obtainable with light or even with x-rays.

In this dissertation, a novel "three-step acoustical holographic imaging system" is described and several means for its implementation are analyzed. A novel holographic acoustic image converter, which constitutes a fundamental link in the three step imaging method was also developed. The use of optical holographic techniques to convert an arbitrary acoustic image to a visible image is conducted and resulted in the introduction of the new technique …

Dynamics Of The Glucose-Insulin-Glucagon System, Joseph P. Hartmann

Theses

A computer model for the Dynamics of the Glucose-Insulin-Glucagon System has been developed for a 17.5 kg canine using the Continuous Systems Modeling Program (CSMP) for the 360 Computer System. The major body components controlling the glucose dynamics (liver, pancreas, body muscle, blood flow, and body fluid compartments) have been modeled in terms of either their production, absorption, or transport of glucose, and the concentration levels of both the hormones and substrates perfusing the body component. A set of mneumonics has also been developed to label the hundreds of constant and variable terms required to describe a complex system of …

Sparsity And Decoupling In Load Power Flow Analysis, Kenneth Nazimek

Theses

This paper presents some recent ideas on and methods created by power engineers for the solution of the Load Flow Problem. Beginning with an analysis of the solution of large systems of linear equations, techniques employing elementary matrix operations are discussed to reduce the amount of calculations necessary to achieve repeated solutions. Recent interest in taking advantage of the characteristic sparsity of the admittance matrix is also examined. The problems of operating on and computer storage of large sparse matrices are investigated. Methods to efficiently order, store and work with large sparse matrices are discussed and demonstrated. The general acceptance …

Ellipsometer Nulling: Convergence And Speed, Rasheed M.A. Azzam, D. L. Confer, N. M. Bashara

Electrical Engineering Faculty Publications

The process of nulling in ellipsometry is studied by a graphical presentation using the trajectories of two significant polarization states in the complex plane, _XPC and _XSA. These states are determined by (1) the polarizer and compensator (_XPC) and (2) the specimen and the analyzer (_XSA) in the polarizer-compensator-specimen-analyzer ellipsometer arrangement. As the azimuth angles of the ellipsometer elements are varied, _XPC and _XSA move closer to one another in a stepwise fashion until they coincide when a null is reached. Thus, at null, the polarization states are matched, and _XPC = _XSA. For …

Application Of Multilevel Control Techniques To Classes Of Distributed Parameter Plants, Frederick Donald Chichester

Dissertations

This study concerns the application of a combination of multilevel hierarchical systems analysis techniques and Pontryagin's minimum principle (multilevel control) to the problem of controlling optimally two classes of dynamic distributed parameter plants representing concentrations balances in streams, rivers and estuaries. The concentrations treated in this study are those deemed the most effective indicators of water quality, dissolved oxygen (DO) and biochemical oxygen demand (BOD).

One class of plants treated in this study consists of linear continuous distributed parameter plants represented mathematically by sets of simultaneous partial differential equations. Optimal control of a plant of this class is initiated by …

Frequency-Mixing Detection (Fmd) Of Polarization-Modulated Light, R. M.A. Azzam

Electrical Engineering Faculty Publications

When a light beam whose polarization and intensity are weakly modulated at a frequency ω_m passes through a periodic analyzer of frequency ω_a(<ω_m) and the transmitted flux is linearly detected, the resulting total signal S_t consists of two components: (i) a periodic baseband signal S_bb with harmonics of frequencies nω_a (n = 0,1,2,…) and (ii) an amplitude-modulated-carrier signal δS_mc with center (carrier) frequency ω_m and sideband frequencies at ω_m ± nω_a(n = 1,2,…). In this paper we show that the average polarization of the beam is determined …

The Effects Of Optical Path Perturbations During Recording On A Reconstructed Holographic Image, Stevan Israel Feldman

Dissertations

The effects of optical path perturbations occurring during recording on the reconstructed image of a hologram are investigated. It is shown that such variations of optical path are equivalent to conditions of holographic interferometry which can be classified in three categories: 1) object motion alone, 2) film motion alone, and 3) simultaneous film and object motion; all motions are defined with respect to the stationary reference source during the recording of the hologram.

The theory concerning the effects of object motion alone on the radiance distribution of a reconstructed holographic image has already been developed by previous researchers and is …

Modulated Generalized Ellipsometry, R. M.A. Azzam

Electrical Engineering Faculty Publications

We extend ellipsometry to the direct measurement of small perturbations of the Jones matrix of any linear nondepolarizing optical sample (system) subjected to a modulating stimulus such as temperature, stress, or electric or magnetic field. The methodology of this technique, to be called Modulated Generalized Ellipsometry (MGE), is presented. First an ellipsometer with arbitrary polarizing and analyzing optics is assumed, and subsequently the discussion is specialized to a conventional ellipsometer having either the polarizer-sample-analyzer (PSA) or the polarizer-compensator-sample-analyzer (PCSA) arrangement. MGE provides the tool for the systematic study of thermo-optical, piezo-optical, electro-optical, magneto-optical, and other allied effects for both isotropic …

Investigation And Optimum Design Of The Generalized Second-Order Phase-Locked Loop, William Allen Novick

Dissertations

In this dissertation, a second-order phase-locked loop (PLL) in which the loop filter contains complex zeros is investigated in both its linear and nonlinear modes of operation; prior designs used a filter containing a simple zero on the negative real axis. This "generalized" second-order PLL had been heretofore essentially unexplored.

The basic characteristics of the generalized second-order PLL operating in the linear mode including the open and closed-loop responses and the corresponding root locus were generated and compared against those of the conventional second-order PLL. As in the conventional case, the generalized second-order PLL is found to be unconditionally stable. …

Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

The results of a preceding paper [J. Opt. Soc. Am. 65, 1464,(1975)] are viewed from a different angleas providing the basis for the design of film-substrate single-reflection linear partial polarizers (LPP),which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO₂-Si LPP’s at λ = 6328 Å are shown graphically.

Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-substrate systems, provided that the film thickness lies within one of a set of permissible-thickness bands (PTB). For a transparent film on a transparent or absorbing substrate, the PTB structure consists of a small number of finite-bandwidth bands followed by a continuum band that extends from a film thickness of about half the wavelength of light to infinity. We show that this band structure is a direct consequence of the periodicity of the ellipsometric function ρ (the ratio R_p/R_s, of the complex amplitude-reflection coefficients for …

Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara

Electrical Engineering Faculty Publications

The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO₂—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …

Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approximations are general in that an arbitrary initial film thickness is assumed. They are simple, because a complex sensitivity function is introduced whose real and imaginary projections determine the psi (Ψ) and delta (Δ) sensitivity factors. Among the conclusions of this paper are the following. (1) External reflection ellipsometry …

An Investigation Of The Optical Absorption Properties Of Silicon As Related To Its Electrical Conductivity, Onofrio Louis Russo

Dissertations

The purpose of this study is to demonstrate the feasibility of obtaining the electrical conductivity of band gap semiconductors, by considering the absorption of radiation in the visible region. The experimental evidence confirmed predictions that the conductivities of the silicon samples are related to the horizontal displacement of energy in the absorption curves. The material used in this study was p-doped silicon, although the approach should be valid in general for either elemental or compound semiconductors.

The absorption coefficient for silicon was measured in the radiation region between 2.0 and 3.0 ev. This region above the indirect band gap (= …

Optimal Control And Identification Of Stochastic Systems Using Differential Game Theory, Harry Marvin Burbank

Dissertations

This dissertation deals with linear systems subjected to stochastic disturbances. The class of stochastic processes considered is the class of second order stochastic processes characterized by having finite continuous covariance. The properties of the covariance provide means to formulate optimization problems without the difficulties present when the covariance is not finite or continuous.

The first aspect studied was several classes of optimal control problems. The effects of the stochastic processes were approximated by the effects of its first two moments. This procedure resulted in allowing optimal system controls to be found whatever the first two moments of the stochastic input …

Damage Analysis Modified Trac Computer Program (Damtrac), George H. Baker Iii, Alan D. Mcnutt, G. Bradford Shea, David M. Rubenstein

School of Integrated Sciences - Faculty Scholarship

A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.

Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara

Electrical Engineering Faculty Publications

No abstract provided.