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Missouri University of Science and Technology
<p>Atomic force microscopy<br />Image processing -- Mathematical models<br />Surfaces (Technology) -- Analysis</p>
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A Novel Cantilever For Bi-Harmonic Atomic Force Microscopy, Muthukumaran Loganathan
A Novel Cantilever For Bi-Harmonic Atomic Force Microscopy, Muthukumaran Loganathan
Masters Theses
"Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on a micro cantilever is used to probe the surface of interest with nanoscale resolution by making intermittent (tapping) contact with the surface. Any change in surface profile affects the tip amplitude, and is detectable only if it results in an amplitude change that is significant enough to be measured by the laser detector. Hence, it is desirable to have a micro cantilever that is sensitive to surface changes so as to provide sharper images and better surface resolution.
In the first part …