Applied Statistics Commons^™

Stress-Lifetime Joint Distribution Model For Performance Degradation Failure, Quan Sun, Yanzhen Tang, Jing Feng, Paul Kvam

Department of Math & Statistics Faculty Publications

The high energy density self-healing metallized film pulse capacitor has been applied to all kinds of laser facilities for their power conditioning systems under several stress levels, such as 23kV, 30kV and 35kV, whose reliability performance and maintenance costs are affected by the reliability of capacitors. Due to the costs and time restriction, how to assess the reliability of highly reliable capacitors under a certain stress level as soon as possible becomes a challenge. Accelerated degradation test provides a way to predict its lifetime and reliability effectively. A model called stress-lifetime joint distribution model and an analysis method based on …