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Full-Text Articles in Physics
Surface Morphology Of Laser-Superheated Pb(111) And Pb(100), Z. H. Zhang, Bo Lin, X. L. Zeng, H. E. Elsayed-Ali
Surface Morphology Of Laser-Superheated Pb(111) And Pb(100), Z. H. Zhang, Bo Lin, X. L. Zeng, H. E. Elsayed-Ali
Electrical & Computer Engineering Faculty Publications
The surface step density on the vicinal Pb(111) and the surface vacancy density on Pb(100) after laser superheating and melting are investigated using reflection high-energy electron diffraction. With ∼100-ps laser pulses, Pb(111) surface superheating does not significantly change the density of the steps and step-edge roughness. However, after laser surface melting, the average terrace width and the string length at the step edge become as large as those at room temperature. The average terrace width at 573 K changes from 38±15 to 64±19 Å after laser surface melting, while the average string length at the step edge changes from 90±14 …
Reflection High-Energy Electron-Diffraction Study Of Melting And Solidification Of Pb On Graphite, Z. H. Zhang, P. Kulatunga, H. E. Elsayed-Ali
Reflection High-Energy Electron-Diffraction Study Of Melting And Solidification Of Pb On Graphite, Z. H. Zhang, P. Kulatunga, H. E. Elsayed-Ali
Electrical & Computer Engineering Faculty Publications
The melting and solidification of Pb thin films on pyrolytic graphite are investigated in situ by reflection high-energy electron diffraction. Thin films with thicknesses of 4-150 monolayers are investigated. The surface morphology of the thin films were studied by scanning electron microscopy. Superheating of the Pb thin films by 4±2 to 12±2 K is observed from diffraction intensity measurements. Upon cooling the substrate, the Pb on graphite is seen to supercool by ∼69±4 K.
Scanning-Tunneling-Microscopy Study Of Pb On Si(111), D. Tang, H. E. Elsayed-Ali, J. Wendelken, J. Xu
Scanning-Tunneling-Microscopy Study Of Pb On Si(111), D. Tang, H. E. Elsayed-Ali, J. Wendelken, J. Xu
Electrical & Computer Engineering Faculty Publications
Scanning-tunneling microscopy has been used to study temperature and coverage dependence of the structure of lead on the Si(111)-7×7 surface. For low Pb coverage, the Pb atoms favored the faulted sites. The ratio between the number of Pb atoms on faulted to unfaulted sites increased after sample annealing. An energy difference of 0.05 eV associated with a Pb atom on these two sites is estimated. The mobility of Pb atoms on Si(111) was observed at a temperature as low as 260°C for a coverage of 0.1 and 1 ML. © 1995 The American Physical Society.