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Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Mohat Tool To Illustrate Diode And Transistor Modes Of Operation Using Ltspice, Getu D. Engdaw
Mohat Tool To Illustrate Diode And Transistor Modes Of Operation Using Ltspice, Getu D. Engdaw
Electrical Engineering
This project develops a tool to identify the modes of operation of diodes and transistors in a circuit. The MoHAT tool receives schematics or circuit files generated from LTspice, and it determines the state of each diode and transistor. This tool illustrates diodes, BJT and MOS regions of operations using text or graphics accordingly. The tool also suggests necessary adjustments to switch from one mode of operation to another upon users request. Furthermore, the tool specifies if a transistor functions in amplification region. The MoHAT tool compares the nodal voltages of an element and determines the mode of operation.
Skin Effect Suppression In Infrared-Laser Irradiated Planar Multi-Walled Carbon Nanotube/ Cu Conductors, Kamran Keramatnejad, Yang Gao, Yunshen Zhou, Hossein Rabiee Glogir, Mengmeng Wang, Yongfeng Lu
Skin Effect Suppression In Infrared-Laser Irradiated Planar Multi-Walled Carbon Nanotube/ Cu Conductors, Kamran Keramatnejad, Yang Gao, Yunshen Zhou, Hossein Rabiee Glogir, Mengmeng Wang, Yongfeng Lu
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
Skin effect suppression in planar multi-walled carbon nanotube (MWCNT)/Copper (Cu) conductors was realized at the 0-10 MHz frequency range through infrared laser irradiation of MWCNTs, which were coated on the surface of the Cu substrate via the electrophoretic deposition (EPD) method. The effect of laser irradiation and its power density on electrical and structural properties of the MWCNT/Cu conductors was investigated using a wavelength-tunable CO2 laser and then comparing the performance of the samples prepared at different conditions with that of pristine Cu. The irradiation at λ=9.219 μm proved to be effective in selective delivery of energy towards depths close …
Algan/Gan Metal-Oxide-Semiconductor Heterostructure Field-Effect Transistors On Sic Substrates, M. Asif Khan, X. Hu, A. Tarakji, Grigory Simin, J. Yang, R. Gaska, M. S. Shur
Algan/Gan Metal-Oxide-Semiconductor Heterostructure Field-Effect Transistors On Sic Substrates, M. Asif Khan, X. Hu, A. Tarakji, Grigory Simin, J. Yang, R. Gaska, M. S. Shur
Grigory Simin
We report on AlGaN/GaN metal–oxide–semiconductor heterostructurefield-effect transistors (MOS-HFETs) grown over insulating 4H–SiC substrates. We demonstrate that the dc and microwave performance of the MOS-HFETs is superior to that of conventional AlGaN/GaN HFETs, which points to the high quality of SiO2/AlGaNheterointerface. The MOS-HFETs could operate at positive gate biases as high as +10 V that doubles the channel current as compared to conventional AlGaN/GaN HFETs of a similar design. The gate leakage current was more than six orders of magnitude smaller than that for the conventional AlGaN/GaN HFETs. The MOS-HFETs exhibited stable operation at elevated temperatures up to 300 °Cwith excellent …
Mechanism Of Radio-Frequency Current Collapse In Gan-Algan Field-Effect Transistors, A. Tarakji, Grigory Simin, N. Ilinskaya, X. Hu, A. Kumar, A. Koudymov, J. Yang, M. Asif Khan, M. S. Shur, R. Gaska
Mechanism Of Radio-Frequency Current Collapse In Gan-Algan Field-Effect Transistors, A. Tarakji, Grigory Simin, N. Ilinskaya, X. Hu, A. Kumar, A. Koudymov, J. Yang, M. Asif Khan, M. S. Shur, R. Gaska
Grigory Simin
The mechanism of radio-frequency current collapse in GaN–AlGaN heterojunctionfield-effect transistors(HFETs) was investigated using a comparative study of HFET and metal–oxide–semiconductor HFET current–voltage (I–V) and transfer characteristics under dc and short-pulsed voltage biasing. Significant current collapse occurs when the gate voltage is pulsed, whereas under drain pulsing the I–V curves are close to those in steady-state conditions. Contrary to previous reports, we conclude that the transverse electric field across the wide-band-gap barrier layer separating the gate and the channel rather than the gate or surface leakage currents or high-field effects in the gate–drain spacing is responsible for the current collapse. We …
Bifacial Si Heterojunction-Perovskite Organic-Inorganic Tandem To Produce Highly Efficient (Η T * ~ 33%) Solar Cell, Reza Asadpour, Raghu Vamsi Krishna Chavali, Mohammad Ryyan Khan, Muhammad Ashraful Alam
Bifacial Si Heterojunction-Perovskite Organic-Inorganic Tandem To Produce Highly Efficient (Η T * ~ 33%) Solar Cell, Reza Asadpour, Raghu Vamsi Krishna Chavali, Mohammad Ryyan Khan, Muhammad Ashraful Alam
Department of Electrical and Computer Engineering Faculty Publications
As single junction photovoltaic (PV) technologies both Si heterojunction (HIT) and perovskite based solar cells promise high efficiencies at low cost. Intuitively a traditional tandem cell design with these cells connected in series is expected to improve the efficiency further. Using a self-consistent numerical modeling of optical and transport characteristics however we find that a traditional series connected tandem design suffers from low JSC due to band-gap mismatch and current matching constraints. Specifically a traditional tandem cell with state-of-the-art HIT ( η=24% ) and perovskite ( η=20% ) sub-cells provides only a modest tandem efficiency of ηT~ 25%. …