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Physics

University of New Orleans

Articles 181 - 191 of 191

Full-Text Articles in Physical Sciences and Mathematics

Generalized Ellipsometry Based On Azimuth Measurements Alone, R. M.A. Azzam Apr 1978

Generalized Ellipsometry Based On Azimuth Measurements Alone, R. M.A. Azzam

Electrical Engineering Faculty Publications

We investigate the azimuth response function, θo = f(θi), of a linear nondepolarizing optical system S, whereθi and θo, are the azimuths (orientations) of the generally elliptic vibrations of totally polarized light at the input and output of S. We find that the azimuth response function depends on five of the six parameters that specify the normalized circular Jones matrix of the optical system. Thus the entire polarization response of an optical system can be nearly completely reconstructed from its azimuth response alone. Five input-output azimuth measurements (θik, θok), k …

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Simulation Of Mechanical Rotation By Optical Rotation: Application To The Design Of A New Fourier Photopolarimeter, R. M.A. Azzam Apr 1978

Simulation Of Mechanical Rotation By Optical Rotation: Application To The Design Of A New Fourier Photopolarimeter, R. M.A. Azzam

Electrical Engineering Faculty Publications

The mechanical rotation of an optical element around the axis of a beam of polarized light can be easily simulated by using the phenomenon of optical rotation. Because optical rotation can be magnetically or electrically induced, virtually any kind of mechanical rotation can be mimicked. This interesting principle is applied to the design of a new Fourier photopolarimeter that uses an oscillating-azimuth retarder (OAR). The OAR consists of a quarter-wave plate surrounded by two ac-excited Faraday cells that produce equal and opposite sinusoidal optical rotations. Analysis of the operation of this polarimeter of no moving parts proves its ability to …

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Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam Sep 1977

Single-Element Rotating-Polarizer Ellipsometer For Film-Substrate Systems, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

A novel and very simple ellipsometer for the characterization of film-substrate systems that employs one rotating optical element (a polarizer) is proposed. The ellipsometer is based on detecting the angles of incidence at which a film-substrate system has equal amplitude attenuations for light polarized parallel (p) and perpendicular (s) to the plane of incidence. At a certain wavelength, the film thickness of the filmsubstrate system has to lie within permissible-thickness bands (PTB) for the technique to apply.

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Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam Jun 1977

Sio2-Si Film-Substrate Reflection Polarizers For Different Mercury Spectral Lines, A.-R. M. Zaghloul, R. M.A. Azzam

Electrical Engineering Faculty Publications

No abstract provided.

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Frequency-Mixing Detection (Fmd) Of Polarization-Modulated Light, R. M.A. Azzam Jul 1976

Frequency-Mixing Detection (Fmd) Of Polarization-Modulated Light, R. M.A. Azzam

Electrical Engineering Faculty Publications

When a light beam whose polarization and intensity are weakly modulated at a frequency ωm passes through a periodic analyzer of frequency ωa(<ωm) and the transmitted flux is linearly detected, the resulting total signal St consists of two components: (i) a periodic baseband signal Sbb with harmonics of frequencies nωa (n = 0,1,2,…) and (ii) an amplitude-modulated-carrier signal δSmc with center (carrier) frequency ωm and sideband frequencies at ωm ± nωa(n = 1,2,…). In this paper we show that the average polarization of the beam is determined …

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Modulated Generalized Ellipsometry, R. M.A. Azzam Jun 1976

Modulated Generalized Ellipsometry, R. M.A. Azzam

Electrical Engineering Faculty Publications

We extend ellipsometry to the direct measurement of small perturbations of the Jones matrix of any linear nondepolarizing optical sample (system) subjected to a modulating stimulus such as temperature, stress, or electric or magnetic field. The methodology of this technique, to be called Modulated Generalized Ellipsometry (MGE), is presented. First an ellipsometer with arbitrary polarizing and analyzing optics is assumed, and subsequently the discussion is specialized to a conventional ellipsometer having either the polarizer-sample-analyzer (PSA) or the polarizer-compensator-sample-analyzer (PCSA) arrangement. MGE provides the tool for the systematic study of thermo-optical, piezo-optical, electro-optical, magneto-optical, and other allied effects for both isotropic …

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Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara Dec 1975

Design Of Film-Substrate Single-Reflection Linear Partial Polarizers, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

The results of a preceding paper [J. Opt. Soc. Am. 65, 1464,(1975)] are viewed from a different angleas providing the basis for the design of film-substrate single-reflection linear partial polarizers (LPP),which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO2-Si LPP’s at λ = 6328 Å are shown graphically.

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Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara Dec 1975

Polarizer-Surface-Analyzer Null Ellipsometry For Film-Substrate Systems, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

Single-pass polarizer-surface-analyzer null ellipsometry (PSA-NE) can be used to characterize film-substrate systems, provided that the film thickness lies within one of a set of permissible-thickness bands (PTB). For a transparent film on a transparent or absorbing substrate, the PTB structure consists of a small number of finite-bandwidth bands followed by a continuum band that extends from a film thickness of about half the wavelength of light to infinity. We show that this band structure is a direct consequence of the periodicity of the ellipsometric function ρ (the ratio Rp/Rs, of the complex amplitude-reflection coefficients for …

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Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara Sep 1975

Design Of Film—Substrate Single-Reflection Retarders, A.-R. M. Zaghloul, R. M.A. Azzam, N. M. Bashara

Electrical Engineering Faculty Publications

The design steps for film—substrate single-reflection retarders are briefly stated and applied to the SiO2—Si film—substrate system at wavelength 6328 Å. The criterion of minimum-maximum error of the ellipsometric angle ψ is used to choose angle-of-incidence-tunable designs. Use is made of the (Φ-d) plane (angle of incidence versus thickness) to determine whether a given film—substrate system with known optical properties and film thickness can operate as a reflection retarder and to determine the associated angles of incidence and retardation angles. This leads to the concept of permissible-thickness bands and forbidden gaps for operation of a film—substrate …

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Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara Apr 1975

Application Of Generalized Ellipsometry To Anisotropic Crystals, R. M.A. Azzam, N. M. Bashara

Electrical Engineering Faculty Publications

No abstract provided.

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Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara Mar 1975

Ellipsometric Function Of A Film-Substrate System: Applications To The Design Of Reflection-Type Optical Devices And To Ellipsometry, R. M.A. Azzam, A.-R. M. Zaghloul, N. M. Bashara

Electrical Engineering Faculty Publications

The ratio ρ = Rp/Rs of the complex amplitude-reflection coefficients Rp and Rs for light polarized parallel (p) and perpendicular (s) to the plane of incidence, reflected from an optically isotropic film-substrate system, is investigated as a function of the angle of incidence ϕ and the film thickness d. Both constant-angle-of-incidence contours (CAIC) and constant-thickness contours (CTC) of the ellipsometric function ρ(ϕ,d) in the complex ρ plane are examined. For transparent films, ρ(ϕ,d) is a periodic function of d with period Dϕ that is a function of ϕ. …

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