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Full-Text Articles in Physics
Electron Hole Capture Centers In An Irradiated K2so4-Cu Crystal, T. N. Nurakhmetov, Zh. M. Salikhodzha, R. Z. Bakhtizin, A. M. Zhunusbekov, A. Zh. Kainarbay, D. H. Daurenbekov, B. M. Sadykova, K. B. Zhangylyssov, B. N. Yussupbekova
Electron Hole Capture Centers In An Irradiated K2so4-Cu Crystal, T. N. Nurakhmetov, Zh. M. Salikhodzha, R. Z. Bakhtizin, A. M. Zhunusbekov, A. Zh. Kainarbay, D. H. Daurenbekov, B. M. Sadykova, K. B. Zhangylyssov, B. N. Yussupbekova
Eurasian Journal of Physics and Functional Materials
The methods of vacuum ultraviolet and thermal activation spectroscopy were used to measure the excitation spectra of impurity radiation in the fundamental absorption band of K2SO4-Cu crystals at 15 K and 300 K. An energy transfer was detected from the base to Cu+ impurities. The band gap of crystals K2SO4 was estimated. In K2SO4-Cu crystals, recombination radiation bands were detected at 2.95 ÷ 3.0 eV corresponding to electron hole capture centers.
Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird
Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird
Christian Binek Publications
We study temperature dependent (200 – 400 K) dielectric current leakage in high-quality, epitaxial chromia films, synthesized on various conductive substrates (Pd, Pt and V2O3). We find that trap-assisted space-charge limited conduction is the dominant source of electrical leakage in the films, and that the density and distribution of charge traps within them is strongly dependent upon the choice of the underlying substrate. Pd-based chromia is found to exhibit leakage consistent with the presence of deep, discrete traps, a characteristic that is related to the known properties of twinning defects in the material. The Pt- and V2O3-based films, in contrast, …