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Tio2 Breakdown Under Pulsed Conditions, G. Zhao, R. P. Joshi, V. K. Lakdawala, E. Schamiloglu, H. Hjalmarson
Tio2 Breakdown Under Pulsed Conditions, G. Zhao, R. P. Joshi, V. K. Lakdawala, E. Schamiloglu, H. Hjalmarson
Electrical & Computer Engineering Faculty Publications
Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in TiO2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries. 2007 American Institute of Physics.