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Synergistic Models Of Electron Emission And Transport Measurements Of Disordered Sio2, Jr Dennison, Jodie Corbridge Gillespie, Allen Andersen, Amberly Evans Jensen, Gregory Wilson, Justin Dekany, Alec M. Sim, Ryan Hoffmann
Synergistic Models Of Electron Emission And Transport Measurements Of Disordered Sio2, Jr Dennison, Jodie Corbridge Gillespie, Allen Andersen, Amberly Evans Jensen, Gregory Wilson, Justin Dekany, Alec M. Sim, Ryan Hoffmann
Jodie Corbridge Gillespie
A critical component in the prediction and mitigation of spacecraft charging issues is an accurate model of the charging, transport and electron emission properties of a broad array of materials used in the construction of spacecraft. The increased sensitivity, longer-duration missions, and ventures into more demanding environments only serve to heighten this need. One important way for the spacecraft charging community to address this issue is to expand the role of more fundamental materials physics. This includes the development of unifying theoretical models of the charge transport equations based on the creation, distribution, and occupancy of defect densities of states. …
Measurement Of The Temperature Dependence Of Radiation Induced Conductivity In Polymeric Dielectrics, Jodie Corbridge Gillespie
Measurement Of The Temperature Dependence Of Radiation Induced Conductivity In Polymeric Dielectrics, Jodie Corbridge Gillespie
Jodie Corbridge Gillespie
This study measures Radiation Induced Conductivity (RIC) in five insulating polymeric materials over temperatures ranging from ~110 K to ~350 K: polyimide (PI or Kapton HNTM and Kapton ETM), polytetraflouroethylene (PTFE or TeflonTM), ethylene-tetraflouroethylene (ETFE or TefzelTM), and Low Density Polyethylene (LDPE). RIC occurs when incident ionizing radiation deposits energy and excites electrons into the conduction band of insulators. Conductivity was measured when a voltage was applied across vacuum-baked, thin film polymer samples in a parallel plate geometry. RIC was calculated as the difference in sample conductivity under no incident radiation and under an incident ~4 MeV electron beam at …