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VLSI and Circuits, Embedded and Hardware Systems
Masters Theses 1911 - February 2014
Parameter variation; NASIC; on-chip variation sensor; nanowire FETs
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Full-Text Articles in Nanotechnology Fabrication
Parameter Variation Sensing And Estimation In Nanoscale Fabrics, Jianfeng Zhang
Parameter Variation Sensing And Estimation In Nanoscale Fabrics, Jianfeng Zhang
Masters Theses 1911 - February 2014
Parameter variations introduced by manufacturing imprecision are becoming more influential on circuit performance. This is especially the case in emerging nanoscale fabrics due to unconventional manufacturing steps (e.g., nano-imprint) and aggressive scaling. These parameter variations can lead to performance deterioration and consequently yield loss.
Parameter variations are typically addressed pre-fabrication with circuit design targeting worst-case timing scenarios. However, this approach is pessimistic and much of performance benefits can be lost. By contrast, if parameter variations can be estimated post-manufacturing, adaptive techniques or reconfiguration could be used to provide more optimal level of tolerance. To estimate parameter variations during run-time, on-chip …