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Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman
Accurate Force Spectroscopy In Tapping Mode Atomic Force Microscopy In Liquids, Xin Xu, John Melcher, Arvind Raman
Birck and NCN Publications
Existing force spectroscopy methods in tapping mode atomic force microscopy (AFM) such as higher harmonic inversion [M. Stark, R. W. Stark, W. M. Heckl, and R. Guckenberger, Proc. Natl. Acad. Sci. U. S. A. 99, 8473 (2002)] or scanning probe acceleration microscopy [J. Legleiter, M. Park, B. Cusick, and T. Kowalewski, Proc. Natl. Acad. Sci. U. S. A. 103, 4813 (2006)] or integral relations [M. Lee and W. Jhe, Phys. Rev. Lett. 97, 036104 (2006); S. Hu and A. Raman, Nanotechnology 19, 375704 (2008); H. Holscher, Appl. Phys. Lett. 89, 123109 (2006); A. J. Katan, Nanotechnology 20, 165703 (2009)] require …