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Full-Text Articles in Engineering
Polarized Light Reflectometer, R. M.A. Azzam
Polarized Light Reflectometer, R. M.A. Azzam
Electrical Engineering Faculty Publications
The modulated reflected and nonreflected light fluxes, measured as the azimuth of incident linearly polarized light is varied, yield the absolute reflectances Rp, and Rs, of a dielectric or semiconductor surface. Application to a reflective Si detector determines the refractive index and thickness of a SiO2 film on the detector surface.
Direct Relation Between Fresnel's Interface Reflection Coefficients For The Parallel And Perpendicular Polarizations: Erratum 2, R. M.A. Azzam
Direct Relation Between Fresnel's Interface Reflection Coefficients For The Parallel And Perpendicular Polarizations: Erratum 2, R. M.A. Azzam
Electrical Engineering Faculty Publications
The record is set straight concerning two equations that determine the reflection phase shifts at a single interface from the intensity reflectances forp- and s-polarized light at one angle of incidence. These equations appeared previously in this journal [J. Opt. Soc. Am. 69, 1007 (1979); erratum, J. Opt. Soc. Am. 70, 261 (1980)].
Field Tests Of The Dolphin--A Remotely Operated Survey Vehicle, M T. Kalcic, Edit J. Kaminsky
Field Tests Of The Dolphin--A Remotely Operated Survey Vehicle, M T. Kalcic, Edit J. Kaminsky
Electrical Engineering Faculty Publications
No abstract provided.