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Full-Text Articles in Physics
Generalized Ellipsometry On Complex Nanostructures And Low-Symmetry Materials, Alyssa Mock
Generalized Ellipsometry On Complex Nanostructures And Low-Symmetry Materials, Alyssa Mock
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
In this thesis, complex anisotropic materials are investigated and characterized by generalized ellipsometry. In recent years, anisotropic materials have gained considerable interest for novel applications in electronic and optoelectronic devices, mostly due to unique properties that originate from reduced crystal symmetry. Examples include white solid-state lighting devices which have become ubiquitous just recently, and the emergence of high-power, high-voltage electronic transistors and switches in all-electric vehicles. The incorporation of single crystalline material with low crystal symmetry into novel device structures requires reconsideration of existing optical characterization approaches. Here, the generalized ellipsometry concept is extended to include applications for materials with …
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Use Of A Novel Infrared Wavelength-Tunable Laser Mueller-Matrix Polarimetric Scatterometer To Measure Nanostructured Optical Materials, Jason C. Vap, Stephen E. Nauyoks, Michael R. Benson, Michael A. Marciniak
Faculty Publications
Nanostructured optical materials, for example, metamaterials, have unique spectral, directional, and polarimetric properties. Samples designed and fabricated for infrared (IR) wavelengths have been characterized using broadband instruments to measure specular polarimetric transmittance or reflectance as in ellipsometry or integrated hemisphere transmittance or reflectance. We have developed a wavelength-tunable IR Mueller-matrix (Mm) polarimetric scatterometer which uses tunable external-cavity quantum-cascade lasers (EC-QCLs) to tune onto and off of the narrowband spectral resonances of nanostructured optical materials and performed full polarimeteric and directional evaluation to more fully characterize their behavior. Using a series of EC-QCLs, the instrument is tunable over 4.37-6.54 μm wavelengths …
Index Of Refraction From The Near-Ultraviolet To The Near-Infrared From A Single Crystal Microwave-Assisted Cvd Diamond, Giorgio Turri, Scott Webster, Ying Chen, Benjamin Wickham, Andrew Bennett, Michael Bass
Index Of Refraction From The Near-Ultraviolet To The Near-Infrared From A Single Crystal Microwave-Assisted Cvd Diamond, Giorgio Turri, Scott Webster, Ying Chen, Benjamin Wickham, Andrew Bennett, Michael Bass
Publications
The refractive index of a type IIa CVD-grown single-crystal diamond was measured by ellipsometry from the near ultraviolet to the near infrared region of the spectrum. As a consequence, a one term Sellmeier Equation with coefficents of B-1 = 4.658 and C-1 = 112.5 for the refractive index of diamond, for the wavelength range from 300 to 1650 nm, was derived that is only as accurate as the input data, +/- 0.002. The experimental results in this paper between 800 and 1650 nm are new, adding to the values available in the literature.