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Full-Text Articles in VLSI and Circuits, Embedded and Hardware Systems

Low Voltage Cmos Sar Adc Design, Ryan Hunt Jun 2014

Low Voltage Cmos Sar Adc Design, Ryan Hunt

Electrical Engineering

This project centers on the design of a single ended 10-bit successive approximation register analog to digital converter (SAR ADC for short) that easily interfaces to a micro-controller, such as an Arduino. With micro-controller interfacing in mind, the universal data transfer technique of SPI proved an easy way to communicate between the ADC and the micro-controller. The ADC has a range of 1V (highest code value) to 0V (lowest code value) and operates from a single voltage rail value of 1.8V. Typical SPI clock speeds run on the order of 2MHz and with a 10-bit ADC this means a sampling …


Design Techniques To Improve Time Dependent Dielectric Breakdown Based Failure For Cmos Circuits, Emanuel S. Tarog Jan 2010

Design Techniques To Improve Time Dependent Dielectric Breakdown Based Failure For Cmos Circuits, Emanuel S. Tarog

Master's Theses

This project investigates the failure of various CMOS circuits as a result of Time Dependent Dielectric Breakdown (TDDB) and explores design techniques to increase the mean time to failure (MTTF) of large-scale circuits. Time Dependent Dielectric Breakdown is a phenomenon where the oxide underneath the gate degrades as a result of the electric field in the material. Currently, there are few well documented design techniques that can increase lifetime, but with a tool chain I created called the MTTF Analyzing Program, or MAP, I was able to test circuits under various conditions in order to identify weak links, discover relationships, …