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Articles 61 - 66 of 66
Full-Text Articles in Physics
Properties Of Spacecraft Materials Exposed To Ionizing Radiation, Alex Souvall, Gregory Wilson, Katie Gamaunt, Ben Russon, Heather Tippets, Jr Dennison
Properties Of Spacecraft Materials Exposed To Ionizing Radiation, Alex Souvall, Gregory Wilson, Katie Gamaunt, Ben Russon, Heather Tippets, Jr Dennison
Posters
The effects of ionizing radiation damage on the various properties of spacecraft materials resulting from exposure in the Space Survivability Testing chamber (SST) are being studied with both ex situ and in situ tests. The SST is a ground based test facility designed to mimic low earth orbit (LEO), and geosynchronous orbit to test potential environmental-induced modifications to small satellites , and materials. Tests described here expose spacecraft materials to a Sr90 ionizing beta radiation source at room temperature and in high vacuum. Ex situ optical transmission/reflectivity measurements glass samples will monitor optical darkening. Properties of polymeric samples will …
Dependence Of Electrostatic Field Strength On Voltage Ramp Rates For Spacecraft Material, Krysta Moser, Allen Andersen, Jr Dennison
Dependence Of Electrostatic Field Strength On Voltage Ramp Rates For Spacecraft Material, Krysta Moser, Allen Andersen, Jr Dennison
Posters
Previous tests done by the USU Materials Physics Group (MPG) using our electrostatic discharge (ESD) custom vacuum chamber have found that, for the polymeric materials polyimide and low density polyethylene (LDPE), the electrostatic field strength at breakdown depends on the voltage ramp rate applied across the materials. At ramp rates an order of magnitude lower than the maximum recommended rate of 500 V/s, the breakdown electrostatic field strength was also found to be significantly lower. The data from these tests were compared to a microscopic mean field theory for dielectric breakdown in highly disordered insulating materials. We present new ramp …
Measurement Of Effects Of Long Term Ionizing Radiation On High Efficiency Solar Arrays, Ben Russon, Heather Tippets, Gregory Wilson, Katie Gamaunt, Alex Souvall, Jr Dennison
Measurement Of Effects Of Long Term Ionizing Radiation On High Efficiency Solar Arrays, Ben Russon, Heather Tippets, Gregory Wilson, Katie Gamaunt, Alex Souvall, Jr Dennison
Posters
Degradation of power output efficiency for high-efficiency multilayer solar arrays due to ionizing radiation is measured using the Space Survivability Test chamber. Exposure to ionizing radiation disrupts the crystalline structure and can reduce solar array power output to the point that it no longer provides adequate output capacity. This can be a significant concern, particularly in the harsh environment of space where radiation dose rate is significantly higher and replacing components is often impossible. Ionizing radiation is simulated in a controlled environment to allow measurement and characterization of the power output of solar arrays, using a 100 mCi encapsulated Sr90 …
Breakdown Analysis Of Electrostatic Discharge, Sam Hansen, Allen Andersen, Jr Dennison
Breakdown Analysis Of Electrostatic Discharge, Sam Hansen, Allen Andersen, Jr Dennison
Posters
Electrostatic discharge (ESD) and the associated material breakdown is the primary cause for spacecraft damage due to space environment interactions. This phenomenon occurs when the space plasma fluxes charge a craft to high voltages where insulating materials then break down. This failure allows current to flow freely through the material which; can damage or destroy onboard electrical systems. My work focuses on the effects of these breakdowns on suspect materials commonly used for electrical insulation in space. The USU Material Physics Group has performed ESD tests on hundreds of samples to date. The ESD damage sites of these samples have …
A Dual-Defect Model For Predicting Lifetimes For Polymeric Discharges From Accelerated Testing, Allen Andersen, Jr Dennison
A Dual-Defect Model For Predicting Lifetimes For Polymeric Discharges From Accelerated Testing, Allen Andersen, Jr Dennison
Posters
Electrostatic discharge (ESD) can cause catastrophic failures in electronic devices. Estimating the lifetime of dielectrics under prolonged high field exposure is a major design concern for applications including spacecraft, high voltage DC power transmission, and semiconductor electronics. Dielectric strengths listed in engineering handbooks are primarily based on cursory measurements with poor repeatability and tend to overestimate ESD fields in real applications. Standard measurements subject test samples to ≈500 V/s ramp rates until breakdown. We present the results of ESD studies in two prototypical polymer dielectrics using a ramp rate of ≈20 V/4s until breakdown, together with tests applying a …
Cathodoluminescence Events Coincident With Muon Detection, Kenneth Zia, Justin Dekany, Jr Dennison
Cathodoluminescence Events Coincident With Muon Detection, Kenneth Zia, Justin Dekany, Jr Dennison
Posters
Samples of highly disordered insulating material were irradiated with 1 keV electron beams, resulting in three forms of light emission with differing duration: arcs (<1 s duration), flares (~100 s), and cathodoluminescence (as long as beam is on). The arc and cathodoluminescence phenomena are well understood, while the flares are not. Flares were observed at intervals of ~2 per hr. This is within a factor of 2 for the expected muon crosssection at an altitude of Logan, UT (1370 m) caused by high altitude cosmic rays. Based on this suggestive evidence, we have proposed incorporation of standard muon coincidence detection apparatus into our vacuum cathode luminescence test facility. Measurements of the muon cross-section zenith angle and angle-dependence will provide calibration of the muon detector. If muon evidence coincides with the flare events, this will provide definitive evidence of the flare origin. We will discover whether a correlation between flares of charged sample are caused by transitory muons which trigger discharge and subsequent recharging during our testing of space materials.