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Comparison Of The Sharpness Of Tungsten Field Emission Tips From Traditional Electrical Characterization To Tip Geometries Imaged By Scanning Electron Microscopy, Emma C. Reeves Jan 2014

Comparison Of The Sharpness Of Tungsten Field Emission Tips From Traditional Electrical Characterization To Tip Geometries Imaged By Scanning Electron Microscopy, Emma C. Reeves

Departmental Honors Projects

Using field emission data obtained from 11 etched Tungsten successful field emission tips of radius about 20 to 100 nanometers, FN type linear models were compared. The emission tip radii were determined using an iteration method derived from the modified FN linear equation. In addition, Scanning Electron Microscopy images of 5 successful emitters were obtained. These images were fit to a circular model to estimate the actual radius and compared to empirically predicted radius values. A hyperbolic model was further fit to the images and the circle of similar apex curvature was derived. A method for calculating the electric field …