Mechanical Engineering Commons^™

A Novel Cantilever For Bi-Harmonic Atomic Force Microscopy, Muthukumaran Loganathan

Masters Theses

"Tapping mode (TM) AFM is a popularly used AFM technique in which an oscillating sharp tip mounted on a micro cantilever is used to probe the surface of interest with nanoscale resolution by making intermittent (tapping) contact with the surface. Any change in surface profile affects the tip amplitude, and is detectable only if it results in an amplitude change that is significant enough to be measured by the laser detector. Hence, it is desirable to have a micro cantilever that is sensitive to surface changes so as to provide sharper images and better surface resolution.

In the first part …

Bi-Harmonic Atomic Force Microscopy, Santosh R. Kodandarama

Masters Theses

"In tapping mode atomic force microscopy, surface features are measured indirectly via the amplitude of the tapping cantilever. A change in surface profile is detectable only if it results in an amplitude change that is significant enough to be measured by the optics. Previous works have focused on improving sensitivity through the system's Q-factor, either by changing physical cantilever properties or using feedback control, but those approaches undesirably slow down the dynamic response. In this work we take a novel approach to sensitivity amplification by reshaping the tapping trajectory. By shaping the trajectory so that the probe spends a greater …