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Reliability

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Articles 121 - 135 of 135

Full-Text Articles in Electrical and Computer Engineering

Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin Jun 2005

Correlation Of Fault-Injection To Proton Accelerator Persistent Cross Section Measurements, Keith S. Morgan, Michael J. Wirthlin

Faculty Publications

Sponsorship: Los Alamos National Laboratory. Field Programmable Gate Arrays (FPGAs) are an attractive solution for space system electronics. Unfortunately, FPGAs are susceptible to radiation-induced single-event upsets (SEU). As such, the FPGA Reliability Studies research group (http://reliability.ee.byu.edu) at Brigham Young University has studied ways to effectively measure the static, dynamic and persistent cross sections of an FPGA desgin; each of which are characterized in some way by how the part reacts to an SEU. One such method is to actually radiate an FPGA and monitor how it reacts to SEUs. A cheaper, more efficient solution is to use fault-injection to emulate …

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Estimating The Dynamic Sensitive Cross Section Of An Fpga Design Through Fault Injection, Darrel E. Johnson Apr 2005

Estimating The Dynamic Sensitive Cross Section Of An Fpga Design Through Fault Injection, Darrel E. Johnson

Theses and Dissertations

A fault injection tool has been created to emulate single event upset (SEU) behavior within the configuration memory of an FPGA. This tool is able to rapidly and accurately determine the dynamic sensitive cross section of the configuration memory for a given FPGA design. This tool enables the reliability of FPGA designs and fault tolerance schemes to be quickly and accurately tested. The validity of testing performed with this fault injection tool has been confirmed through radiation testing. A radiation test was conducted at Crocker Nuclear Laboratory using a proton accelerator in order to determine the actual dynamic sensitive cross …

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Study Of Oxide Breakdown, Hot Carrier And Nbti Effects On Mos Device And Circuit Reliability, Yi Liu Jan 2005

Study Of Oxide Breakdown, Hot Carrier And Nbti Effects On Mos Device And Circuit Reliability, Yi Liu

Electronic Theses and Dissertations

As CMOS device sizes shrink, the channel electric field becomes higher and the hot carrier (HC) effect becomes more significant. When the oxide is scaled down to less than 3 nm, gate oxide breakdown (BD) often takes place. As a result, oxide trapping and interface generation cause long term performance drift and related reliability problems in devices and circuits. The RF front-end circuits include low noise amplifier (LNA), local oscillator (LO) and mixer. It is desirable for a LNA to achieve high gain with low noise figure, a LO to generate low noise signal with sufficient output power, wide tuning …

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Double-Tiered Capacitive Shuttling Method For Balancing Series-Connected Batteries, Andrew Baughman, Mehdi Ferdowsi Jan 2005

Double-Tiered Capacitive Shuttling Method For Balancing Series-Connected Batteries, Andrew Baughman, Mehdi Ferdowsi

Electrical and Computer Engineering Faculty Research & Creative Works

The auto industry is progressing towards hybrid and fully electric vehicles in their future car models. These vehicles need a power plant that is reliable during the lifetime of the car. Battery capacity imbalances stemming from the cell manufacturer, ensuing driving environment, and operational usage affect voltage levels, which must follow adherence to strict limits to ensure the safety of the driver. A variation on an existing method of using a capacitor to shuttle charge from one battery to another to balance series strings of batteries is proposed in this paper. The advancement shown in this paper is to bridge …

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Modeling And Simulation Of Long Term Degradation And Lifetime Of Deep-Submicron Mos Device And Circuit, Zhi Cui Jan 2005

Modeling And Simulation Of Long Term Degradation And Lifetime Of Deep-Submicron Mos Device And Circuit, Zhi Cui

Electronic Theses and Dissertations

Long-term hot-carrier induced degradation of MOS devices has become more severe as the device size continues to scale down to submicron range. In our work, a simple yet effective method has been developed to provide the degradation laws with a better predictability. The method can be easily augmented into any of the existing degradation laws without requiring additional algorithm. With more accurate extrapolation method, we present a direct and accurate approach to modeling empirically the 0.18-ìm MOS reliability, which can predict the MOS lifetime as a function of drain voltage and channel length. With the further study on physical mechanism …

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Evaluating The Repair Of System-On-Chip (Soc) Using Connectivity, Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi Dec 2004

Evaluating The Repair Of System-On-Chip (Soc) Using Connectivity, Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi

Electrical and Computer Engineering Faculty Research & Creative Works

This paper presents a new model for analyzing the repairability of reconfigurable system-on-chip (RSoC) instrumentation with the repair process. It exploits the connectivity of the interconnected cores in which unreliability factors due to both neighboring cores and the interconnect structure are taken into account. Based on the connectivity, two RSoC repair scheduling strategies, Minimum Number of Interconnections First (I-MIN) and Minimum Number of Neighboring Cores First (C-MIN), are proposed. Two other scheduling strategies, Maximum Number of Interconnections First (I-MAX) and Maximum Number of Neighboring cores First (C-MAX), are also introduced and analyzed to further explore the impact of connectivity-based repair …

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Day 2: Thursday, August 5, 2004: Xcel Energy Lookout Dispatch Center, Doug Larson, United States. Department Of Energy Aug 2004

Day 2: Thursday, August 5, 2004: Xcel Energy Lookout Dispatch Center, Doug Larson, United States. Department Of Energy

Energy Field Tour 2004 (August 4-6)

7 pages (includes illustrations and maps).

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Investigation Into The Current Statistical Distribution For Oxide Breakdown Versus The Oxide Thickness Used In Integrated Circuit Manufacture, Eoin James O Driscoll Jun 2004

Investigation Into The Current Statistical Distribution For Oxide Breakdown Versus The Oxide Thickness Used In Integrated Circuit Manufacture, Eoin James O Driscoll

Theses

A critical aspect of integrated circuit manufacturing is the reliability of the components, in particular the gate oxide of transistors and capacitors. Accelerated stress tests are used for reliability predictions of gate oxides. There are two statistical distributions, which can be applied to stress test failure data, namely the Lognormal or the Weibull distributions. The failure data can fit each distribution equally well. However the use of either distribution will give vastly different lifetime predictions and their correct use is crucial for accurate lifetime prediction. A statistical based test, developed with Monte Carlo data, which is designed to decide if …

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Performance Monitoring In Umr's Solar Car, Louis Mccarthy, Josh Pieper, Aaron Rues, Cheng-Hsiao Wu Sep 2000

Performance Monitoring In Umr's Solar Car, Louis Mccarthy, Josh Pieper, Aaron Rues, Cheng-Hsiao Wu

Electrical and Computer Engineering Faculty Research & Creative Works

We describe the instrumentation in UMR's solar car. Accurate knowledge of the operating parameters inside the solar car is shown to be crucial to maintaining high efficiency and reliability. The power trackers keep the solar array operating at its highest efficiency by conditioning the input and maintaining the maximum power point of the solar cells.

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Stadium 501/Reliability Simulator For The Analysis Of Hot-Electron And Esd Induced Degradation In Non-Isothermal Device, Sungkwon Lee, Thomas J. Sanders Sep 1997

Stadium 501/Reliability Simulator For The Analysis Of Hot-Electron And Esd Induced Degradation In Non-Isothermal Device, Sungkwon Lee, Thomas J. Sanders

Electrical Engineering and Computer Science Faculty Publications

This paper addresses the integrated circuit industry needs for non-isothermal simulation in device reliability analysis, initial input factor sensitivity analysis and their software implementation. The key reliability issues are the hot-electron induced oxide damages and electro-static discharge (ESD) damages. The main purpose of this work is to provide a design aid tool to improve device reliability and performance. The reliability simulator developed in this work not only predicts designed device reliability, but also provides some information about the effect of manufacturing variations on reliability. This is accomplished by combining the statistical methodology with existing technology computer aided design (TCAD) tools. …

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A 50 Kilowatt Distributed Grid-Connected Photovoltaic Generation System For The University Of Wyoming, Badrul H. Chowdhury, S. Muknahallipatna, T. Dinwoodie, D. Shugar, J. J. Cupal, J. C. Hamann Jan 1997

A 50 Kilowatt Distributed Grid-Connected Photovoltaic Generation System For The University Of Wyoming, Badrul H. Chowdhury, S. Muknahallipatna, T. Dinwoodie, D. Shugar, J. J. Cupal, J. C. Hamann

Electrical and Computer Engineering Faculty Research & Creative Works

The University of Wyoming (UW) campus (USA) is serving as the site for a 50 kilowatt solar photovoltaic (PV) power system. Three sub-systems were sited and built on the UW campus in 1996. The first sub-system, a 10 kW roof-integrated system of PV roof tiles is located on the roof of the Engineering Building. The second sub-system-a 5 kW rack-mounted, ballasted PV system is on a walkway roof of the Engineering building. The third sub-system is a 35 kW shade structure system and is located adjacent to the parking lot of the University's football stadium. The three sub-systems differ in …

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High Order Orthogonal Tensor Networks: Information Capacity And Reliability, Donald C. Wunsch, Y. M. Mirkes, Alexander N. Gorban Jan 1997

High Order Orthogonal Tensor Networks: Information Capacity And Reliability, Donald C. Wunsch, Y. M. Mirkes, Alexander N. Gorban

Electrical and Computer Engineering Faculty Research & Creative Works

Neural networks based on construction of orthogonal projectors in the tensor power of space of signals are described. A sharp estimate of their ultimate information capacity is obtained. The number of stored prototype patterns (prototypes) can many times exceed the number of neurons. A comparison with the error control codes is made

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Atomic Broadcast In Heterogeneous Distributed Systems, Osman Zeineldine Oct 1995

Atomic Broadcast In Heterogeneous Distributed Systems, Osman Zeineldine

Computer Science Theses & Dissertations

Communication services have long been recognized as possessing a dominant effect on both performance and robustness of distributed systems. Distributed applications rely on a multitude of protocols for the support of these services. Of crucial importance are multicast protocols. Reliable multicast protocols enhance the efficiency and robustness of distributed systems. Numerous reliable multicast protocols have been proposed, each differing in the set of assumptions adopted, especially for the communication network. These assumptions make each protocol suitable for a specific environment. The presence of different distributed applications that run on different LANs and single distributed applications that span different LANs mandate …

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Integrating Electromagnetic Compatibility Laboratory Exercises Into Undergraduate Electromagnetics, James L. Drewniak, Todd H. Hubing, Thomas Van Doren, Fei Sha Aug 1995

Integrating Electromagnetic Compatibility Laboratory Exercises Into Undergraduate Electromagnetics, James L. Drewniak, Todd H. Hubing, Thomas Van Doren, Fei Sha

Electrical and Computer Engineering Faculty Research & Creative Works

A state-of-the art high-frequency laboratory is being developed for pursuing laboratory exercises in EMC. These exercises are being integrated into three undergraduate electromagnetics courses. Two of the courses are a required introductory sequence. The laboratory exercises are designed to stimulate students interest, motivate them to learn concepts, and provide them with exposure to practical EMC applications. Laboratory exercises are also an integral part of an EMC elective course. This paper describes the laboratory development and discusses experiments that can be integrated into these three courses for teaching fundamental electromagnetics as well as EMC.

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Reliability Trend Analyses With Statistical Confidence Limits Using The Luke Reliability Trend Chart, Stephen R. Luke Jan 1993

Reliability Trend Analyses With Statistical Confidence Limits Using The Luke Reliability Trend Chart, Stephen R. Luke

Engineering Management & Systems Engineering Theses & Dissertations

In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy …

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