Quantum Physics Commons^™

Induced Quantum Dot Probe For Material Characterization, Yun-Pil Shim, Rusko Ruskov, Hilary M. Hurst, Charles Tahan

Faculty Research, Scholarly, and Creative Activity

We propose a non-destructive means of characterizing a semiconductor wafer via measuring parameters of an induced quantum dot on the material system of interest with a separate probe chip that can also house the measurement circuitry. We show that a single wire can create the dot, determine if an electron is present, and be used to measure critical device parameters. Adding more wires enables more complicated (potentially multi-dot) systems and measurements. As one application for this concept we consider silicon metal-oxide-semiconductor and silicon/silicon-germanium quantum dot qubits relevant to quantum computing and show how to measure low-lying excited states (so-called "valley" …