Electronic Devices and Semiconductor Manufacturing Commons^™

Cell-Aware Fault Analysis And Test Set Optimization In Digital Integrated Circuits, Fanchen Zhang, Jennifer Dworak

Computer Science and Engineering Theses and Dissertations

Structural tests have many advantages over functional patterns. The fault coverage of structural patterns is generally higher and easier to quantify, well-known algorithms are available to generate them, and they are often a much easier choice for debugging and diagnosis. However, depending on the fault models used, traditional structural patterns can still miss many defects, such as the defects that may occur inside the standard cells, and when chips are placed on a board, they may fail in functional mode even if they pass all structural tests. This can happen even if those same structural tests are applied in-system on …