Open Access. Powered by Scholars. Published by Universities.®
- Discipline
- Institution
- Publication Year
- Publication
- Publication Type
Articles 31 - 31 of 31
Full-Text Articles in Applied Mathematics
Identifiability Of Semiconductor Defects From Lbic Images, Weifu Fang, Kazufumi Ito
Identifiability Of Semiconductor Defects From Lbic Images, Weifu Fang, Kazufumi Ito
Mathematics and Statistics Faculty Publications
The identifiability of defects in a semiconductor from its laser-beam-induced current (LBIC) image is studied. It is shown that the LBIC technique is reliable for detecting any spatial defects in the semiconductor material. Continuous dependence of the current measurements on the spatial defects is proved, and sensitivity is also discussed in certain cases.