Electrical and Computer Engineering Commons^™

Electric Field Strength Dependence Of Surface Damage In Oxide Passivated Silicon Planar Transistors, C. A. Goben

Electrical and Computer Engineering Faculty Research & Creative Works

A dependence of surface degradation induced by ionizing radiation in matched oxide-passivated silicon planar epitaxial transistors on junction fringing electric field strength present during exposure is reported. The electric field strength and gamma dose dependence are investigated of the decrease in the forward current gain, hFE (as reflected by the increase in the surface recombination current component), the increase in the surface recombination velocity (as reflected by the increase in the reciprocal of the minority carrier lifetime), and the increase in junction capacitance. Empirical prediction equations have been derived, for matched devices, correlating the normalized base current increase and the …

Nuclear Radiation Enhancement Of Transistor Forward Gain At High Frequencies, C. A. Goben, Y. P. Han

Electrical and Computer Engineering Faculty Research & Creative Works

This investigation has characterized the effects of fast neutron bombardment on a typical n-p-n transistor (2N914) of a common emitter amplifier operating at high-frequencies (>100 MHz) by means of s-parameter measurements from 120 MHz to 350 MHz, inclusive, every 10 MHz. The changes in the four (4) s-parameters and the trends and consequences of neutron bombardment are examined pictorially on graphs. The general effect of fast neutron bombardment is to decrease the magnitude of each s-parameter for frequencies below z. fT (where z = (O/1013)0.1). However, if the device is operating above z fT, the magnitudes of s11 (input …

Neutron Dependence Of Neutral Base Region Recombination, J. Bereisa, C. A. Goben

Electrical and Computer Engineering Faculty Research & Creative Works

A discrete, deterministic mathematical model has been developed for the bulk base region of graded base devices that accounts for both the effects of neutron-induced recombination and built-in electric field in the base region at low, intermediate, and moderate current/injection levels. Exact expressions are developed for the bulk base recombination current and the collector current as functions of neutron fluence. Exact expressions are derived for the base recombination term and the relative rates of neutron-induced base current increase and collector current decrease. These expressions involve exponential and hyperbolic functions and are well suited for numerical computations and theoretical analysis. Damage …

Baseband Agc In An Am-Fm Telemetry System, Richard S. Simpson, William H. Tranter

Electrical and Computer Engineering Faculty Research & Creative Works

The use of AGc loops at the input and output of the FM link in an AM-FM telemetry system allows the mean-square transmitter deviation to be maintained near maximum value, even though data may be nonstationary. However, errors result because of the inability of the receiver AGc loop to track perfectly gain variations in the transmitter loop. In this paper the general characteristics of AGc are discussed, and a theoretical analysis is performed to determine the time constant, steady-state error, and tracking error for a first-order loop. Also, tracking error for first order and second-order loops is investigated by simulation. …

Time-Domain Analysis And Measurement Techniques For Distributed Rc Structures. Ii. Impulse Measurement Techniques, Robert C. Peirson, Edward C. Bertnolli

Electrical and Computer Engineering Faculty Research & Creative Works

Transient analysis for uniform RC structures is considered in this paper. A method is presented for determining the parameters of such structures. The measurements are obtained using impulse excitations in open-circuit and short-circuit configurations. The theoretical results obtained predict fairly the experimental results. © 1969 The American Institute of Physics.

Detection Of Slowly Fading Targets With Frequency Agility, Kenneth L. Horn, Norval D. Wallace

Electrical and Computer Engineering Faculty Research & Creative Works

Detection probabilities for a noncoherent pulsed radar are presented as a function of maximum possible pulse-to-pulse frequency change (transmitter bandwidth) and target depth for frequency agility applied to Swerling's case I target. The transmitted frequency is a uniformly distributed random variable. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.

Generation Of Design Equations In Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey, Robert J. Smith

Electrical and Computer Engineering Faculty Research & Creative Works

One step in the synthesis procedure for realizing an asynchronous sequential switching circuit is the generation of next-state and output state equations from a simplified and coded flow table description of the circuit. The usual approach for determining these equations is to first construct a state table from the coded flow table, and then construct transition and output tables. For large flow tables this can be quite a lengthy procedure. This note describes an algorithm which simplifies the synthesis procedure for normal fundamental-mode circuits by permitting the determination of these equations without explicit construction of the state table, transition table, …

Transients Analysis Of Distributed Systems, T. N. Trick, Jack J. Bourquin

Electrical and Computer Engineering Faculty Research & Creative Works

An isomorphic relation exists between the transient response of systems whose transfer functions are of the form H(s)=B and the transient response of systems whose transfer functions are of the form [formula omitted]. Several interesting conclusions are drawn from this relationship concerning the transient response of distributed systems. Copyright © 1969 by The Insitute of Electrical and Electronics Engineers Inc.

Numerical Calculation Of Distributed-Network Transfer Matrices, Robert C. Peirson, Edward C. Bertnolli

Electrical and Computer Engineering Faculty Research & Creative Works

No abstract provided.

Direct Measurement Of Dynamic Capacitance, Norman G. Dillman

Electrical and Computer Engineering Faculty Research & Creative Works

No abstract provided.

Automation In The Design Of Asynchronous Sequential Circuits, Richard T. Smith, James H. Tracey, W. L. Schoeffel, G. K. Maki

Electrical and Computer Engineering Faculty Research & Creative Works

Sequential switching circuits are commonly classified as being either synchronous or asynchronous. Clock pulses synchronize the operations of the synchronous circuit. The operation of an asynchronous circuit is usually assumed to be independent of such clocks. The operating speed of an asynchronous circuit is thus limited only by basic device speed. One disadvantage of asynchronous circuit design has been the complexity of the synthesis procedures for large circuits.

A Direct Method Of Measuring Stray Load Loss In Dc Machines, Kanaiyalal R. Shah, George Mcpherson

Electrical and Computer Engineering Faculty Research & Creative Works

Stray load loss in dc machines is denned as the difference between the actual loss under load and the well-recognized loss. This paper describes a simple, reliable, and direct method of measuring this loss by means of a proposed short-circuit test with a correction factor for uncompensated-type dc machines. It also describes the sources and components of stray load losses as they occur under short-circuit test. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.

A Novel Method For Solving The Uniform Distributed Network Analysis Problem, Robert C. Peirson, Edward C. Bertnolli

Electrical and Computer Engineering Faculty Research & Creative Works

An application of the Laplace transform method of Ogata to the solution of the uniform distributed network analysis problem is described. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.

A Simple Design Algorithm For Synthesis Of Multilevel Combinational Networks, James H. Tracey

Electrical and Computer Engineering Faculty Research & Creative Works

An algorithm is presented for the synthesis of combinational networks with a constrained arrangement of ANDS, ORS, NANDS, NORS, and inverters. The algorithm is easily presented to students in an introductory logic design course and has considerable application in modern practical logic design. Many texts available for a first course in logic design give very limited practical guidance for synthesis of networks under constraints outlined here. It is suggested that the algorithm presented here be furnished as supplementary material in the introductory course. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.

Recombination Statistics For Neutron Bombarded Silicon Transistors, M. C. Chow, J. L. Azarewiczt, C. A. Goben

Electrical and Computer Engineering Faculty Research & Creative Works

This paper presents a recombination statistical model for the neutron-induced base current component reported previously. The derivation was based on the following: 1) the current equation for the induced current component developed previously; 2) the Shockley-Read-Hall statistics for holes and electrons; and 3) the recombination statistics derived by Sah, Noyce and Shockley for sites in the bulk space-charge region. The recombination statistics model depends on the diffusion potential, the junction voltage, the activation energy, temperature, and the ratio of capture cross-sections for holes and electrons. The utility of such a recombination statistical model is illustrated by using measured parameters to …

Radiation And Annealing Characteristics Of Neutron Bombarded Silicon Transistors, L. S. Su, G. E. Gassner, C. A. Goben

Electrical and Computer Engineering Faculty Research & Creative Works

Operating a silicon planar epitaxial transistor in the inverse configuration allows one to demonstrate clearly the importance of the neutron-induced base current component and its degradation of the emitter efficiency, and, because of the much larger depletion layer, to compute a volume dependent damage constant applicable to all silicon p-n junctions. The importance of minimizing the absolute change versus relative change in radiation hardening studies is clearly illustrated. Surface effects were found to be significant for transistors mounted in gas-filled cans. The diffusion potential was predicted, on theoretical grounds, to vary with neutron fluence, and the theory was experimentally confirmed. …

Design Of Truncated Sequential Tests For Rapidly Fading Radar Targets, Norval D. Wallace

Electrical and Computer Engineering Faculty Research & Creative Works

Curves and equations are presented from which the exact performance of truncated sequential tests can be determined for one important case: the biased square-law detector for the detection of rapidly fading targets. The method of generating functions is used to derive probability distributions for sample size. It is shown how these probability distributions can be used to determine truncation errors and the effects of multiple-resolution elements. Sample calculations are performed to determine the effects of a particular truncation procedure. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.

Electric Field Investigations And A Model For Electrical Liquid Spraying, Wallace E. Deshon, Ralph S. Carson

Electrical and Computer Engineering Faculty Research & Creative Works

The equation generally used for determining the electric field at the liquid tip in electrical spraying of liquids was originally derived for determining the electric field around a metal tip in the extraction of electrons from metals. In the present paper experimental data were taken at the instant of spraying to determine the validity of using this equation for liquid tips. the results indicate that the value of electric field given by this equation needs to be increased by about 20% in the normal range of operation. A model for the spraying mechanism of the liquid is also presented. © …

Neutron Radiation Damage In Silicon Transistors, C. A. Goben, F. M. Smits, J. L. Wirth

Electrical and Computer Engineering Faculty Research & Creative Works

In the investigation of base and collector current as a function of the emitter-to-base voltage, previous studies have shown that neutron-induced base current has components originating in the emitter space charge region as well as the neutral base region. This study shows that while the low injection level neutron-induced base current is dominated by the space charge component, the high injection behavior appears to be controlled by recombination in the neutral base region. Additional experiments performed in special tetrode transistors and van der Pauw-type samples indicate that changes in collector current are dominated by recombination in the neutral base, while …

Alternating Current Method Of Measuring The Electrical Conductivity Of Dielectric Liquids, Henry E. Fischer, Ralph S. Carson

Electrical and Computer Engineering Faculty Research & Creative Works

No abstract provided.

Analysis Of The N-Wire Exponential Line, Edward C. Bertnolli

Electrical and Computer Engineering Faculty Research & Creative Works

A new approach to distributed network analysis is presented with the analysis of the n-wire exponential line as example. This approach provides the distributed network's transfer matrix in a form useful for both transient and steady-state network calculations. © 1967, IEEE. All rights reserved.

Annealing Characteristics Of Neutron Irradiated Silicon Transistors, J. R. Chott, C. A. Goben

Electrical and Computer Engineering Faculty Research & Creative Works

When a transistor is subjected to neutron irradiation, a component of base current proportional to neutron fluence is induced. From the effects of annealing on the base and collector Currents the conclusion was drawn that there is an apparent difference in the annealing characteristics between the neutral and the space-charge regions of the semiconductor device. This study of the anomalous annealing indicates that the neutron-induced component of base current is a result of one, or a combination, of the following mechanisms: A quasi-tunneling recombination phenomena in the emitter-base space-charge region, or an influence of the p-n junction electric field on …

Reviews Of Books And Papers In The Computer Field, James H. Tracey

Electrical and Computer Engineering Faculty Research & Creative Works

No abstract provided.

Correction To “Analysis Of The N-Wire Exponential Line”, Edward C. Bertnolli

Electrical and Computer Engineering Faculty Research & Creative Works

No abstract provided.

An Analytic Model For The Fluxgate Magnetometer, Stanley V. Marshall

Electrical and Computer Engineering Faculty Research & Creative Works

The output voltages from various fluxgate probe types are found to have the same general form, and an analytic model has been developed with which the output may be calculated. In the saturation region where the output pulse is developed, the differential permeability can be closely approximated by an exponential, dB/dH = k₁H^_k2, where k^_l and k^₂ are on the order of 100 and -2.0, respectively, for cores of Supermalloy or Permalloy 80. Using this model, the effect of the nature of the excitation function on output pulse amplitude and width and the effect …

Analysis Of Conductor Vibration, Robert H. Nau

Electrical and Computer Engineering Faculty Research & Creative Works

Considerable attention has been given to conductor vibration of suspended transmission lines during the past 25 years. Even so, the engineers of the public utilities feel that they have only started to get a solution to the vibration problems. Extensive research programs are being conducted at the present time by manufacturers of conductor cable and ground wires and by numerous public utilities themselves.

Aeolian vibrations are the chief concern because they occur whenever a steady wind, of from one mile per hour to hurricane velocity, blows across the suspended line. Thus, millions of flexures, however small or large in amplitude, …