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Atomic force microscopy

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Articles 1 - 15 of 15

Full-Text Articles in Nanoscience and Nanotechnology

Investigation Of The Acoustic Response Of A Confined Mesoscopic Water Film Utilizing A Combined Atomic Force Microscope And Shear Force Microscope Technique, Monte Allen Kozell Jul 2018

Investigation Of The Acoustic Response Of A Confined Mesoscopic Water Film Utilizing A Combined Atomic Force Microscope And Shear Force Microscope Technique, Monte Allen Kozell

Dissertations and Theses

An atomic force microscopy beam-like cantilever is combined with an electrical tuning fork to form a shear force probe that is capable of generating an acoustic response from the mesoscopic water layer under ambient conditions while simultaneously monitoring force applied in the normal direction and the electrical response of the tuning fork shear force probe. Two shear force probes were designed and fabricated. A gallium ion beam was used to deposit carbon as a probe material. The carbon probe material was characterized using energy dispersive x-ray spectroscopy and scanning transmission electron microscopy. The probes were experimentally validated by demonstrating the ...


Advances In Single Molecule Microscopy: Protein Characterization, Force Analysis And Fluorescence Localization, Chi-Fu Yen Jan 2017

Advances In Single Molecule Microscopy: Protein Characterization, Force Analysis And Fluorescence Localization, Chi-Fu Yen

Graduate Theses and Dissertations

Recent advances in single molecule techniques have allowed scientists to address biological questions which cannot be resolved by traditional ensemble measurements. In this dissertation, I integrate single molecule and bulk measurements to establish a direct link between copper exposure and neurotoxicity in prion disease. Furthermore, I develop a new analysis method to improve the accuracy of kinetic parameter estimation in single molecule Atomic Force Microscope (AFM) experiments. Finally, I develop a new fluorescence localization microscopy to identify the axial position of a single fluorescent object with sub-nanometer accuracy.

Prion diseases are characterized by the misfolding and oligomerization of prion protein ...


Integrated Nanoscale Imaging And Spatial Recognition Of Biomolecules On Surfaces, Congzhou Wang Jan 2015

Integrated Nanoscale Imaging And Spatial Recognition Of Biomolecules On Surfaces, Congzhou Wang

Theses and Dissertations

Biomolecules on cell surfaces play critical roles in diverse biological and physiological processes. However, conventional bulk scale techniques are unable to clarify the density and distribution of specific biomolecules in situ on single, living cell surfaces at the micro or nanoscale. In this work, a single cell analysis technique based on Atomic Force Microscopy (AFM) is developed to spatially identify biomolecules and characterize nanomechanical properties on single cell surfaces. The unique advantage of these AFM-based techniques lies in the ability to operate in situ (in a non-destructive fashion) and in real time, under physiological conditions or controlled micro-environments.

First, AFM-based ...


Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman Sep 2014

Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman

Xin Xu

Existing force spectroscopy methods in tapping mode atomic force microscopy (AFM) such as higher harmonic inversion [M. Stark, R. W. Stark, W. M. Heckl, and R. Guckenberger, Proc. Natl. Acad. Sci. U. S. A. 99, 8473 (2002)] or scanning probe acceleration microscopy [J. Legleiter, M. Park, B. Cusick, and T. Kowalewski, Proc. Natl. Acad. Sci. U. S. A. 103, 4813 (2006)] or integral relations [M. Lee and W. Jhe, Phys. Rev. Lett. 97, 036104 (2006); S. Hu and A. Raman, Nanotechnology 19, 375704 (2008); H. Holscher, Appl. Phys. Lett. 89, 123109 (2006); A. J. Katan, Nanotechnology 20, 165703 (2009)] require ...


Ultrastable Atomic Force Microscopy For Biophysics, Allison Beth Churnside Jan 2013

Ultrastable Atomic Force Microscopy For Biophysics, Allison Beth Churnside

Physics Graduate Theses & Dissertations

Atomic force microscopy (AFM) is a multifunctional workhorse of nanoscience and molecular biophysics, but instrumental drift remains a critical issue that limits the precision and duration of experiments. We have significantly reduced the two most important types of drift: in position and in force. The first, position drift, is defined as uncontrolled motion between the tip and the sample, which occurs in all three dimensions. By scattering a laser off the apex of a commercial AFM tip, we locally measured and thereby actively controlled its three-dimensional position above a sample surface to <0.4Å(Δf = 0.01-10 Hz) in air at room ...


Electrostatic Actuation Based Modulation Of Polar Molecules And Associated Force Interaction Studies, Xiao Ma Jan 2013

Electrostatic Actuation Based Modulation Of Polar Molecules And Associated Force Interaction Studies, Xiao Ma

Graduate Theses and Dissertations

Seamless integration of artificial components with biological systems to form an elegant biotic-abiotic interface or smart surface has promising application potential in biomedical engineering. The specific aim of this study is to implement the actuation and modulation of binding behavior between biomolecules under electrostatic stimuli, and investigate the corresponding force interaction between the complementary pairs. The nanofabrication technology was utilized to establish the patterned binding pair of thrombin and DNA aptamer on gold substrate, and different electrical fields were applied on the system to evaluate electrostatic influence. The atomic force microscopy (AFM) surface imaging was then used to explicate the ...


Interfacial And Electrokinetic Characterization Of Ipa Solutions Related To Semiconductor Wafer Drying And Cleaning, Jin-Goo Park, Sang-Ho Lee, Ju-Suk Ryu, Yi-Koan Hong, Tae-Gon Kim, Ahmed A. Busnaina Apr 2012

Interfacial And Electrokinetic Characterization Of Ipa Solutions Related To Semiconductor Wafer Drying And Cleaning, Jin-Goo Park, Sang-Ho Lee, Ju-Suk Ryu, Yi-Koan Hong, Tae-Gon Kim, Ahmed A. Busnaina

Jin-Goo Park

In this study, the interfacial and electrokinetic phenomena of mixtures of isopropyl alcohol (IPA) and deionized (DI) water in relation to semiconductor wafer drying is investigated. The dielectric constant of an IPA solution linearly decreased from 78 to 18 with the addition of IPA to DI water. The viscosity of IPA solutions increased as the volume percentage of IPA in DI water increased. The zeta potentials of silica particles and silicon wafers were also measured in IPA solutions. The zeta potential approached neutral values as the volume ratio of IPA in DI water increased. A surface tension decrease from 72 ...


Interfacial And Electrokinetic Characterization Of Ipa Solutions Related To Semiconductor Wafer Drying And Cleaning, Jin-Goo Park, Sang-Ho Lee, Ju-Suk Ryu, Yi-Koan Hong, Tae-Gon Kim, Ahmed A. Busnaina Jun 2011

Interfacial And Electrokinetic Characterization Of Ipa Solutions Related To Semiconductor Wafer Drying And Cleaning, Jin-Goo Park, Sang-Ho Lee, Ju-Suk Ryu, Yi-Koan Hong, Tae-Gon Kim, Ahmed A. Busnaina

Ahmed A. Busnaina

In this study, the interfacial and electrokinetic phenomena of mixtures of isopropyl alcohol (IPA) and deionized (DI) water in relation to semiconductor wafer drying is investigated. The dielectric constant of an IPA solution linearly decreased from 78 to 18 with the addition of IPA to DI water. The viscosity of IPA solutions increased as the volume percentage of IPA in DI water increased. The zeta potentials of silica particles and silicon wafers were also measured in IPA solutions. The zeta potential approached neutral values as the volume ratio of IPA in DI water increased. A surface tension decrease from 72 ...


Determining The Electronic Properties Of Individual Nanointerfaces By Combining Intermittent Afm Imaging And Contact Spectroscopy, Ramsey A. Kraya, Dawn A. Bonnell Nov 2010

Determining The Electronic Properties Of Individual Nanointerfaces By Combining Intermittent Afm Imaging And Contact Spectroscopy, Ramsey A. Kraya, Dawn A. Bonnell

Departmental Papers (MSE)

A method to determine the electronic properties at nanointerfaces or of nanostructures by utilizing intermittent contact atomic force microscopy and contact spectroscopy in one system is developed. By combining these two methods, the integrity of the interface or structure is maintained during imaging, while the extraction of the electronic information is obtained with contact spectroscopy. This method is especially vital for understanding interfaces between metal nanoparticles and substrates, where the nanoparticles are not tethered to the surface and can be combined with new and evolving techniques of thermal drift compensation to allow for a larger range of experiments on nanointerfaces ...


Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman Jan 2010

Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman

Birck and NCN Publications

Existing force spectroscopy methods in tapping mode atomic force microscopy (AFM) such as higher harmonic inversion [M. Stark, R. W. Stark, W. M. Heckl, and R. Guckenberger, Proc. Natl. Acad. Sci. U. S. A. 99, 8473 (2002)] or scanning probe acceleration microscopy [J. Legleiter, M. Park, B. Cusick, and T. Kowalewski, Proc. Natl. Acad. Sci. U. S. A. 103, 4813 (2006)] or integral relations [M. Lee and W. Jhe, Phys. Rev. Lett. 97, 036104 (2006); S. Hu and A. Raman, Nanotechnology 19, 375704 (2008); H. Holscher, Appl. Phys. Lett. 89, 123109 (2006); A. J. Katan, Nanotechnology 20, 165703 (2009)] require ...


An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan Jan 2010

An Alternative Method To Determining Optical Lever Sensitivity In Atomic Force Microscopy Without Tip-Sample Contact, Christopher J. Tourek, Sriram Sundararajan

Mechanical Engineering Publications

Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the ...


Strain Energy And Lateral Friction Force Distributions Of Carbon Nanotubes Manipulated Into Shapes By Atomic Force Microscopy, Mark C. Strus, Roya R. Lahiji, Pablo Ares, Vincente Lopez, Arvind Raman, Ron R. Reifenberger Aug 2009

Strain Energy And Lateral Friction Force Distributions Of Carbon Nanotubes Manipulated Into Shapes By Atomic Force Microscopy, Mark C. Strus, Roya R. Lahiji, Pablo Ares, Vincente Lopez, Arvind Raman, Ron R. Reifenberger

Other Nanotechnology Publications

The interplay between local mechanical strain energy and lateral frictional forces determines the shape of carbon nanotubes on substrates. In turn, because of its nanometer-size diameter, the shape of a carbon nanotube strongly influences its local electronic, chemical, and mechanical properties. Few, if any, methods exist for resolving the strain energy and static frictional forces along the length of a deformed nanotube supported on a substrate. We present a method using nonlinear elastic rod theory in which we compute the flexural strain energy and static frictional forces along the length of single walled carbon nanotubes (SWCNTs) manipulated into various shapes ...


Influence Of Reaction With Xef2 On Surface Adhesion Of Al And Al2o3 Surfaces, Tianfu Zhang, Jeong Park, Wenyu Huang, Gabor A. Somoraji Jan 2008

Influence Of Reaction With Xef2 On Surface Adhesion Of Al And Al2o3 Surfaces, Tianfu Zhang, Jeong Park, Wenyu Huang, Gabor A. Somoraji

Wenyu Huang

The change in surfaceadhesion after fluorination of Al and Al2O3surfaces using XeF2 was investigated with atomic force microscopy. The chemical interaction between XeF2 and Al and Al2O3surfaces was studied by in situx-ray photoelectron spectroscopy. Fresh Al and Al2O3surfaces were obtained by etching top silicon layers of Si∕Al and Si∕Al2O3 with XeF2. The surfaceadhesion and chemical composition were measured after the exposure to air or annealing (at 200°C under vacuum). The correlation between the adhesion force increase and presence of AlF3 on the surface was revealed.


Growth By Molecular Beam Epitaxy Of Self-Assembled Inas Quantum Dots On Inalas And Ingaas Lattice-Matched To Inp, Paul J. Simmonds, H W. Li, H E. Beere, P See, A J. Shields, D A. Ritchie Apr 2007

Growth By Molecular Beam Epitaxy Of Self-Assembled Inas Quantum Dots On Inalas And Ingaas Lattice-Matched To Inp, Paul J. Simmonds, H W. Li, H E. Beere, P See, A J. Shields, D A. Ritchie

Paul J. Simmonds

The authors report the results of a detailed study of the effect of growth conditions, for molecular beam epitaxy, on the structural and optical properties of self-assembled InAs quantum dots (QDs) on In0.524Al0.476As. InAs QDs both buried in, and on top of, In0.524Al0.476As were analyzed using photoluminescence (PL) and atomic force microscopy. InAs QD morphology and peak PL emission wavelength both scale linearly with deposition thickness in monolayers (MLs). InAs deposition thickness can be used to tune QD PL wavelength by 170 nm/ML, over a range of ...


The Effect Of Autocorrelation Length On The Real Area Of Contact And Friction Behavior Of Rough Surfaces, Yilei Zhang, Sriram Sundararajan Jan 2005

The Effect Of Autocorrelation Length On The Real Area Of Contact And Friction Behavior Of Rough Surfaces, Yilei Zhang, Sriram Sundararajan

Mechanical Engineering Publications

Autocorrelation length (ACL) is a surface roughness parameter that provides spatial information of surfacetopography that is not included in amplitude parameters such as root-mean-square roughness. This paper presents a relationship between ACL and the friction behavior of a rough surface. The influence of ACL on the peak distribution of a profile is studied based on Whitehouse and Archard’s classical analysis [Whitehouse and ArchardProc. R. Soc. London, Ser. A316, 97 (1970)] and their results are extended to compare profiles from different surfaces. The probability density function of peaks and the mean peak height of a profile are given as functions ...