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Articles 211 - 240 of 254

Full-Text Articles in Electrical and Electronics

The Effect Of An Adaptive Optical System's Spatio-Temporal Response On Imaging Performance, Patrick M. Harrington Dec 1992

The Effect Of An Adaptive Optical System's Spatio-Temporal Response On Imaging Performance, Patrick M. Harrington

Theses and Dissertations

Ideally, an adaptive optical control system would have instantaneous temporal response and infinite spatial bandwidth. In real systems, the response time of the adaptive optical control system is limited by the integration time of the wave front sensor, the computational time of the control algorithm, and the actuator response time. Additionally, finite inter actuator spacing limits the deformable mirror's ability to reproduce spatial frequencies having a period less than twice this spacing. Although analyses general enough to account for both the temporal and spatial characteristics of the adaptive optical system exist, they are complex and require detailed information regarding the …


Object Tracking Through Adaptive Correlation, Dennis A. Montera Dec 1992

Object Tracking Through Adaptive Correlation, Dennis A. Montera

Theses and Dissertations

This paper discusses the use of a correlation based system to track, an object through a series of images based on templates derived from previous image frames. The ability to track is extended to sequences which include multiple objects of interest within the field of view. This is accomplishes by comparing the height and shape of the template autocorrelation to the peaks in the correlation of the template with the next scene. The result is to identify the region in the next scene which best matches the designated target. In addition to correlation plane postprocessing, an adaptive window is used …


Interaction Of Profiled Light With Contrapropagating Acoustic Waves: Fourier Transform Approach, Partha P. Banerjee, Chen-Wen Tarn, Jaw-Jueh Liu Oct 1992

Interaction Of Profiled Light With Contrapropagating Acoustic Waves: Fourier Transform Approach, Partha P. Banerjee, Chen-Wen Tarn, Jaw-Jueh Liu

Electrical and Computer Engineering Faculty Publications

A straightforward Fourier-transform approach is employed to investigate acousto-optic interaction between an input optical beam with arbitrary profile and contrapropagating cw sound in the Bragg regime. The process can be analyzed in terms of the simultaneous scattering of light by the two sound waves in the interaction region. Analytic expressions for the equivalent transfer functions are obtained and the scattered light profiles are plotted.


Analysis Of Multifrequency Dispersive Optical Bistability And Switching In Nonlinear Ring Cavities With Large Medium-Response Times, Pawel Pliszka, Partha P. Banerjee Jul 1992

Analysis Of Multifrequency Dispersive Optical Bistability And Switching In Nonlinear Ring Cavities With Large Medium-Response Times, Pawel Pliszka, Partha P. Banerjee

Electrical and Computer Engineering Faculty Publications

Using a simple model of a ring cavity comprising a cubically nonlinear medium, we analyze dispersive optical bistability in the presence of more than one spectral component. We show the phenomenon of so-called competition for resonance. In addition to presenting cavity characteristics for the cases of two and three different frequencies, we also discuss the general method for finding steady-state solutions and checking their stability. A simple and efficient algorithm, based on a relaxation method, is devised to find steady-state solutions satisfying appropriate boundary conditions. The relaxation dynamics is physically related to a finite response time of the medium.


Limaçon Of Pascal Locus Of The Complex Refractive Indices Of Interfaces With Maximally Flat Reflectance-Versus-Angle Curves For Incident Unpolarized Light, R. M.A. Azzam Jun 1992

Limaçon Of Pascal Locus Of The Complex Refractive Indices Of Interfaces With Maximally Flat Reflectance-Versus-Angle Curves For Incident Unpolarized Light, R. M.A. Azzam

Electrical Engineering Faculty Publications

For an interface between two isotropic media the power reflectance Rv (ø) is an even function, Rv (ø) = Rv (--), of the angle of incidence ø; hence all the odd derivatives, Rv(n) = dn Rv /døn (n odd), are identically 0 at ø = 0, independent of the incident polarization v. When the incident light is unpolarized (v = u), the second derivative, Ru(2), is also 0 at ø = 0, so that the flatness of the Ru -versus-ø curve …


Translation Of 'Kamalakanta: A Collection Of Satirical Essays And Reflections', Monish Ranjan Chatterjee Jan 1992

Translation Of 'Kamalakanta: A Collection Of Satirical Essays And Reflections', Monish Ranjan Chatterjee

Electrical and Computer Engineering Faculty Publications

This venture was born initially out of the desire to make those works of Bengali literature which have moved me profoundly, and which I consider first-rate by any yardstick, available to friends and fellow enthusiasts who cannot read the original. In attempting to channel literary and philosophical masterpieces into a different medium, I Have experienced firsthand the formidable challenge that a translator must face because not only of the barrier imposed by the languages involved, but perhaps more so because .of his or her own severely inadequate faculty being called upon to match both the genius and the inspiration of …


Principal Linear Polarization States Of An Optical System, R. M.A. Azzam Jan 1992

Principal Linear Polarization States Of An Optical System, R. M.A. Azzam

Electrical Engineering Faculty Publications

The constraint on the Jones matrix of an optical system such that there exist two linear polarization states at its input that are mapped onto two corresponding linear states at its output is derived. These principal linear polarization (PLP) states, which characterize a broad range of systems, are also found in terms of the Jones matrix elements. Special cases when the PLP states are orthogonal, collapse onto one state, or become infinite in number are indicated. For a deterministic or nondeterministic optical system described by a Mueller matrix, the existence of two PLP states places a constraint on only 3 …


Function Prediction Using Recurrent Neural Networks, Randall L. Lindsey Dec 1991

Function Prediction Using Recurrent Neural Networks, Randall L. Lindsey

Theses and Dissertations

A fully recurrent neural network was applied to the function prediction problem. The real-time recurrent learning (RTRL) algorithm was modified and tested for use as a viable function predictor. The modification gave the algorithm a variable learning rate and a linear/sigmoidal output selection. Verifying the networks ability to temporally learn both the classic exclusive-OR (XOR) problem and the internal state problem, the network was then used to simulate the frequency response of a second order IIR lowpass Butterworth filter. The recurrent network was then applied to two problems: head position tracking, and voice date reconstruction. The accuracy at which the …


An Investigation Of The Application Of Artificial Neural Networks To Adaptive Optics Imaging Systems, Andrew H. Suzuki Dec 1991

An Investigation Of The Application Of Artificial Neural Networks To Adaptive Optics Imaging Systems, Andrew H. Suzuki

Theses and Dissertations

Recurrent and feedforward artificial neural networks are developed as wavefront reconstructors. The recurrent neural network studied is the Hopfield neural network and the feedforward neural network studied is the single layer perceptron artificial neural network. The recurrent artificial neural network input features are the wavefront sensor slope outputs and neighboring actuator feedback commands. The feedforward artificial neural network input features are just the wavefront sensor slope outputs. Both artificial neural networks use their inputs to calculate deformable mirror actuator commands. The effects of training are examined.


Design And Testing Of A Lightweight, Planar Microwave Lens, Paul M. Proudfoot Dec 1991

Design And Testing Of A Lightweight, Planar Microwave Lens, Paul M. Proudfoot

Theses and Dissertations

This thesis documents the design, fabrication, and testing of a lightweight, planar microwave lens. The lens consists of two planar arrays of lightweight printed circuit antennas interconnected by microstrip lines whose length varies as a function of position on the lens. Microwave energy is coupled from one face of the lens to the other by means of a slot etched in the ground plane. At 8.0 GHz the lens is ten wavelengths across, is less than 1/8 inch thick, and weighs less than 4 pounds. The lens can scan a beam over a +/- 30 degree region in both the …


Instrument Matrix Of The Four-Detector Photopolarimeter: Physical Meaning Of Its Rows And Columns And Constraints On Its Elements, R. M.A. Azzam Jan 1990

Instrument Matrix Of The Four-Detector Photopolarimeter: Physical Meaning Of Its Rows And Columns And Constraints On Its Elements, R. M.A. Azzam

Electrical Engineering Faculty Publications

The four-detector photopolarimeter (FDP) is an arrangement of four photodetectors for measuring the state of polarization of light. The output current vector I of the FDP is related to the input Stokes vector S by I = AS, where A is the instrument matrix. The rows of A can be viewed as projection operators that determine the output currents of the detectors. This leads to the recognition of four special totally polarized input states, each of which maximizes the output of one detector. The associated four orthogonal states produce minimum signals. Because each detector is absorptive and its output is …


Accurate Calibration Of The Four-Detector Photopolarimeter With Imperfect Polarizing Optical Elements, R. M.A. Azzam, Ali G. Lopez Oct 1989

Accurate Calibration Of The Four-Detector Photopolarimeter With Imperfect Polarizing Optical Elements, R. M.A. Azzam, Ali G. Lopez

Electrical Engineering Faculty Publications

The first three columns of the instrument matrix A of the four-detector photopolarimeter (FDP) are determined by Fourier analysis of the output current vector I(P) as a function of the azimuth angle P of the incident linearly polarized light. Therefore 12 of the 16 elements of A are measured free of the imperfections of the (absent) quarter-wave retarder (QWR). The effect of angular beam deviation by the polarizer is compensated for by taking the average, (1/2) [I(P) + I(P + 180°)], of the FDP output at 180°-apart, optically equivalent, angular positions of the polarizer. The remaining fourth column of A …


Analytical Determination Of The Complex Dielectric Function Of An Absorbing Medium From Two Angles Of Incidence Of Minimum Parallel Reflectance, R. M.A. Azzam Aug 1989

Analytical Determination Of The Complex Dielectric Function Of An Absorbing Medium From Two Angles Of Incidence Of Minimum Parallel Reflectance, R. M.A. Azzam

Electrical Engineering Faculty Publications

The real and imaginary parts of the complex dielectric function (or complex refractive index) of an opaque substrate or a thick film can be determined from two pseudo-Brewster angles measured in two transparent incidence media of different refractive indices. This two-angle method is simple in that it involves no photometric or polarimetric analysis and in that the solution for the optical properties in terms of the measured angles is explicit, analytical, and direct (i.e. noniterative). The two-angle method is demonstrated for an opaque TiN film on a Cleartran ZnS substrate as a specific example. The effect of angle-of-incidence errors on …


Division-Of-Wave-Front Thin-Film Beam Splitter For Generating Binary Patterns Of Orthogonal Elliptical Polarization States, R. M.A. Azzam Sep 1988

Division-Of-Wave-Front Thin-Film Beam Splitter For Generating Binary Patterns Of Orthogonal Elliptical Polarization States, R. M.A. Azzam

Electrical Engineering Faculty Publications

A division-of-wave-front thin-film beam splitter is described that reflects monochromatic light at oblique incidence with orthogonal elliptical polarization states. It consists of a metallic substrate partially covered with a transparent thin film that inverts the ratio ρ of the complex p and s reflection coefficients at the principal angle of the metal. Any pattern of coated and uncoated areas of the substrate is imprinted upon the reflected wave front as a corresponding two-dimensional spatial binary polarization pattern. A specific design is given that uses a Au substrate at a wavelength of 632.8 nm. The effects of small errors in the …


Thin-Film Devices For Polarized Light- Introduction, R. M.A. Azzam, William H. Southwell Sep 1988

Thin-Film Devices For Polarized Light- Introduction, R. M.A. Azzam, William H. Southwell

Electrical Engineering Faculty Publications

No abstract provided.


Extrema Of The Magnitude And The Phase Of A Complex Function Of A Real Variable: Application To Attenuated Internal Reflection, R. M.A. Azzam Aug 1988

Extrema Of The Magnitude And The Phase Of A Complex Function Of A Real Variable: Application To Attenuated Internal Reflection, R. M.A. Azzam

Electrical Engineering Faculty Publications

Given a complex function F(ω) = |F(ω)|exp[jΔ(ω)] of a real argument ω, the extrema of its magnitude |F(ω)| and its phase Δ(ω), as functions of ω, are determined simultaneously by finding the roots of one common equation, Im[G(ω)] = 0, where G= (F′/F)2 and F′ = ∂F/∂ω. The extrema of |F| and Δ are associated with Re G < 0 and Re G > 0, respectively. This easy-to-prove theorem has a wide range of applications in physical optics. We consider attenuated internal reflection (AIR) as …


General Analysis And Optimization Of The Four-Detector Photopolarimeter, R. M.A. Azzam, I. M. Elminyawi, A. M. El-Saba May 1988

General Analysis And Optimization Of The Four-Detector Photopolarimeter, R. M.A. Azzam, I. M. Elminyawi, A. M. El-Saba

Electrical Engineering Faculty Publications

The four-detector photopolarimeter (FDP) is analyzed for an arbitrary spatial configuration and any reflection characteristics (ri, ψi, Δi) of the first three detectors. The instrument matrix A, which relates the output signal vector I to the input Stokes vector S by I = AS, and its determinant are derived explicitly. The essential condition that A be nonsingular (det A ≠ 0) is satisfied in general with uncoated absorbing detector surfaces, assuming that the plane of incidence (POI) is rotated between successive reflections by other than 90°. Therefore no special coatings on …


Antireflection Of An Absorbing Substrate By An Absorbing Thin Film At Normal Incidence, R. M.A. Azzam, E. Bu-Habib, J. Casset, G. Chassaing, P. Gravier Feb 1987

Antireflection Of An Absorbing Substrate By An Absorbing Thin Film At Normal Incidence, R. M.A. Azzam, E. Bu-Habib, J. Casset, G. Chassaing, P. Gravier

Electrical Engineering Faculty Publications

An absorbing substrate of complex refractive index n2 - jk2 at wavelength λ can be coated by an absorbing thin film of complex refractive index n1 - jk1 and thickness d to achieve zero reflection at normal incidence. For given n2,k2 multiple solutions (n1,k1,d/λ) are found that correspond to infinitely many distinct antireflection layers. This is demonstrated for a Si substrate at two wavelengths (6328 and 4420 Å). The response of these absorbing antireflection layers to changes of the angle of incidence from 0 …


Polarizing Beam Splitters For Infrared And Millimeter Waves Using Single-Layer-Coated Dielectric Slab Or Unbacked Films, R. M.A. Azzam Dec 1986

Polarizing Beam Splitters For Infrared And Millimeter Waves Using Single-Layer-Coated Dielectric Slab Or Unbacked Films, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.


Thin-Film Beam Splitter That Reflects Light As A Half-Wave Retarder And Transmits It Without Change Of Polarization: Application To A Michelson Interferometer, R. M.A. Azzam Nov 1986

Thin-Film Beam Splitter That Reflects Light As A Half-Wave Retarder And Transmits It Without Change Of Polarization: Application To A Michelson Interferometer, R. M.A. Azzam

Electrical Engineering Faculty Publications

The refractive index n1 of a transparent layer of quarter-wave optical thickness coating a transparent substrate of refractive index n2 can be chosen to produce half-wave retardation (HWR) in reflection and no change of polarization in refraction at any angle of incidence ø. The function n1(ø, n2), and the associated polarization-independent reflectance of the film-substrate system R(ø, n2) are determined. Such a coated surface can be used as a beam splitter with excellent characteristics (e.g., split fractions that do not depend on source polarization, a split beam whose polarization is identical …


Relationship Between The P And S Fresnel Reflection Coefficients Of An Interface Independent Of Angle Of Incidence, R. M.A. Azzam Jul 1986

Relationship Between The P And S Fresnel Reflection Coefficients Of An Interface Independent Of Angle Of Incidence, R. M.A. Azzam

Electrical Engineering Faculty Publications

The Fresnel reflection coefficients rp and rs of p- and s-polarized light at the planar interface between two linear isotropic media are found to be interrelated by (rs - rp)/(1 - rsrp) = cos 2β, independent of the angle of incidence ø, where tan2β = ∊ and ∊ is the (generally complex) ratio of dielectric constants of the media of refraction and incidence. This complements another relation (found earlier), (r2s - rp)/(rs - rsrp) = …


Total Refraction At Oblique Incidence By A Transparent Bilayer Coating On A High-Index Transparent Or Absorbing Substrate, R. M.A. Azzam, Karim Javily Dec 1985

Total Refraction At Oblique Incidence By A Transparent Bilayer Coating On A High-Index Transparent Or Absorbing Substrate, R. M.A. Azzam, Karim Javily

Electrical Engineering Faculty Publications

Transparent bilayer coatings that produce total refraction (TR) of obliquely incident monochromatic light into an underlying substrate are considered. When the substrate is transparent, it is shown that TR takes place without any accompanying change of polarization. Totally refracting bilayers are realizable in the IR where high-refractive-index substrates are available. This is illustrated by a BaF2–ZnSe bilayer on a Ge substrate at a 10.6-μm (CO2-laser) wavelength and 45° angle of incidence. Limited changes of the angle of incidence, wavelength, and refractive indices and thicknesses of the two films of the bilayer are introduced, and their effects …


Investigation Of Electronic Holography Using Spice Computer Simulation Experiments, Monish Ranjan Chatterjee Dec 1985

Investigation Of Electronic Holography Using Spice Computer Simulation Experiments, Monish Ranjan Chatterjee

Electrical and Computer Engineering Faculty Publications

Using SPICE experiments, it has been possible to verify most of the important aspects of electronic holography. The generation and properties of dynamic echoes under different types of nonlinearities have been extensively tested, and some new information has been garnered in the process. The case of pulse and generalized memory echoes has also been tested, and the results have been fairly satisfactory. Most of all, the simplicity with which the intriguing concept of memory echoes has translated into the circuit implementation on SPICE, and the closeness of the results to predicted behavior have been somewhat of a pleasant surprise.

Since …


Constraint On The Optical Constants Of A Film-Substrate System For Operation As An External-Reflection Retarder At A Given Angle Of Incidence, R. M.A. Azzam, Bruce E. Perilloux Apr 1985

Constraint On The Optical Constants Of A Film-Substrate System For Operation As An External-Reflection Retarder At A Given Angle Of Incidence, R. M.A. Azzam, Bruce E. Perilloux

Electrical Engineering Faculty Publications

Given a transparent film of refractive index n1 on an absorbing substrate of complex refractive indexn2-jk2, we examine the constraint on n1, n2, and k2 such that the film-substrate system acts as an external-reflection retarder of specified retardance Δ at a specified angle of incidence φ. The constraint, which takes the form ƒ(n1,n2,k2;φ,Δ) = 0, is portrayed graphically by equi-n1 contours in the n2,k2 plane at φ = 45, 70° and for Δ …


Explicit Equations For The Polarizing Angles Of A High-Reflectance Substrate Coated By A Transparent Thin Film, R. M.A. Azzam Mar 1985

Explicit Equations For The Polarizing Angles Of A High-Reflectance Substrate Coated By A Transparent Thin Film, R. M.A. Azzam

Electrical Engineering Faculty Publications

Simple explicit equations are derived that determine the angles of incidence at which the parallel and perpendicular polarization components of light are extinguished on reflection from a transparent film coating a high-reflectance (metallic) substrate. The polarizing angles obtained from our approximate expressions are in excellent agreement with those determined by iterative numerical solution of the exact nonlinear equations that govern such angles. For the approximation to be valid, the intensity reflectance of the film-substrate interface, evaluated at the critical angle of the film-ambient interface, must exceed 0.5.


Antireflecting And Polarizing Transparent Bilayer Coatings On Absorbing Substrates At Oblique Incidence, R. M.A. Azzam, Karim Javily Feb 1985

Antireflecting And Polarizing Transparent Bilayer Coatings On Absorbing Substrates At Oblique Incidence, R. M.A. Azzam, Karim Javily

Electrical Engineering Faculty Publications

The condition of zero reflection of p- and s-polarized light by a transparent bilayer on an absorbing substrate is derived in the form |gν(ø,Ni)| ≤ 1, where gν is a function of the angle of incidence ø, the refractive indices Ni(i = 0,1,2,3) of the system, and the polarization state ν (= p or s). As an application, the air-Si3N4-SiO2-Si system is considered at two laser wavelengths λ = 6328 and 3250 Å. The thicknesses of the two films of the bilayer and the …


Single-Layer Antireflection Coatings On Absorbing Substrates For The Parallel And Perpendicular Polarizations At Oblique Incidence, R. M.A. Azzam Feb 1985

Single-Layer Antireflection Coatings On Absorbing Substrates For The Parallel And Perpendicular Polarizations At Oblique Incidence, R. M.A. Azzam

Electrical Engineering Faculty Publications

Explicit equations are derived that determine the refractive index of a single layer that suppresses the reflection of p- or s-polarized light from the planar interface between a transparent and an absorbing medium at any given angle of incidence. The required layer thickness and the system reflectance for the orthogonal unextinguished polarization also follow explicitly. This generalizes earlier work that was limited to normal incidence or to oblique incidence at dielectric—dielectric interfaces. Specific examples are given of p- and s-antireflection layers on Si and Al substrates at λ = 6328 Å at various angles of incidence.


Extinction Of The P And S Polarizations Of A Wave On Reflection At The Same Angle From A Transparent Film On An Absorbing Substrate: Applications To Parallel-Mirror Crossed Polarizers And A Novel Integrated Polarimeter, R. M.A. Azzam Feb 1985

Extinction Of The P And S Polarizations Of A Wave On Reflection At The Same Angle From A Transparent Film On An Absorbing Substrate: Applications To Parallel-Mirror Crossed Polarizers And A Novel Integrated Polarimeter, R. M.A. Azzam

Electrical Engineering Faculty Publications

The p- and s-polarized components of light can be suppressed on reflection at the same angle of incidence from an absorbing substrate coated by a transparent thin film if the wave is refracted in the film at 45° and the constraint Re[(ε2 - α)/(l -α)]1/2 = α + | ε2 - α| is satisfied, where 2α and ε2 are the ratios of dielectric constants of the film and substrate, respectively, to that of the ambient. For high-reflectance metal substrates (|ε2| » 1), α≈ 1, the ratio of film to ambient refractive index …


Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn Oct 1984

Multiple Determination Of The Optical Constants Of Thin-Film Coating Materials, D. P. Arndt, R. M.A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, T. F. Thonn

Electrical Engineering Faculty Publications

The seven participating laboratories received films of two different thicknesses of Sc2O3 and Rh. All samples of each material were prepared in a single deposition run. Brief descriptions are given of the various methods used for determination of the optical constants of these coating materials. The measurement data are presented, and the results are compared. The mean of the variances of the Sc2O3refractive-index determinations in the 0.40–0.75-nm spectral region was 0.03. The corresponding variances for the refractive index and absorption coefficient of Rh were 0.35 and 0.26, respectively.


Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam Aug 1984

Three-Reflection Halfwave And Quarterwave Retarders Using Dielectric-Coated Metallic Mirrors, T. F. Thonn, R. M.A. Azzam

Electrical Engineering Faculty Publications

A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polarizations is achieved after three reflections from a symmetrical arrangement of three mirrors that maintain collinearity of the input and output beams. Examples are presented of halfwave and quarterwave retarders (HWR and QWR) that use a ZnS-Ag film-substrate system at the CO2-laser wavelength λ = 10.6 µm. The equal net reflectances for the p and s polarizations are computed …