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Full-Text Articles in Nanoscience and Nanotechnology
The Dark Annulus Of A Drop In A Hele-Shaw Cell Is Caused By The Refraction Of Light Through Its Meniscus, Sangjin Ryu, Haipeng Zhang, Carson Emeigh
The Dark Annulus Of A Drop In A Hele-Shaw Cell Is Caused By The Refraction Of Light Through Its Meniscus, Sangjin Ryu, Haipeng Zhang, Carson Emeigh
Department of Mechanical and Materials Engineering: Faculty Publications
Knowing the meniscus shape of confined drops is important for understanding how they make first contact and then coalesce. When imaged from the top view by brightfield microscopy, a liquid drop (e.g., corn syrup) confined in a Hele-Shaw cell, surrounded by immiscible liquid (e.g., mineral oil), had a dark annulus, and the width of the annulus decreased with increasing concentration of corn syrup. Since the difference in the annulus width was presumed to be related to the meniscus shape of the drops, three-dimensional images of the drops with different concentrations were obtained using confocal fluorescence microscopy, and their cross-sectional meniscus …
Contact Angle Measurement Using A Hele-Shaw Cell: A Proof-Of-Concept Study, Haipeng Zhang, Jacob Gottberg, Sangjin Ryu
Contact Angle Measurement Using A Hele-Shaw Cell: A Proof-Of-Concept Study, Haipeng Zhang, Jacob Gottberg, Sangjin Ryu
Department of Mechanical and Materials Engineering: Faculty Publications
Contact angle is an important property to quantify the wettability of a solid surface with a liquid, which characterizes interactions of the solid-liquid pair. Generally, to measure contact angle, special instruments such as a goniometer are necessary, but they are not readily available in certain research settings. In this study, an alternative method to measure contact angle based on a Hele-Shaw cell, microscopy imaging, and image processing is suggested. In this method, a liquid drop is injected into a transparent Hele-Shaw cell, the meniscus of the drop is captured in the top or bottom view using a brightfield microscope, and …
Nanometrology Device Standards For Scanning Probe Mmicroscopes And Processes For Their Fabrication And Use, Peter Moeck
Nanometrology Device Standards For Scanning Probe Mmicroscopes And Processes For Their Fabrication And Use, Peter Moeck
Physics Faculty Publications and Presentations
Nanometrology device standards and methods for fabricating and using such devices in conjunction With scanning probe microscopes are described. The fabrication methods comprise: (1) epitaxial growth that produces nanometer sized islands of knoWn morphology, structural, morphological and chemical stability in typical nanometrology environments, and large height-to-width nano-island aspect ratios, and (2) marking suitable crystallographic directions on the device for alignment With a scanning direction.