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Nanometer-Scale Probing Of Potential-Dependent Electrostatic Forces, Adhesion, And Interfacial Friction At The Electrode/Electrolyte Interface, Shane D. Campbell, Andrew C. Hillier

Andrew C. Hillier

The atomic force microscope (AFM) was used to examine the influence of an applied electrochemical potential on the interfacial properties of the electrode/electrolyte interface. Measurements of electrostatic force, adhesion, and friction coefficient were performed at two different electrode surfaces: glassy carbon anda thin film of sulfonate-derivatized poly(aniline) (SPANi). At the carbon electrode, changes in electrostatic force between probe and substrate exhibited a potential-dependent transition from repulsive to attractive values at potentials negative and positive of the potential of zero charge (Epzc). Simultaneous measurements of tip-substrate adhesion and friction coefficient showed a change from low to high values over the same …