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Articles 3481 - 3510 of 3516
Full-Text Articles in Engineering
Empirical Bayesian Learning, David R. Cunningham, Arthur M. Breipohl
Empirical Bayesian Learning, David R. Cunningham, Arthur M. Breipohl
Electrical and Computer Engineering Faculty Research & Creative Works
It is shown that a certain weighted average of the prior distribution and the empirical distribution yields an estimate of the posterior distribution that is consistent with Bayes' theorem. Acomparison of this approach and conventional parametric Bayesian estimation is made for some specific cases. Copyright © 1971 by The Institute of Electrical and Electronics Engineers, Inc.
Deriving Dc Machine Torque By The Principle Of Virtual Work, George Mcpherson
Deriving Dc Machine Torque By The Principle Of Virtual Work, George Mcpherson
Electrical and Computer Engineering Faculty Research & Creative Works
The purpose of this paper is to fill a gap which exists in the "textbook" theory of dc machines. The paper shows that the usual expression for dc machine torque can be obtained from the direct application of the principle of virtual work to the machine, making the traditional assumptions. The method provides additional benefits in that it demonstrates the reluctance torque which results from the saliency of the field structure and shows that compensating windings have no effect on the torque under the assumed linear conditions. Copyright © 1971 by The Institute of Electrical and Electronics Engineers, Inc.
Maximum-Distance Linear Codes, Gary K. Maki, James H. Tracey
Maximum-Distance Linear Codes, Gary K. Maki, James H. Tracey
Electrical and Computer Engineering Faculty Research & Creative Works
Described here is a linear code that has a maximum distance between codewords of k for a code of order 2k. Since the minimum-maximum distance is k for a code of order 2k, a class of minimum-maximum distance codes results. For an (n,k) linear code, k ≤ n ≤ k + k∣2 for k even and k ≤ n ≤ k + (k - 1)/2 for k odd. Maximum-distance codes are found useful in encoding the states of sequential circuits. © 1971, IEEE. All rights reserved.
A State Assignment Procedure For Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey
A State Assignment Procedure For Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey
Electrical and Computer Engineering Faculty Research & Creative Works
This paper presents a new procedure for constructing nonuniversal shared-row internal state assignments for asynchronous sequential circuits. The method consists basically of establishing an initial code with the minimum number of variables required to dis. © 1971, IEEE. All rights reserved.
A Gamma-Level Portable Ring-Core Magnetometer, Stanley V. Marshall
A Gamma-Level Portable Ring-Core Magnetometer, Stanley V. Marshall
Electrical and Computer Engineering Faculty Research & Creative Works
A four-transistor circuit is described for a battery-operated magnetometer that has 0.1 γ resolution using t-in diameter 4–79 or 6–81 Mo-Permalloy tape cores of 20–40 Mx capacity. The center-tapped drive winding also serves as the sense winding, simplifying the sensor assembly. Some signal-to-noise results are presented to illustrate the fairly wide difference that may exist between cores of the same cross section and to demonstrate the advantage of reducing core area. Copyright © 1971 by The Institute of Electrical and Electronics Engineers, Inc.
The Effect Of Channel Errors In The Differential Pulse-Code-Modulation Transmission Of Sampled Imagery, Roger J. Arguello, Harvey R. Sellner, John A. Stuller
The Effect Of Channel Errors In The Differential Pulse-Code-Modulation Transmission Of Sampled Imagery, Roger J. Arguello, Harvey R. Sellner, John A. Stuller
Electrical and Computer Engineering Faculty Research & Creative Works
This Paper Presents an Analysis, Simulation, and Discussion of the Effects of Communication Errors on Four-Bit Differential Pulse-Code Modulation (DPCM) Sampled Imagery. Simulations Are Presented that Describe the Effects of Inserting Periodic "PCM Updates" in Order to Correct Communication Errors in the DPCM Transmission of Photographic Scenes that Have Been Scanned and Sampled at the Nyquist Rate. Copyright © 1971 by the Institute of Electrical and Electronics Engineers, Inc.
A Simplification Heuristic For Large Flow Tables, R. J. Smith, James H. Tracey
A Simplification Heuristic For Large Flow Tables, R. J. Smith, James H. Tracey
Electrical and Computer Engineering Faculty Research & Creative Works
Flow tables specifying large asynchronous sequential circuits often contain more internal states than are required to specify desired circuit behavior. Known minimization techniques appear unsuited for reduction of such large (rows X columns > 250) flow tables, because of excessive computation and intermediate data requirements for problems of this size. The algorithm described here is intended to rapidly produce a simplified-but in general non-minimal-flow table. It is most economical when applied to extremely large tables and was devised primarily for automated design applications. The procedure has been programmed in PL/1 and has been incorporated into an asynchronous sequential circuit design automation …
State Assignment Selection In Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey
State Assignment Selection In Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey
Electrical and Computer Engineering Faculty Research & Creative Works
Methods already exist for the construction of critical race-free assignments for asynchronous sequential circuits. Some of these methods permit the construction of many assignments for the same flow table. The algorithm presented here consists of two easy to apply tests which select that critical race-free assignment most likely to produce a set of simple next-state equations. The algorithm has been programmed. Copyright © 1970 by The Institute of Electrical and Electronics Engineers, Inc.
Etch Patterns On Zone-Refined Fe, M. E. Straumonis, Chang-Soo Kim
Etch Patterns On Zone-Refined Fe, M. E. Straumonis, Chang-Soo Kim
Electrical and Computer Engineering Faculty Research & Creative Works
Upon dissolution of zone-refined Fe in strong acids, mainly three kinds of corrosion patterns were observed in the crystallites of the sections. Regardless of the acids, the {110} plane always appeared on the three patterns in the form of smooth and even steps, ledges, or facets. The {112}, {122}, and {123} planes were also developed but to a much lesser degree. The {100} and {111} planes were not observed because grains of the respective orientation were missing on the sections. Attempts were made to explain the formation of the planes by taking into consideration the reticular density of the planes …
Excitation Requirement For Rectified Output Ac Generators, Richard Thomas Smith
Excitation Requirement For Rectified Output Ac Generators, Richard Thomas Smith
Electrical and Computer Engineering Faculty Research & Creative Works
This paper develops a method for calculating the required dc field current of a three-phase synchronous ac generator for known dc load conditions and machine characteristics. The method is simple to apply and has shown good agreement with test data. The method is of utility for preliminary design and analysis of rectified output alternators, such as may be used in excitation systems of the largest ac generators, space vehicle power applications, or high-power industrial rectification. Copyright © 1971 by The Institute of Electrical and Electronics Engineers, Inc.
Electric Field Strength Dependence Of Surface Damage In Oxide Passivated Silicon Planar Transistors, C. A. Goben
Electric Field Strength Dependence Of Surface Damage In Oxide Passivated Silicon Planar Transistors, C. A. Goben
Electrical and Computer Engineering Faculty Research & Creative Works
A dependence of surface degradation induced by ionizing radiation in matched oxide-passivated silicon planar epitaxial transistors on junction fringing electric field strength present during exposure is reported. The electric field strength and gamma dose dependence are investigated of the decrease in the forward current gain, hFE (as reflected by the increase in the surface recombination current component), the increase in the surface recombination velocity (as reflected by the increase in the reciprocal of the minority carrier lifetime), and the increase in junction capacitance. Empirical prediction equations have been derived, for matched devices, correlating the normalized base current increase and the …
Nuclear Radiation Enhancement Of Transistor Forward Gain At High Frequencies, C. A. Goben, Y. P. Han
Nuclear Radiation Enhancement Of Transistor Forward Gain At High Frequencies, C. A. Goben, Y. P. Han
Electrical and Computer Engineering Faculty Research & Creative Works
This investigation has characterized the effects of fast neutron bombardment on a typical n-p-n transistor (2N914) of a common emitter amplifier operating at high-frequencies (>100 MHz) by means of s-parameter measurements from 120 MHz to 350 MHz, inclusive, every 10 MHz. The changes in the four (4) s-parameters and the trends and consequences of neutron bombardment are examined pictorially on graphs. The general effect of fast neutron bombardment is to decrease the magnitude of each s-parameter for frequencies below z. fT (where z = (O/1013)0.1). However, if the device is operating above z fT, the magnitudes of s11 (input …
Neutron Dependence Of Neutral Base Region Recombination, J. Bereisa, C. A. Goben
Neutron Dependence Of Neutral Base Region Recombination, J. Bereisa, C. A. Goben
Electrical and Computer Engineering Faculty Research & Creative Works
A discrete, deterministic mathematical model has been developed for the bulk base region of graded base devices that accounts for both the effects of neutron-induced recombination and built-in electric field in the base region at low, intermediate, and moderate current/injection levels. Exact expressions are developed for the bulk base recombination current and the collector current as functions of neutron fluence. Exact expressions are derived for the base recombination term and the relative rates of neutron-induced base current increase and collector current decrease. These expressions involve exponential and hyperbolic functions and are well suited for numerical computations and theoretical analysis. Damage …
Baseband Agc In An Am-Fm Telemetry System, Richard S. Simpson, William H. Tranter
Baseband Agc In An Am-Fm Telemetry System, Richard S. Simpson, William H. Tranter
Electrical and Computer Engineering Faculty Research & Creative Works
The use of AGc loops at the input and output of the FM link in an AM-FM telemetry system allows the mean-square transmitter deviation to be maintained near maximum value, even though data may be nonstationary. However, errors result because of the inability of the receiver AGc loop to track perfectly gain variations in the transmitter loop. In this paper the general characteristics of AGc are discussed, and a theoretical analysis is performed to determine the time constant, steady-state error, and tracking error for a first-order loop. Also, tracking error for first order and second-order loops is investigated by simulation. …
Time-Domain Analysis And Measurement Techniques For Distributed Rc Structures. Ii. Impulse Measurement Techniques, Robert C. Peirson, Edward C. Bertnolli
Time-Domain Analysis And Measurement Techniques For Distributed Rc Structures. Ii. Impulse Measurement Techniques, Robert C. Peirson, Edward C. Bertnolli
Electrical and Computer Engineering Faculty Research & Creative Works
Transient analysis for uniform RC structures is considered in this paper. A method is presented for determining the parameters of such structures. The measurements are obtained using impulse excitations in open-circuit and short-circuit configurations. The theoretical results obtained predict fairly the experimental results. © 1969 The American Institute of Physics.
Detection Of Slowly Fading Targets With Frequency Agility, Kenneth L. Horn, Norval D. Wallace
Detection Of Slowly Fading Targets With Frequency Agility, Kenneth L. Horn, Norval D. Wallace
Electrical and Computer Engineering Faculty Research & Creative Works
Detection probabilities for a noncoherent pulsed radar are presented as a function of maximum possible pulse-to-pulse frequency change (transmitter bandwidth) and target depth for frequency agility applied to Swerling's case I target. The transmitted frequency is a uniformly distributed random variable. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
Generation Of Design Equations In Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey, Robert J. Smith
Generation Of Design Equations In Asynchronous Sequential Circuits, Gary K. Maki, James H. Tracey, Robert J. Smith
Electrical and Computer Engineering Faculty Research & Creative Works
One step in the synthesis procedure for realizing an asynchronous sequential switching circuit is the generation of next-state and output state equations from a simplified and coded flow table description of the circuit. The usual approach for determining these equations is to first construct a state table from the coded flow table, and then construct transition and output tables. For large flow tables this can be quite a lengthy procedure. This note describes an algorithm which simplifies the synthesis procedure for normal fundamental-mode circuits by permitting the determination of these equations without explicit construction of the state table, transition table, …
Transients Analysis Of Distributed Systems, T. N. Trick, Jack J. Bourquin
Transients Analysis Of Distributed Systems, T. N. Trick, Jack J. Bourquin
Electrical and Computer Engineering Faculty Research & Creative Works
An isomorphic relation exists between the transient response of systems whose transfer functions are of the form H(s)=B and the transient response of systems whose transfer functions are of the form [formula omitted]. Several interesting conclusions are drawn from this relationship concerning the transient response of distributed systems. Copyright © 1969 by The Insitute of Electrical and Electronics Engineers Inc.
Numerical Calculation Of Distributed-Network Transfer Matrices, Robert C. Peirson, Edward C. Bertnolli
Numerical Calculation Of Distributed-Network Transfer Matrices, Robert C. Peirson, Edward C. Bertnolli
Electrical and Computer Engineering Faculty Research & Creative Works
No abstract provided.
Direct Measurement Of Dynamic Capacitance, Norman G. Dillman
Direct Measurement Of Dynamic Capacitance, Norman G. Dillman
Electrical and Computer Engineering Faculty Research & Creative Works
No abstract provided.
Automation In The Design Of Asynchronous Sequential Circuits, Richard T. Smith, James H. Tracey, W. L. Schoeffel, G. K. Maki
Automation In The Design Of Asynchronous Sequential Circuits, Richard T. Smith, James H. Tracey, W. L. Schoeffel, G. K. Maki
Electrical and Computer Engineering Faculty Research & Creative Works
Sequential switching circuits are commonly classified as being either synchronous or asynchronous. Clock pulses synchronize the operations of the synchronous circuit. The operation of an asynchronous circuit is usually assumed to be independent of such clocks. The operating speed of an asynchronous circuit is thus limited only by basic device speed. One disadvantage of asynchronous circuit design has been the complexity of the synthesis procedures for large circuits.
A Direct Method Of Measuring Stray Load Loss In Dc Machines, Kanaiyalal R. Shah, George Mcpherson
A Direct Method Of Measuring Stray Load Loss In Dc Machines, Kanaiyalal R. Shah, George Mcpherson
Electrical and Computer Engineering Faculty Research & Creative Works
Stray load loss in dc machines is denned as the difference between the actual loss under load and the well-recognized loss. This paper describes a simple, reliable, and direct method of measuring this loss by means of a proposed short-circuit test with a correction factor for uncompensated-type dc machines. It also describes the sources and components of stray load losses as they occur under short-circuit test. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
A Novel Method For Solving The Uniform Distributed Network Analysis Problem, Robert C. Peirson, Edward C. Bertnolli
A Novel Method For Solving The Uniform Distributed Network Analysis Problem, Robert C. Peirson, Edward C. Bertnolli
Electrical and Computer Engineering Faculty Research & Creative Works
An application of the Laplace transform method of Ogata to the solution of the uniform distributed network analysis problem is described. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
A Simple Design Algorithm For Synthesis Of Multilevel Combinational Networks, James H. Tracey
A Simple Design Algorithm For Synthesis Of Multilevel Combinational Networks, James H. Tracey
Electrical and Computer Engineering Faculty Research & Creative Works
An algorithm is presented for the synthesis of combinational networks with a constrained arrangement of ANDS, ORS, NANDS, NORS, and inverters. The algorithm is easily presented to students in an introductory logic design course and has considerable application in modern practical logic design. Many texts available for a first course in logic design give very limited practical guidance for synthesis of networks under constraints outlined here. It is suggested that the algorithm presented here be furnished as supplementary material in the introductory course. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
Recombination Statistics For Neutron Bombarded Silicon Transistors, M. C. Chow, J. L. Azarewiczt, C. A. Goben
Recombination Statistics For Neutron Bombarded Silicon Transistors, M. C. Chow, J. L. Azarewiczt, C. A. Goben
Electrical and Computer Engineering Faculty Research & Creative Works
This paper presents a recombination statistical model for the neutron-induced base current component reported previously. The derivation was based on the following: 1) the current equation for the induced current component developed previously; 2) the Shockley-Read-Hall statistics for holes and electrons; and 3) the recombination statistics derived by Sah, Noyce and Shockley for sites in the bulk space-charge region. The recombination statistics model depends on the diffusion potential, the junction voltage, the activation energy, temperature, and the ratio of capture cross-sections for holes and electrons. The utility of such a recombination statistical model is illustrated by using measured parameters to …
Radiation And Annealing Characteristics Of Neutron Bombarded Silicon Transistors, L. S. Su, G. E. Gassner, C. A. Goben
Radiation And Annealing Characteristics Of Neutron Bombarded Silicon Transistors, L. S. Su, G. E. Gassner, C. A. Goben
Electrical and Computer Engineering Faculty Research & Creative Works
Operating a silicon planar epitaxial transistor in the inverse configuration allows one to demonstrate clearly the importance of the neutron-induced base current component and its degradation of the emitter efficiency, and, because of the much larger depletion layer, to compute a volume dependent damage constant applicable to all silicon p-n junctions. The importance of minimizing the absolute change versus relative change in radiation hardening studies is clearly illustrated. Surface effects were found to be significant for transistors mounted in gas-filled cans. The diffusion potential was predicted, on theoretical grounds, to vary with neutron fluence, and the theory was experimentally confirmed. …
Design Of Truncated Sequential Tests For Rapidly Fading Radar Targets, Norval D. Wallace
Design Of Truncated Sequential Tests For Rapidly Fading Radar Targets, Norval D. Wallace
Electrical and Computer Engineering Faculty Research & Creative Works
Curves and equations are presented from which the exact performance of truncated sequential tests can be determined for one important case: the biased square-law detector for the detection of rapidly fading targets. The method of generating functions is used to derive probability distributions for sample size. It is shown how these probability distributions can be used to determine truncation errors and the effects of multiple-resolution elements. Sample calculations are performed to determine the effects of a particular truncation procedure. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
Electric Field Investigations And A Model For Electrical Liquid Spraying, Wallace E. Deshon, Ralph S. Carson
Electric Field Investigations And A Model For Electrical Liquid Spraying, Wallace E. Deshon, Ralph S. Carson
Electrical and Computer Engineering Faculty Research & Creative Works
The equation generally used for determining the electric field at the liquid tip in electrical spraying of liquids was originally derived for determining the electric field around a metal tip in the extraction of electrons from metals. In the present paper experimental data were taken at the instant of spraying to determine the validity of using this equation for liquid tips. the results indicate that the value of electric field given by this equation needs to be increased by about 20% in the normal range of operation. A model for the spraying mechanism of the liquid is also presented. © …
Neutron Radiation Damage In Silicon Transistors, C. A. Goben, F. M. Smits, J. L. Wirth
Neutron Radiation Damage In Silicon Transistors, C. A. Goben, F. M. Smits, J. L. Wirth
Electrical and Computer Engineering Faculty Research & Creative Works
In the investigation of base and collector current as a function of the emitter-to-base voltage, previous studies have shown that neutron-induced base current has components originating in the emitter space charge region as well as the neutral base region. This study shows that while the low injection level neutron-induced base current is dominated by the space charge component, the high injection behavior appears to be controlled by recombination in the neutral base region. Additional experiments performed in special tetrode transistors and van der Pauw-type samples indicate that changes in collector current are dominated by recombination in the neutral base, while …
Alternating Current Method Of Measuring The Electrical Conductivity Of Dielectric Liquids, Henry E. Fischer, Ralph S. Carson
Alternating Current Method Of Measuring The Electrical Conductivity Of Dielectric Liquids, Henry E. Fischer, Ralph S. Carson
Electrical and Computer Engineering Faculty Research & Creative Works
No abstract provided.