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Articles 151 - 156 of 156
Full-Text Articles in Engineering
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Combined Reflection And Transmission Thin-Film Ellipsometry: A Unified Linear Analysis, Rasheed M.A. Azzam, M. Elshazly-Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approximations are general in that an arbitrary initial film thickness is assumed. They are simple, because a complex sensitivity function is introduced whose real and imaginary projections determine the psi (Ψ) and delta (Δ) sensitivity factors. Among the conclusions of this paper are the following. (1) External reflection ellipsometry …
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
No abstract provided.
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara
Electrical Engineering Faculty Publications
The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …
Trajectories Describing The Evolution Of Polarized Light In Homogeneous Anisotropic Media And Liquid Crystals, Rasheed M.A. Azzam, N. M. Bashara, B. E. Merrill
Trajectories Describing The Evolution Of Polarized Light In Homogeneous Anisotropic Media And Liquid Crystals, Rasheed M.A. Azzam, N. M. Bashara, B. E. Merrill
Electrical Engineering Faculty Publications
Trajectories are given that describe the evolution of the ellipse of polarization in the complex plane for light propagating in a homogeneous anisotropic medium and along the helical axis of a cholesteric liquid crystal. For the general homogeneous anisotropic medium that exhibits combined birefringence and dichroism the trajectory is a spiral that converges to the low-absorption eigenpolarization. For pure birefringence the trajectory becomes a complete circle that encloses one eigenpolarization, whereas for pure dichroism the trajectory becomes an arc of a circle that ends at the low-absorption eigenstate. The case of a cholesteric (or twisted nematic) liquid crystal leads to …
Loci Of Invariant-Azimuth And Invariant-Ellipticity Polarization States Of An Optical System, Rasheed M.A. Azzam, N. M. Bashara
Loci Of Invariant-Azimuth And Invariant-Ellipticity Polarization States Of An Optical System, Rasheed M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
The loci of polarization states for which either the ellipticity alone or the azimuth alone remains invariant upon passing through an optical system are introduced. The cartesian equations of these two loci are derived in the complex plane in which the polarization states are represented. The equations are quartic and are conveniently expressed in terms of the elements of the Jones. matrix of the optical system. As an exple the loci are determined for a system composed of a π/4 rotator followed by a quarter-wave retarder.
Analogy Between Linear Optical Systems And Linear Two-Port Electrical Networks, Rasheed M.A. Azzam, N. M. Bashara
Analogy Between Linear Optical Systems And Linear Two-Port Electrical Networks, Rasheed M.A. Azzam, N. M. Bashara
Electrical Engineering Faculty Publications
Attention is called to the analogy between linear optical systems and linear two-port electrical networks. For both, the transformation of a pair of oscillating quantities between input and output is of interest. The mapping of polarization by an optical system and of impedance (admittance) by a two-port network is described by a bilinear transformation. Therefore for each transfer property of a system of one type, there is a similar property for the system of the other type. Two-port electrical networks are synthesized whose impedance-(or admittance-) mapping properties are the same as the polarization-mapping properties of a given optical system. The …