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Constraint On The Optical Constants Of A Transparent Film On An Absorbing Substrate For Inversion Of The Ratio Of Complex P And S Reflection Coefficients At A Given Angle Of Incidence, R. M.A. Azzam, M. A. Habli
Constraint On The Optical Constants Of A Transparent Film On An Absorbing Substrate For Inversion Of The Ratio Of Complex P And S Reflection Coefficients At A Given Angle Of Incidence, R. M.A. Azzam, M. A. Habli
Electrical Engineering Faculty Publications
An absorbing substrate of complex refractive index n2-jk2 can be coated by a transparent thin film of refractive index n1 and normalized thickness ζ so that the ratio of complex reflection coefficients for the pand s polarizations of the film-covered substrate ρ is the inverse of that of the film-free substrate ρ¯ at a given angle of incidence φ. A pair of parallel (metallic) mirrors, one uncoated and the other coated with a ρ-inverting layer, causes a beam displacement without change of polarization and with a certain net reflectance (insertion loss) ℜ. In this …
Angular Sensitivity Of Brewster-Angle Reflection Polarizers: An Analytical Treatment, R. M.A. Azzam
Angular Sensitivity Of Brewster-Angle Reflection Polarizers: An Analytical Treatment, R. M.A. Azzam
Electrical Engineering Faculty Publications
The angular sensitivity of Brewster-angle reflection polarizers (BARP) is first studied approximately by determining the Taylor series expansion of the parallel reflectance Rp as a function of angle of incidence ø near the Brewster angle øB. Subsequently, exact and explicit equations are derived that determine the lower and upper limits, øl and øu, of the range of ø, that includes øB, over which Rp or the extinction ratioER is below a stated limit L. Examples are given of Ge and Si IR BARP for which øl and ø …
Antireflection Of An Absorbing Substrate By An Absorbing Thin Film At Normal Incidence, R. M.A. Azzam, E. Bu-Habib, J. Casset, G. Chassaing, P. Gravier
Antireflection Of An Absorbing Substrate By An Absorbing Thin Film At Normal Incidence, R. M.A. Azzam, E. Bu-Habib, J. Casset, G. Chassaing, P. Gravier
Electrical Engineering Faculty Publications
An absorbing substrate of complex refractive index n2 - jk2 at wavelength λ can be coated by an absorbing thin film of complex refractive index n1 - jk1 and thickness d to achieve zero reflection at normal incidence. For given n2,k2 multiple solutions (n1,k1,d/λ) are found that correspond to infinitely many distinct antireflection layers. This is demonstrated for a Si substrate at two wavelengths (6328 and 4420 Å). The response of these absorbing antireflection layers to changes of the angle of incidence from 0 …