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Full-Text Articles in Physical Chemistry
Comparative Study Of Structural Properties Of Yba2cu3o7 Thin Films On Srtio3 Single Crystal And Bicrystal Substrates By X- Ray Diffraction, M. Navacerrada, A. Mehta, H. Sahibudeen, Juana Acrivos
Comparative Study Of Structural Properties Of Yba2cu3o7 Thin Films On Srtio3 Single Crystal And Bicrystal Substrates By X- Ray Diffraction, M. Navacerrada, A. Mehta, H. Sahibudeen, Juana Acrivos
Faculty Publications, Chemistry
We present a comparative study in terms of structural properties deduced from X - ray diffraction diagrams between YBa2Cu3O7 (YBCO) thin films fabricated on SrTiO3 (STO) single crystal substrates and bicrystallines substrates with a symmetrical tilt angle of 24 degrees. Periodic Lattice Distortions (PLD) have been observed around different Bragg peaks in YBCO thin films deposited on STO bicrystals while only diffraction peaks have been measured in the diagrams corresponding to the YBCO thin films deposited on STO single crystal substrates. Only in regions situated a 3.5 mm at both sides of the grain boundary the PDL have been investigated. …
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Faculty Publications, Chemistry
Standard reference markers for accurate, reproducible synchrotron x-ray energies are obtained using a three Si crystal spectrometer. The first two crystals are in the monochromator and the third is used to obtain diffraction markers which monitor the energy. Then for any value of the glancing angle on the reference Si crystal the energy for the (333) diffraction must occur at 3/4 that of the (444) and 3/5 of that for the (555). This establishes for the first time an absolute synchrotron energy scale. Higher-order diffractions are used to determine excitation line profiles. We conclude that the use of reference diffractions …
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Measurement Of Synchrotron X-Ray Energies And Line Shapes Using Diffraction Markers, Juana Vivó Acrivos, S.S. P. Parkin, K. Hathaway, J. R. Reynolds, M. P. Klein, A. Thompson, D. Goodin
Juana Vivó Acrivos
Standard reference markers for accurate, reproducible synchrotron x-ray energies are obtained using a three Si crystal spectrometer. The first two crystals are in the monochromator and the third is used to obtain diffraction markers which monitor the energy. Then for any value of the glancing angle on the reference Si crystal the energy for the (333) diffraction must occur at 3/4 that of the (444) and 3/5 of that for the (555). This establishes for the first time an absolute synchrotron energy scale. Higher-order diffractions are used to determine excitation line profiles. We conclude that the use of reference diffractions …