Electronic Devices and Semiconductor Manufacturing Commons^™

Novel Memristor Based True Random Number Generator, Scott Stoller

Boise State University Theses and Dissertations

Random numbers are an important, but often overlooked part of the modern computing environment. They are used everywhere around us for a variety of purposes, from simple decision making in video games such as a coin toss, to securing financial transactions and encrypting confidential communications. They are even useful for gambling and the lottery.

Random numbers are generated in many ways. Pseudo random number generators (PRNGs) generate numbers based on a formula. True random number generators (TRNGs) capture entropy from the environment to generate randomness. As our society and our devices become more connected in the digital world, it is …

The Effects Of Radiation On Memristor-Based Electronic Spiking Neural Networks, Sumedha Gandharava Dahl

Boise State University Theses and Dissertations

In this dissertation, memristor-based spiking neural networks (SNNs) are used to analyze the effect of radiation on the spatio-temporal pattern recognition (STPR) capability of the networks. Two-terminal resistive memory devices (memristors) are used as synapses to manipulate conductivity paths in the network. Spike-timing-dependent plasticity (STDP) learning behavior results in pattern learning and is achieved using biphasic shaped pre- and post-synaptic spikes. A TiO₂ based non-linear drift memristor model designed in Verilog-A implements synaptic behavior and is modified to include experimentally observed effects of state-altering, ionizing, and off-state degradation radiation on the device. The impact of neuron “death” (disabled neuron …

Low-Cost Test And Characterization Platform For Memristors, Lyle Jones

Boise State University Theses and Dissertations

The electrical Testing and Characterization of the devices built under research conditions on silicon wafers, diced wafers, or package parts have hampered research since the beginning of integrated circuits. The challenges of performing electrical characterization on devices are to acquire useful and accurate data, the ease of use of the test platform, the portability of the test equipment, the ability to automate quickly, to allow modifications to the platform, the ability to change the configuration of the Device Under Test (DUT) or the Memristor Based Design (MBD), and to do this within budget. The devices that this research is focused …