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Full-Text Articles in Condensed Matter Physics
Precession Electron Diffraction And Its Advantages For Structural Fingerprinting In The Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov
Precession Electron Diffraction And Its Advantages For Structural Fingerprinting In The Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov
Physics Faculty Publications and Presentations
The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.
Structural Identification Of Cubic Iron-Oxide Nanocrystal Mixtures: X-Ray Powder Diffraction Versus Quasi-Kinematic Transmission Electron Microscopy, Peter Moeck
Physics Faculty Publications and Presentations
Two novel (and proprietary) strategies for the structural identification of a nanocrystal from either a single high-resolution (HR) transmission electron microscopy (TEM) image or a single precession electron diffraction pattern are proposed and their advantages discussed in comparison to structural fingerprinting from powder X-ray diffraction patterns. Simulations for cubic magnetite and maghemite nanocrystals are used as examples.
Transmission Electron Goniometry And Its Relation To Electron Tomography For Materials Science Apoplications, Peter Moeck, P. Fraundorf
Transmission Electron Goniometry And Its Relation To Electron Tomography For Materials Science Apoplications, Peter Moeck, P. Fraundorf
Physics Faculty Publications and Presentations
Aspects of transmission electron goniometry are discussed. Combined with high resolution phase contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast (Z-STEM) or the phase contrast bright field mode, transmission electron goniometry offers the opportunity to develop dedicated methods for the crystallographic characterization of nanocrystals in three dimensions. The relationship between transmission electron goniometry and electron tomography for materials science applications is briefly discussed. Internet based java applets that facilitate the application of transmission electron goniometry for cubic crystals with calibrated tilt-rotation and double-tilt specimen holders/goniometers are mentioned. The so called cubic-minimalistic tilt …