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Full-Text Articles in Physics
Electric-Field-Induced Interfacial Instabilities Of A Soft Elastic Membrane Confined Between Viscous Layers, Mohar Dey, Dipankar Bandyopadhyay, Ashutosh Sharma, Shizhi Qian, Sang Woo Joo
Electric-Field-Induced Interfacial Instabilities Of A Soft Elastic Membrane Confined Between Viscous Layers, Mohar Dey, Dipankar Bandyopadhyay, Ashutosh Sharma, Shizhi Qian, Sang Woo Joo
Mechanical & Aerospace Engineering Faculty Publications
We explore the electric-field-induced interfacial instabilities of a trilayer composed of a thin elastic film confined between two viscous layers. A linear stability analysis (LSA) is performed to uncover the growth rate and length scale of the different unstable modes. Application of a normal external electric field on such a configuration can deform the two coupled elastic-viscous interfaces either by an in-phase bending or an antiphase squeezing mode. The bending mode has a long-wave nature, and is present even at a vanishingly small destabilizing field. In contrast, the squeezing mode has finite wave-number characteristics and originates only beyond a threshold …
Growth Analysis Of (Ag,Cu)Inse2 Thin Films Via Real Time Spectroscopic Ellipsometry, S. A. Little, V. Ranjan, R. W. Collins, S. Marsillac
Growth Analysis Of (Ag,Cu)Inse2 Thin Films Via Real Time Spectroscopic Ellipsometry, S. A. Little, V. Ranjan, R. W. Collins, S. Marsillac
Electrical & Computer Engineering Faculty Publications
In situ and ex situ characterization methods have been applied to investigate the properties of (Ag,Cu)InSe2 (ACIS) thin films. Data acquired from real time spectroscopic ellipsometry (RTSE) experiments were analyzed to extract the evolution of the nucleating, bulk, and surface roughness layer thicknesses. The evolution of these layer thicknesses suggests a transition from Volmer-Weber to Stranski-Krastanov type behavior when Cu is replaced by Ag. The complex dielectric functions of ACIS at both deposition and room temperature as a function of film composition were also extracted from the RTSE data, enabling parameterization of the alloy optical properties.