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Full-Text Articles in Optics
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Faculty Publications
Nanostructured optical materials, for example, metamaterials, have unique spectral, directional, and polarimetric properties. Samples designed and fabricated for infrared (IR) wavelengths have been characterized using broadband instruments to measure specular polarimetric transmittance or reflectance as in ellipsometry or integrated hemisphere transmittance or reflectance. We have developed a wavelength-tunable IR Mueller-matrix (Mm) polarimetric scatterometer which uses tunable external-cavity quantum-cascade lasers (EC-QCLs) to tune onto and off of the narrowband spectral resonances of nanostructured optical materials and performed full polarimeteric and directional evaluation to more fully characterize their behavior. Using a series of EC-QCLs, the instrument is tunable over 4.37-6.54 μm wavelengths …
Synthesis Of Non-Uniformly Correlated Partially Coherent Sources Using A Deformable Mirror, Milo W. Hyde Iv, Santasri Bose-Pillai, Ryan A. Wood
Synthesis Of Non-Uniformly Correlated Partially Coherent Sources Using A Deformable Mirror, Milo W. Hyde Iv, Santasri Bose-Pillai, Ryan A. Wood
Faculty Publications
The near real-time synthesis of a non-uniformly correlated partially coherent source using a low-actuator-count deformable mirror is demonstrated. The statistical optics theory underpinning the synthesis method is reviewed. The experimental results of a non-uniformly correlated source are presented and compared to theoretical predictions. A discussion on how deformable mirror characteristics such as actuator count and pitch affect source generation is also included.
Measuring The Reflection Matrix Of A Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks
Measuring The Reflection Matrix Of A Rough Surface, Kenneth W. Burgi, Michael A. Marciniak, Mark E. Oxley, Stephen E. Nauyoks
Faculty Publications
Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined …