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Electronic Devices and Semiconductor Manufacturing Commons™
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Full-Text Articles in Electronic Devices and Semiconductor Manufacturing
Raman Thermometry Of Graphene Based Thermal Materials, Pengcheng Xu
Raman Thermometry Of Graphene Based Thermal Materials, Pengcheng Xu
Electrical Engineering Theses and Dissertations
With the growing demand for high performance computing, we are pushing for higher performance integrated circuits at an ever faster rate. Recent advances in semiconductor production technology sees transistors with a 5 nm process devices being produced for consumer use. This enabled engineers to pack tens of billions of transistors in a package no larger than a fingernail. However, that brings up a problem that we have been long battling against. How can we get rid of the heat produced by these billions of transistors. The current electronic performance is bottle-necked by the ability of the package taking heat away …
Machine Learning Approach To Stability Analysis Of Semiconductor Memory Element, Ravindra Thanniru, Gautam Kapila, Nibhrat Lohia
Machine Learning Approach To Stability Analysis Of Semiconductor Memory Element, Ravindra Thanniru, Gautam Kapila, Nibhrat Lohia
SMU Data Science Review
Memory stability analysis traditionally relied heavily on circuit simulation-based approaches that run Monte Carlo (MC) analysis over various manufacturing and use condition parameters. This paper researches application of Machine Learning approaches for memory element failure analysis which could mimic simulation-like accuracy and minimize the need for engineers to rely heavily on simulators for their validations. Both regressor and classifier algorithms are benchmarked for accuracy and recall scores. A high recall score implies fewer escapes of fails to field and is the metric of choice for comparing algorithm. The paper identifies that recall score in excess of 0.97 can be achieved …