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Articles 1 - 4 of 4
Full-Text Articles in Nanoscience and Nanotechnology
Design And Validation Of A Low Cost High Speed Atomic Force Microscope, Michael Ganzer, Tien Pham
Design And Validation Of A Low Cost High Speed Atomic Force Microscope, Michael Ganzer, Tien Pham
Journal of Undergraduate Research at Minnesota State University, Mankato
The Atomic Force Microscope (AFM) is an important instrument in nanoscale topography, but it is expensive and slow. The authors designed an AFM to overcome both limitations. To do this, they used an Optical Pickup Unit (OPU) from a DVD player as the laser and photodetector system to minimize cost and they did not implement a vertical control loop, which maximized potential speed. Students will be able to be use this device to make nanoscale measurements and engage in micro-engineering. To prototype this idea, the authors tested an OPU with a silicon wafer and demonstrated the ability to consistently distinguish …
Experimentally Validated 3d Md Model For Afm-Based Tip-Based Nanomanufacturing, Rapeepan Promyoo
Experimentally Validated 3d Md Model For Afm-Based Tip-Based Nanomanufacturing, Rapeepan Promyoo
Open Access Dissertations
In order to control AFM-based TBN to produce precise nano-geometry efficiently, there is a need to conduct a more focused study of the effects of different parameters, such as feed, speed, and depth of cut on the process performance and outcome. This is achieved by experimentally validating a MD simulation model of nanomachining, and using it to conduct parametric studies to guide AFM-based TBN. A 3D MD model with a larger domain size was developed and used to gain a unique insight into the nanoindentation and nanoscratching processes such as the effect of tip speed (e.g. effect of tip speed …
Nano Scale Mechanical Analysis Of Biomaterials Using Atomic Force Microscopy, Diganta Dutta
Nano Scale Mechanical Analysis Of Biomaterials Using Atomic Force Microscopy, Diganta Dutta
Mechanical & Aerospace Engineering Theses & Dissertations
The atomic force microscope (AFM) is a probe-based microscope that uses nanoscale and structural imaging where high resolution is desired. AFM has also been used in mechanical, electrical, and thermal engineering applications. This unique technique provides vital local material properties like the modulus of elasticity, hardness, surface potential, Hamaker constant, and the surface charge density from force versus displacement curve. Therefore, AFM was used to measure both the diameter and mechanical properties of the collagen nanostraws in human costal cartilage. Human costal cartilage forms a bridge between the sternum and bony ribs. The chest wall of some humans is deformed …
Interfacial Energy Between Carbon Nanotubes And Polymers Measured From Nanoscale Peel Tests In The Atomic Force Microscope, Mark C. Strus, Camilo I. Cano, R. Byron Pipes, Cattien V. Nguyen, Arvind Raman
Interfacial Energy Between Carbon Nanotubes And Polymers Measured From Nanoscale Peel Tests In The Atomic Force Microscope, Mark C. Strus, Camilo I. Cano, R. Byron Pipes, Cattien V. Nguyen, Arvind Raman
Other Nanotechnology Publications
The future development of polymer composite materials with nanotubes or nanoscale fibers requires the ability to understand and improve the interfacial bonding at the nanotube-polymer matrix interface. In recent work [Strus MC, Zalamea L, Raman A, Pipes RB, Nguyen CV, Stach EA. Peeling force spectroscopy: exposing the adhesive nanomechanics of one-dimensional nanostructures. Nano Lett 2008;8(2):544–50], it has been shown that a new mode in the Atomic Force Microscope (AFM), peeling force spectroscopy, can be used to understand the adhesive mechanics of carbon nanotubes peeled from a surface. In the present work, we demonstrate how AFM peeling force spectroscopy can be …