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Full-Text Articles in Mechanical Engineering
Characterization Of The Near-Interface Region Of Chemical Vapor Deposited Diamond Films On Silicon By Backscatter Kikuchi Diffraction, Brent L. Adams, K. Kunze, S. Geier, R. Hessmer, M. Schreck, B. Rauschembach, B. Stritzker
Characterization Of The Near-Interface Region Of Chemical Vapor Deposited Diamond Films On Silicon By Backscatter Kikuchi Diffraction, Brent L. Adams, K. Kunze, S. Geier, R. Hessmer, M. Schreck, B. Rauschembach, B. Stritzker
Faculty Publications
The lattice orientations near the interface of chemical vapor deposited diamond films on Si(001) have been studied by orientation imaging microscopy. This technique is based on the automated analysis of electron backscatter Kikuchi diffraction patterns. The electron beam has been scanned in discrete steps over the reverse side of the diamond film after having removed the substrate. The obtained data have allowed us to determine the texture and to visualize quantitatively the orientational arrangement of and among individual diamond crystallites in the near-interface region. A comparison with the orientation of the substrate has proved the existence of epitaxially nucleated grains. …
Characterization Of The Near-Interface Region Of Chemical Vapor Deposited Diamond Films On Silicon By Backscatter Kikuchi Diffraction, Brent L. Adams, K. Kunze, S. Geier, R. Hessmer, B. Rauschembach, M. Schreck, B. Stritzker
Characterization Of The Near-Interface Region Of Chemical Vapor Deposited Diamond Films On Silicon By Backscatter Kikuchi Diffraction, Brent L. Adams, K. Kunze, S. Geier, R. Hessmer, B. Rauschembach, M. Schreck, B. Stritzker
Faculty Publications
B.L.A. and K.K. gratefully acknowledge support under a Materials Research Group Award by the National Science Foundation No. DMR-9001278. Also the software support by Th. Bollmeier is greatly appreciated. The lattice orientations near the interface of chemical vapor deposited diamond films on Si(001) have been studied by orientation imaging microscopy. This technique is based on the automated analysis of electron backscatter Kikuchi diffraction patterns. The electron beamhas been scanned in discrete steps over the reverse side of the diamond film after having removed the substrate. The obtained data have allowed us to determine the texture and to visualize quantitatively the …
Inversion Of Light Scattering Measurements For Particle Size And Optical Constants: Experimental Study, Matthew R. Jones, Keng H. Leong, M. Quinn Brewster, Bill P. Curry
Inversion Of Light Scattering Measurements For Particle Size And Optical Constants: Experimental Study, Matthew R. Jones, Keng H. Leong, M. Quinn Brewster, Bill P. Curry
Faculty Publications
Measurements of the light scattered by a sample contain information regarding the physical properties of the sample. Laser light-scattering measurements can be made unobtrusively in environments that are inaccessible to other types of measurements, so laser light-scattering techniques have become an important tool in aerosol research. The primary difficulty associated with using light-scattering techniques to determine aerosol particle properties is inverting the measurements or extracting the desired information from the measurements. In this study we use a 15-channel polar nephelometer to measure the light-scattering patterns of monodisperse polystyrene spheres. The light-scattering measurements are inverted, and the particle size distribution function …
Inversion Of Light Scattering Measurements For Particle Size And Optical Constants: Theoretical Study, Matthew R. Jones, Bill P. Curry, M. Quinn Brewster, Keng H. Leong
Inversion Of Light Scattering Measurements For Particle Size And Optical Constants: Theoretical Study, Matthew R. Jones, Bill P. Curry, M. Quinn Brewster, Keng H. Leong
Faculty Publications
We invert the Fredholm equation representing the light scattered by a single spherical particle or a distribution of spherical particles to obtain the particle size distribution function and refractive index. We obtain the solution by expanding the distribution function as a linear combination of a set of orthonormal basis functions. The set of orthonormal basis functions is composed of Schmidt-Hilbert eigenfunctions and a set of supplemental basis functions, which have been orthogonalized with respect to the Schmidt-Hilbert eigenfunctions by using the Gram-Schmidt orthogonalization procedure. We use the orthogonality properties of the basis functions and of the eigenvectors of the kernel …