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Full-Text Articles in Physics
Explicit Determination Of The Complex Refractive Index Of An Absorbing Medium From Reflectance Measurements At And Near Normal Incidence, R. M.A. Azzam
Electrical Engineering Faculty Publications
Measurement of reflectance at normal incidence R and its fractional change ΔR/R caused by a change of the angle of incidence from 0 to a small angle ϕ (ϕ≲ 20°) permits explicit determination of both the refractive index n and extinction coefficient k of an isotropic absorbing medium. The medium of incidence (ambient) is assumed to have a known refractive index (e.g., =1 for vacuum or air), and the incident light is either p or s linearly polarized.
Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan
Polarization-Preserving Single-Layer-Coated Beam Displacers And Axicons, R. M.A. Azzam, M. Emdadur Rahman Khan
Electrical Engineering Faculty Publications
A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that any input polarization of light is preserved after two reflections at the same angle of incidence from a parallel-mirror beam displacer or an axicon. This is achieved by equalizing the net complex p and s reflection coefficients (also called the radial and azimuthal eigenvalues of an axicon) after two reflections. The net polarization-independent reflectance (insertion loss) of the device is computed and found to exceed the net minimum parallel reflectance of the uncoated device for incidence above …
Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam
Scheme To Polarization-Correct A Waxicon, R. M.A. Azzam
Electrical Engineering Faculty Publications
No abstract provided.
Stationary Property Of Normal-Incidence Reflection From Isotropic Surfaces, R. M.A. Azzam
Stationary Property Of Normal-Incidence Reflection From Isotropic Surfaces, R. M.A. Azzam
Electrical Engineering Faculty Publications
The complex reflection coefficients for the parallel (p) and perpendicular (s) polarizations of light that are normally incident upon an isotropic surface are proved to be stationary with respect to small changes of the angle of incidence in the neighborhood of zero. This is true not only for a single interface between isotropic media but also for any one-dimensionally inhomogeneous or multilayer reflecting structure that is stratified in the direction of the surface normal. For incident light of certain intensity, phase, and polarization, the intensity, phase, and polarization of the reflected light all remain stationary with …
Brewster And Pseudo-Brewster Angles Of Uniaxial Crystal Surfaces And Their Use For Determination Of Optical Properties, M. Elshazly-Zaghloul, R. M.A. Azzam
Brewster And Pseudo-Brewster Angles Of Uniaxial Crystal Surfaces And Their Use For Determination Of Optical Properties, M. Elshazly-Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
Brewster and pseudo-Brewster angles are defined for surfaces of transparent and absorbing uniaxial crystals parallel and perpendicular to the optic axis. Two Brewster angles of a transparent uniaxial crystal surface parallel to the optic axis, measured when the optic axis is oriented perpendicular and parallel to the plane of incidence, readily determine the ordinary and extraordinary indices No and Ne. No and Ne can also be obtained from two Brewster angles measured on a surface perpendicular to the optic axis in contact with two media of different refractive indices. Conditions for the existence of two …
Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam
Constant-Psi Constant-Delta Contour Maps: Applications To Ellipsometry And To Reflection-Type Optical Devices, A.-R. M. Zaghloul, R. M.A. Azzam
Electrical Engineering Faculty Publications
Constant-psi constant-delta contour maps in the reduced angle-of-incidence-film-thickness plane that are useful in ellipsometry and in design of reflection-type optical devices are discussed. As a specific example, a contour map is given for the SiO2-Si film-substrate system at the 6328-Å He-Ne laser wavelength.