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Extended-Range Oscillations And The First Sharp Diffraction Peak In Amorphous Silicon: A Systematic Study, Devilal Dahal
Extended-Range Oscillations And The First Sharp Diffraction Peak In Amorphous Silicon: A Systematic Study, Devilal Dahal
Master's Theses
The first sharp diffraction peak (FSDP), which characterizes the static structure factor of many glassy systems near the wave vector region of 1-2 Å-1 has been observed depending on the temperature, pressure and the degree of annealing of the system. The presence of the FSDP is indicative of the intermediate range order (IRO). In current work, we study the role of the extended- range oscillations on the parameters of the FSDP, i.e., intensity, position, area, and the full width at half maximum (FWHM) by using high-quality simulated models of amorphous silicon. The radial distance up to half of the …