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Full-Text Articles in Applied Statistics
Statistical Models For Hot Electron Degradation In Nano-Scaled Mosfet Devices, Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam
Statistical Models For Hot Electron Degradation In Nano-Scaled Mosfet Devices, Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam
Department of Math & Statistics Faculty Publications
In a MOS structure, the generation of hot carrier interface states is a critical feature of the item's reliability. On the nano-scale, there are problems with degradation in transconductance, shift in threshold voltage, and decrease in drain current capability. Quantum mechanics has been used to relate this decrease to degradation, and device failure. Although the lifetime, and degradation of a device are typically used to characterize its reliability, in this paper we model the distribution of hot-electron activation energies, which has appeal because it exhibits a two-point discrete mixture of logistic distributions. The logistic mixture presents computational problems that are …
Bayes Estimation Of A Distribution Function Using Ranked Set Samples, Paul H. Kvam, Ram C. Tiwari
Bayes Estimation Of A Distribution Function Using Ranked Set Samples, Paul H. Kvam, Ram C. Tiwari
Department of Math & Statistics Faculty Publications
Aranked set sample (RSS), if not balanced, is simply a sample of independent order statistics generated from the same underlying distribution F. Kvam and Samaniego (1994) derived maximum likelihood estimates of F for a general RSS. In many applications, including some in the environmental sciences, prior information about F is available to supplement the data-based inference. In such cases, Bayes estimators should be considered for improved estimation. Bayes estimation (using the squared error loss function) of the unknown distribution function F is investigated with such samples. Additionally, the Bayes generalized maximum likelihood estimator (GMLE) is derived. An iterative scheme based …